|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ED, SDM |
2014-02-27 16:10 |
Hokkaido |
Hokkaido Univ. Centennial Hall |
Seebeck-coefficient control of ultrathin SOI layer and its novel characterization technique Hiroya Ikeda, Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./JSPS) ED2013-137 SDM2013-152 |
The enhancement of the thermoelectric performance has been expected by Si nanostrucutres. The Si Seebeck coefficient is ... [more] |
ED2013-137 SDM2013-152 pp.31-35 |
SDM, ED, CPM |
2013-05-16 16:35 |
Shizuoka |
Shizuoka Univ. (Hamamatsu) Graduate School of Sci. and Technol. |
Focused ion beam Ga implantation into P-doped SOI layer and its Seebeck coefficient Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./ Research Fellow of JSPS), Masaru Shimomura, Akihiro Ishida, Hiroya Ikeda (Shizuoka Univ.) ED2013-22 CPM2013-7 SDM2013-29 |
With the aim of fabricating a thermopile infrared detector using Si nanowires, we have investigated the formation of a p... [more] |
ED2013-22 CPM2013-7 SDM2013-29 pp.33-37 |
SDM, ED |
2013-02-27 14:10 |
Hokkaido |
Hokkaido Univ. |
Variation of Seebeck coefficient of Si-on-insulator layer induced by bias-injected carriers Hiroya Ikeda, Yuhei Suzuki, Kazutoshi Miwa (Shizuoka Univ.), Faiz Salleh (Shizuoka Univ./Research Fellow of JSPS) ED2012-129 SDM2012-158 |
The enhancement of Seebeck coefficient by controlling the Si Fermi energy is one of key issues for enhancing the thermoe... [more] |
ED2012-129 SDM2012-158 pp.7-11 |
ED, SDM |
2012-02-08 11:00 |
Hokkaido |
|
Seebeck Coefficient of Ultrathin Si with Fermi Energy Controlled by External Bias Faiz Salleh, Kazutoshi Miwa, Hiroya Ikeda (Shizuoka Univ.) ED2011-153 SDM2011-170 |
We varied the Seebeck coefficient of an n-type silicon-on-insulator (SOI) sample by applying an external bias in order t... [more] |
ED2011-153 SDM2011-170 pp.65-69 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|