Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ET |
2022-03-04 15:45 |
Online |
Online (Online) |
Data visualization function in the IoT learning system adapted to the educational needs Takaaki Kato, Mizue Kayama (Shinshu Univ.), Takashi Nagai (iot), Yusaku Kanda, Takashi Shimizu (Shinshu Univ.) ET2021-79 |
We have been developing educational IoT materials for use in classes where experiments with measurement activities are r... [more] |
ET2021-79 pp.157-162 |
DC |
2022-03-01 10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. (Tokyo, Online) (Primary: On-site, Secondary: Online) |
On Correction for Temperature and Voltage Effects in On-Chip Delay Measurement Takaaki Kato (KIT), Yousuke Miyake (PRIVATECH), Seiji Kajihara (KIT) DC2021-67 |
It is effective for aging of a logic circuit to measure a circuit delay periodically in field. In order to compare the d... [more] |
DC2021-67 pp.18-23 |
ET |
2021-03-06 15:40 |
Online |
Online (Online) |
A proposal for the Off-line and online IoT based data management system with time series graphs authoring function Aki Asano, Mizue Kayama (Shinshu Univ.), Takashi Nagai (IoT), Takaaki Kato (Shinshu Univ.) ET2020-74 |
The purpose of this research is to propose an IoT platform that also supports offline use. To achieve this goal, we desi... [more] |
ET2020-74 pp.127-132 |
DC |
2020-12-11 13:00 |
Hyogo |
(Hyogo, Online) (Primary: On-site, Secondary: Online) |
A Degradation Prediction of Circuit Delay Using A Gradient Descent Method Seiichirou Mori, Masayuki Gondou, Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech) DC2020-59 |
As the risk of aging-induced faults of VLSIs is increasing, highly reliable systems require to predict when the aging-in... [more] |
DC2020-59 pp.1-6 |
DC |
2019-12-20 16:30 |
Wakayama |
(Wakayama) |
Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] |
DC2019-85 pp.37-42 |
PRMU, BioX |
2019-03-18 14:45 |
Tokyo |
(Tokyo) |
[Short Paper]
A trial on sport-informatics Junnosuke Kado (Kyushu Univ.), Akinori Nagata (Chukyo Univ.), Takaaki Kato (Keio Univ.), Seiichi Uchida (Kyushu Univ.) BioX2018-63 PRMU2018-167 |
(To be available after the conference date) [more] |
BioX2018-63 PRMU2018-167 pp.197-200 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 13:25 |
Hiroshima |
Satellite Campus Hiroshima (Hiroshima) |
Evaluation of Flexible Test Power Control for Logic BIST in TEG Chips Takaaki Kato (KIT), Senling Wang (Ehime Univ.), Yasuo Sato, Seiji Kajihara (KIT) VLD2018-57 DC2018-43 |
Scan-based logic BIST has a crucial problem of high test power dissipation. Its solution requires a flexible test power ... [more] |
VLD2018-57 DC2018-43 pp.125-130 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-07 09:00 |
Kumamoto |
Kumamoto-Kenminkouryukan Parea (Kumamoto) |
Flip-Flop Selection for Multi-Cycle Test with Partial Observation in Scan-Based Logic BIST Shigeyuki Oshima, Takaaki Kato (Kyutech), Senling Wang (Ehime Univ.), Yasuo Sato, Seiji Kajihara (Kyutech) VLD2017-41 DC2017-47 |
A logic BIST scheme using multi-cycle test with partial observation has been proposed. In the scheme, the selection of f... [more] |
VLD2017-41 DC2017-47 pp.85-90 |
DC |
2015-12-18 13:20 |
Niigata |
Kurieito Mulakami (Murakami City) (Niigata) |
On Measurement of On-Chip Temperature And Voltage Variation Using A Digital Monitor Yousuke Miyake, Takaaki Kato, Takuya Itonaga, Yasuo Sato, Seiji Kajihara (KIT) DC2015-74 |
A digital monitor for measuring a temperature and a voltage of VLSIs is proposed. The monitor can derive measurement res... [more] |
DC2015-74 pp.5-10 |