IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
PN, EMT, OPE, EST, MWP, LQE, IEE-EMT [detail] 2019-01-18
14:45		 Osaka Osaka University Nakanoshima Center Surface plasmon Enhanced Emissions from Thin layers of CdSe/ZnS Quantum Dots
Toshiki Nakamura, Fumiya Murao, Tetsuya Matsuyama, Kenji Wada, Koichi Okamoto (Osaka Pref. Univ.) PN2018-64 EMT2018-98 OPE2018-173 LQE2018-183 EST2018-111 MWP2018-82		 Blue emissions from spin coated layers of CdSe/ZnS quantum dots are enhanced by surface plasmon resonance with silver or... [more] PN2018-64 EMT2018-98 OPE2018-173 LQE2018-183 EST2018-111 MWP2018-82
pp.183-186
PRMU 2018-12-13
10:00		 Miyagi   Style conversion
Miduki Mori, Toshiki Nakamura, Hideaki Hayashi, Seiichi Uchida (Kyushu Univ.) PRMU2018-75		 In this research, in order to find the boundary between handwritten character and typeface, we attempt to acquire a func... [more] PRMU2018-75
pp.1-6
PRMU 2018-12-13
10:15		 Miyagi  
Toshiki Nakamura, Seiichi Uchida (Kyushu Univ.) PRMU2018-76		 The purpose of this research is magnifying scene texts using convolutional neural network (CNN) with end-to-end.
We tr... [more]		 PRMU2018-76
pp.7-12
ICD 2018-04-19
10:10		 Tokyo   Reliability Enhancement Technique with Horizontal Error Detection and Vertical-LDPC in 3D-TLC NAND Flash Memories
Shun Suzuki, Yoshiaki Deguchi, Toshiki Nakamura, Kyoji Mizoguchi, Ken Takeuchi (Chuo Univ.) ICD2018-1		 Conventional Asymmetric Coding (AC) has been proposed for improving NAND flash memories. In this work, Horizontal Error ... [more] ICD2018-1
pp.1-6
ICD 2017-04-20
14:15		 Tokyo   [Invited Lecture] TLC NAND Flash Memory Control Techniques to Reduce Errors of Read-Hot and Cold Data for Data Centers
Toshiki Nakamura, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2017-6		 In cloud data centers, NAND flash memory stores both read-hot and cold data. This paper describes that the threshold vol... [more] ICD2017-6
pp.29-34
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] A Highly Reliable Method with Data-Retenrion Characteristics in TLC NAND Flash Memories
Toshiki Nakamura, Yoshiaki Deguchi, Ken Takeuchi (Chuo Univ.) ICD2016-73 CPSY2016-79		 The capacity of NAND flash memory can be expanded by multi-level cell technology. In particular, 3-bit/cell triple-level... [more] ICD2016-73 CPSY2016-79
p.65
MBE 2004-06-18
15:15		 Hokkaido Hokkaido University The study of relation between the angle, shape of the implant and range of motion(ROM) in THA
Kohta Yagihashi, Ikuya Nishimura, Toshimasa Ishida (Hokkaidou Univ.), Hiroshi Ito, Hiromasa Tanino, Toshiki Nakamura, Takeo Matsuno (Asahikawa Medical College), Yoshinori Mitamura (Hokkaidou Univ.) 		 [more] MBE2004-16
pp.21-23
 Results 1 - 7 of 7  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan