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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2012-11-16
13:00
Tokyo Kikai-Shinko-Kaikan Bldg Molecular Dynamics Simulation of Heat Transport in Silicon Fin Structures
Tomofumi Zushi (Waseda Univ./JST), Kenji Ohmori, Keisaku Yamada (Univ. of Tsukuba/JST), Takanobu Watanabe (Waseda Univ./JST) SDM2012-108
We perform a series of molecular dynamics (MD) simulations to investigate the transport process of heat in a hotspot reg... [more] SDM2012-108
pp.47-52
SDM 2011-12-16
14:40
Nara NAIST Characterization and Modeling of Drain Overshoot Current in Poly-Si Thin Film Transistors
Toshifumi Ota, Hiroshi Tsuji, Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.) SDM2011-142
Transient characteristics of drain current in poly-Si thin film transistors (TFTs) are investigated experimentally, and ... [more] SDM2011-142
pp.53-58
ED 2010-06-17
14:25
Ishikawa JAIST Analysis of electron velocity reduction rate due to self-heating in AlGaN/GaN heterojunction field-effect transistors
Toshi-kazu Suzuki, Nariaki Tanaka (JAIST) ED2010-36
(To be available after the conference date) [more] ED2010-36
pp.17-20
SDM 2009-12-04
11:20
Nara NAIST Characteristics of hot hole injection, trapping, and detrapping in gate oxide of poly-Si TFTs
Yoshinari Kamakura (Osaka Univ.), Takashi Himukashi (Osaka Univ./Kansai Univ.), Hiroshi Tsuji, Kenji Taniguchi (Osaka Univ.) SDM2009-157
The hysteresis observed in the transfer characteristics of n-channel poly-Si TFTs are experimentally investigated and po... [more] SDM2009-157
pp.35-38
SDM 2009-11-13
10:00
Tokyo Kikai-Shinko-Kaikan Bldg. Impact of Self-Heating Effect on the Electrical Characteristics of Nanoscale Transistors
Yoshinari Kamakura, Nobuya Mori (Osaka Univ./JST), Kenji Taniguchi (Osaka Univ.) SDM2009-142
Hot phonon generation and its impact on the current conduction in nanoscale Si-MOSFETs are investigated using numerical ... [more] SDM2009-142
pp.39-44
SDM, ED 2008-07-10
10:40
Hokkaido Kaderu2・7 Study of Self-Heating Phenomena in Si Nano Wire MOS Transistor
Tetsuo Endoh, Kousuke Tanaka, Yuto Norifusa (Tohoku Univ.) ED2008-59 SDM2008-78
In this study, I have numerically investigated the temperature distribution of n-type Si Nano Wire MOS transistor (NW-MO... [more] ED2008-59 SDM2008-78
pp.101-105
ED, SDM 2007-06-25
13:00
Overseas Commodore Hotel Gyeongju Chosun, Gyeongju, Korea [Invited Talk] Requirements for Thin Film Transistor Circuits on Plastic
Mitsutoshi Miyasaka, Hiroyuki Hara, Nobuo Karaki, Satoshi Inoue (Seiko Epson)
The self-heating effect of thin film transistors (TFTs) is a serious problem when the TFT circuits are formed on a plast... [more]
ICD 2005-07-15
15:45
Aichi Toyohashi Univ. of Tech. 非冷却赤外線センサにおける基板温度・自己加熱補正機構
本多 浩大, 藤原 郁夫, 飯田 義典, 重中 圭太郎 (東芝)
We have developed an uncooled(thermal) infrared sensor with the read-out circuit that can calibrate the substrate temper... [more] ICD2005-64
pp.51-56
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