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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2012-11-16 13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Molecular Dynamics Simulation of Heat Transport in Silicon Fin Structures Tomofumi Zushi (Waseda Univ./JST), Kenji Ohmori, Keisaku Yamada (Univ. of Tsukuba/JST), Takanobu Watanabe (Waseda Univ./JST) SDM2012-108 |
We perform a series of molecular dynamics (MD) simulations to investigate the transport process of heat in a hotspot reg... [more] |
SDM2012-108 pp.47-52 |
SDM |
2011-12-16 14:40 |
Nara |
NAIST |
Characterization and Modeling of Drain Overshoot Current in Poly-Si Thin Film Transistors Toshifumi Ota, Hiroshi Tsuji, Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.) SDM2011-142 |
Transient characteristics of drain current in poly-Si thin film transistors (TFTs) are investigated experimentally, and ... [more] |
SDM2011-142 pp.53-58 |
ED |
2010-06-17 14:25 |
Ishikawa |
JAIST |
Analysis of electron velocity reduction rate due to self-heating in AlGaN/GaN heterojunction field-effect transistors Toshi-kazu Suzuki, Nariaki Tanaka (JAIST) ED2010-36 |
(To be available after the conference date) [more] |
ED2010-36 pp.17-20 |
SDM |
2009-12-04 11:20 |
Nara |
NAIST |
Characteristics of hot hole injection, trapping, and detrapping in gate oxide of poly-Si TFTs Yoshinari Kamakura (Osaka Univ.), Takashi Himukashi (Osaka Univ./Kansai Univ.), Hiroshi Tsuji, Kenji Taniguchi (Osaka Univ.) SDM2009-157 |
The hysteresis observed in the transfer characteristics of n-channel poly-Si TFTs are experimentally investigated and po... [more] |
SDM2009-157 pp.35-38 |
SDM |
2009-11-13 10:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Impact of Self-Heating Effect on the Electrical Characteristics of Nanoscale Transistors Yoshinari Kamakura, Nobuya Mori (Osaka Univ./JST), Kenji Taniguchi (Osaka Univ.) SDM2009-142 |
Hot phonon generation and its impact on the current conduction in nanoscale Si-MOSFETs are investigated using numerical ... [more] |
SDM2009-142 pp.39-44 |
SDM, ED |
2008-07-10 10:40 |
Hokkaido |
Kaderu2・7 |
Study of Self-Heating Phenomena in Si Nano Wire MOS Transistor Tetsuo Endoh, Kousuke Tanaka, Yuto Norifusa (Tohoku Univ.) ED2008-59 SDM2008-78 |
In this study, I have numerically investigated the temperature distribution of n-type Si Nano Wire MOS transistor (NW-MO... [more] |
ED2008-59 SDM2008-78 pp.101-105 |
ED, SDM |
2007-06-25 13:00 |
Overseas |
Commodore Hotel Gyeongju Chosun, Gyeongju, Korea |
[Invited Talk]
Requirements for Thin Film Transistor Circuits on Plastic Mitsutoshi Miyasaka, Hiroyuki Hara, Nobuo Karaki, Satoshi Inoue (Seiko Epson) |
The self-heating effect of thin film transistors (TFTs) is a serious problem when the TFT circuits are formed on a plast... [more] |
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ICD |
2005-07-15 15:45 |
Aichi |
Toyohashi Univ. of Tech. |
非冷却赤外線センサにおける基板温度・自己加熱補正機構 本多 浩大, 藤原 郁夫, 飯田 義典, 重中 圭太郎 (東芝) |
We have developed an uncooled(thermal) infrared sensor with the read-out circuit that can calibrate the substrate temper... [more] |
ICD2005-64 pp.51-56 |
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