Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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CPM2011-149
[Invited Talk]
Microjoining Technology for Semiconductor Heterogeneoous Integration
Tanemasa Asano (Kyushu Univ.)
pp. 1 - 6
CPM2011-150
[Invited Talk]
MEMS Microwave Tunable Filters on High-K LTCC
-- Featuring Low Insertion Loss and Small Sized --
Fumihiko Nakazawa, Xiaoyu Mi, Osamu Toyoda, Satoshi Ueda (Fujitsu Lab.)
pp. 7 - 12
CPM2011-151
[Invited Talk]
An RF-MEMS tunable capacitor with CMOS driver IC
Yoshiaki Sugizaki, Tamio Ikehashi, Hiroaki Yamazaki, Tomohiro Saito, Etsuji Ogawa, Yoshiaki Shimooka, Hideki Shibata (Toshiba)
pp. 13 - 18
CPM2011-152
Waveform-Improvement of High-speed Signals on Branch Traces on PCBs
Yusuke Kuribara, Shohei Akita, Hiroki Shimada, Takuya Adachi, Hidetoshi Ishijima (Univ. Tsukuba), Ikuo Yoshihara (Univ. Miyazaki), Moritoshi Yasunaga (Univ. Tsukuba)
pp. 19 - 24
CPM2011-153
Towards an efficient simulation of SystemC Transaction Level Models
Jun Furukawa (Kyushu Univ.), Norifumi Yoshimatsu (ISIT), Kazuaki Murakami (Kyushu Univ.)
pp. 25 - 30
CPM2011-154
[Invited Talk]
A new data format for designing device embedded substrates
Hajime Tomokage (Fukuoka Univ.), Hidemichi Kawase (Keirex Tech.)
pp. 31 - 34
CPM2011-155
[Invited Talk]
High-Density Wiring Technology for LSI Packages
Motoaki Tani, Shinya Sasaki (FUJITSU LAB.), Keisuke Uenishi (Osaka Univ.)
pp. 35 - 40
CPM2011-156
[Fellow Memorial Lecture]
Safe, Secure and Reliable Society by Electronics and InformationTechnology
-- What and how should we protect? --
Shuichi Sakai (UT)
pp. 41 - 42
CPM2011-157
[Invited Talk]
Ultra-precision measurement & fabrication technology of LSI and its materials for the next generation.
-- Toward the atomic scale production applying novel opto-machanical methods --
Hiroshi Kubota, Yuki Soh, Seiya Matsukawa (Kumamoto Univ.), Kouji Kosaka, Tadayuki Kyotani (PMT)
pp. 43 - 45
CPM2011-158
[Invited Talk]
Integrated CMOS-MEMS Technology and Its Applications
Hiroki Morimura, Toshishige Shimamura, Kei Kuwabara, Kazuyoshi Ono (NTT), Katsuyuki Machida (NTT-AT)
pp. 47 - 52
CPM2011-159
Implementation of an FU Array Accelerator and its Analysis
Mitsutoshi Saito, Shunsuke Shitaoka, Kazuhiro Yoshimura, Jun Yao, Takashi Nakada, Yasuhiko Nakashima (NAIST)
pp. 53 - 58
CPM2011-160
Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing
Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.)
pp. 59 - 63
CPM2011-161
[Keynote Address]
Lithography : past, present, and future
Shigeki Nojima (Toshiba)
p. 65
CPM2011-162
A Circuit Partitioning Strategy for 3-D Integrated Floating-point Multipliers
Kazushige Kawai, Jubee Tada (Yamagata Univ.), Ryusuke Egawa, Hiroaki Kobayashi (Tohoku Univ.), Gensuke Goto (Yamagata Univ.)
pp. 67 - 72
CPM2011-163
Measurements and Co-Simulation of On-Chip and On-Boad AC Power Noise in Digital Integrated Circuits
Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ./CREST,JST)
pp. 73 - 78
CPM2011-164
A 40nm 144mW VLSI Processor for Realtime 60k Word Continuous Speech Reconginion
Takanobu Sugahara, Guangji He, Tsuyoshi Fujinaga, Yuki Miyamoto, Hiroki Noguchi, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.)
pp. 79 - 84
CPM2011-165
Immunity Evaluation of SRAM Core Using DPI with On-Chip Diagnosis Structures
Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa (Kobe Univ.), Hidehiro Takata, Koji Nii (Renesas Electronics Corp.), Makoto Nagata (Kobe Univ.)
pp. 85 - 90
CPM2011-166
A 22-Gb/s and over-33-mega-frame/s throughput bridge-function unit in a low-latency OLT LSI for the coexistence of 10G-EPON and GE-PON
Shoko Ohteru, Tomoaki Kawamura, Hiroki Suto, Masami Urano, Mamoru Nakanishi, Tsugumichi Shibata (NTT)
pp. 91 - 96
CPM2011-167
10G-EPON OLT and ONU LSIs for next-generation FTTx system
Tomoaki Kawamura, Shoko Ohteru, Sadayuki Yasuda, Akihiko Miyazaki, Kenji Kawai, Ritsu Kusaba, Mamoru Nakanishi, Masami Urano, Tsugumichi Shibata (NTT)
pp. 97 - 102
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.