Online edition: ISSN 2432-6380
[TOP] | [2015] | [2016] | [2017] | [2018] | [2019] | [2020] | [2021] | [Japanese] / [English]
DC2018-71
Note on Target Fault Selection for 2-Pattern Test Generation Considering Critical Area
Naoya Uchiyama, Masayuki Arai (Nihon Univ.)
pp. 1 - 5
DC2018-72
Variational Autoencoder-Based Efficient Test Escape Detection
Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST)
pp. 7 - 12
DC2018-73
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ)
pp. 13 - 18
DC2018-74
Analysis of the hotspot distribution in the LSI
Yudai Kawano, Kohei Miyase (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech)
pp. 19 - 24
DC2018-75
Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test
Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST)
pp. 25 - 30
DC2018-76
A built-in self-diagnosis mechanism based on self-generation of expected signatures
Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.), Hiroshi Takahashi (Ehime Univ.)
pp. 31 - 36
DC2018-77
An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling
Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST)
pp. 37 - 42
DC2018-78
State Assignment Method to Improve Transition Fault Coverage for Datapath
Masayoshi Yoshimura (Kyoto Sangyo Univ.), Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.)
pp. 43 - 48
DC2018-79
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas)
pp. 49 - 54
DC2018-80
A Compaction Method for Test Sensitization State in Controllers
Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.)
pp. 55 - 60
DC2018-81
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
Yuki Maeda, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (Hiroshima City Univ.)
pp. 61 - 66
DC2018-82
Improvement of Flip-Flop Performance Considering the Influence of Power Supply Noise
Yuya Kinoshita, Yukiya Miura (Tokyo Metropolitan Univ.)
pp. 67 - 72
DC2018-83
(See Japanese page.)
pp. 73 - 76
DC2018-84
Reliability evaluation of the optical navigation electronics of HAYABUSA2
-- Onboard demonstration of a high reliability system with limited resources --
Hiroki Hihara (NECSpace/NEC), Junpei Sano (NECSpace), Tetsuya Masuda (NEC), Hisashi Otake, Tatsuaki Okada, Naoko Ogawa, Yuichi Tsuda (JAXA)
pp. 77 - 82
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.