IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

Technical Committee on Computer Systems (CPSY)  (Searched in: 2008)

Search Results: Keywords 'from:2008-04-23 to:2008-04-23'

[Go to Official CPSY Homepage] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 10 of 10  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC, CPSY 2008-04-23
10:00
Tokyo Tokyo Univ. Perfect Classified Channel retaining DC balance
Hiroki Matsuoka, Koichi Inoue, Hiroaki Nishi (Keio Univ.) CPSY2008-1 DC2008-1
This paper shows an implementation for Perfect Classified Channel (PCC) that shall be encrypted at all times. PCC is Lay... [more] CPSY2008-1 DC2008-1
pp.1-6
DC, CPSY 2008-04-23
10:30
Tokyo Tokyo Univ. A Clustering to Regularize Task Granule for Distributed Environment
Hidehiro Kanemitsu, Hidenori Nakazato, Takashige Hoshiai, Yoshiyori Urano (Waseda Univ.) CPSY2008-2 DC2008-2
In a distributed machine environment, it is very important to control task grain size to take balance
between each task... [more]
CPSY2008-2 DC2008-2
pp.7-12
DC, CPSY 2008-04-23
11:00
Tokyo Tokyo Univ. A Lightweight Write Error Detection for Register-file Using Improved Passive WAB
Hidetsugu Irie, Ken Sugimoto, Ryota Shioya (U-Tokyo), Kenichi Watanabe (Hitachi), Masahiro Goshima, Shuichi Sakai (U-Tokyo) CPSY2008-3 DC2008-3
Recently, it has been getting inefficient to design microprocessors with worst-case margins because of increasing proces... [more] CPSY2008-3 DC2008-3
pp.13-18
DC, CPSY 2008-04-23
11:30
Tokyo Tokyo Univ. A Study on Reliability and Performance of FPGA-Based Fault Tolerant Systems
Ryoji Noji, Satoshi Fujie, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) CPSY2008-4 DC2008-4
FPGAs (Field-Programmable Gate Arrays), which can implement arbitrary logic circuits
any number of times by loading con... [more]
CPSY2008-4 DC2008-4
pp.19-24
DC, CPSY 2008-04-23
14:00
Tokyo Tokyo Univ. Generating PROMELA Models of Fault-Tolerant Distributed Algorithms
Takahiro Minamikawa, Tatsuhiro Tsuchiya, Tohru Kikuno (Osaka Univ.) CPSY2008-5 DC2008-5
The consensus problem is fundamental in implementing fault-tolerant distributed systems.
However, designing a correct c... [more]
CPSY2008-5 DC2008-5
pp.25-30
DC, CPSY 2008-04-23
14:30
Tokyo Tokyo Univ. Finding the Optimal Configuration of a Cascading Single-Voter TMR System
Masashi Hamamatsu, Tatsuhiro Tsuchiya, Tohru Kikuno (Osaka Univ.) CPSY2008-6 DC2008-6
Triple modular redundancy (TMR) is a major method that is used for implementing fault tolerant systems. In TMR, a module... [more] CPSY2008-6 DC2008-6
pp.31-36
DC, CPSY 2008-04-23
15:00
Tokyo Tokyo Univ. Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
Eishi Ibe (PERL) CPSY2008-7 DC2008-7
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in
semicon... [more]
CPSY2008-7 DC2008-7
pp.37-42
DC, CPSY 2008-04-23
15:30
Tokyo Tokyo Univ. Influence of Untestable Hard Error on Soft Error Hardened Latches
Kengo Nakashima, Kazuteru Namba, Hideo Ito (Chiba Univ) CPSY2008-8 DC2008-8
In recent high-density, high-speed and low-power VLSIs, soft errors frequently occur, and soft error hardened design bec... [more] CPSY2008-8 DC2008-8
pp.43-48
DC, CPSY 2008-04-23
16:15
Tokyo Tokyo Univ. Soft Error Hardened FF Capable of Detecting Wide Error Pulse
Shuangyu Ruan, Kazuteru Namba, Hideo Ito (Chiba-Univ.) CPSY2008-9 DC2008-9
In the recent high-density and low-power VLSIs,occurrence of soft errors becomes significant problems.Recently,soft erro... [more] CPSY2008-9 DC2008-9
pp.49-54
DC, CPSY 2008-04-23
16:45
Tokyo Tokyo Univ. An approach to tolerating delay faults based on asynchronous circuits
Tomohiro Yoneda (NII), Masashi Imai (Univ. of Tokyo), Atsushi Matsumoto, Takahiro Hanyu (Tohoku Univ.), Yuichi Nakamura (NEC) CPSY2008-10 DC2008-10
Recent advances in semiconductor process technologies cause new types of faults, which should be handled in order to obt... [more] CPSY2008-10 DC2008-10
pp.55-60
 Results 1 - 10 of 10  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan