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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| MSS, SS | 2023-01-11 13:55 |
Osaka | (Primary: On-site, Secondary: Online) |
 MSS2022-57 SS2022-42 |
(To be available after the conference date) [more] | MSS2022-57 SS2022-42 pp.72-77 |
| SS, IPSJ-SE, KBSE [detail] | 2022-07-29 13:25 |
Hokkaido | Hokkaido-Jichiro-Kaikan (Sapporo) (Primary: On-site, Secondary: Online) |
Fault Localization for RNNs Based on Probabilistic Automata and n-grams Yuta Ishimoto, Masanari Kondo, Naoyasu Ubayashi, Yasutaka Kamei (Kyushu Univ.) SS2022-10 KBSE2022-20 |
If deep learning models misbehave, serious accidents may occur.Previous studies have proposed approaches to overcome suc... [more] | SS2022-10 KBSE2022-20 pp.55-60 |
| SS | 2022-03-07 11:20 |
Online | Online | Trace Ablation and Fault Localization per Method Using Machine Learning Models for Automatic Classification of Test Execution Results Takuma Ikeda, Kozo Okano, Shinpei Ogata (Shinshu Univ.), Shin Nakajima (NII) SS2021-44 |
The problem to solve automatically classifying the results of test executions is called the test oracle problem. This is... [more] | SS2021-44 pp.13-18 |
| SS, MSS | 2022-01-11 15:10 |
Nagasaki | Nagasakiken-Kensetsu-Sogo-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
Improving the accuracy of SBFL by weighting test cases using the proximity of execution routes. Haruka Yoshioka, Yoshiki Higo, Shinji Kusumoto (Osaka Univ) MSS2021-39 SS2021-26 |
(To be available after the conference date) [more] | MSS2021-39 SS2021-26 pp.46-51 |
| SS | 2020-03-04 16:05 |
Okinawa | (Cancelled but technical report was issued) |
The Impact of Fault Localization Considering Developers' Intuition on Automatic Bug Repair Kyosuke Yamate, Takumi Shuto, Sho Asada, Ryosuke Sato, Yasutaka Kamei, Naoyasu Ubayasi (Kyushu Univ) SS2019-48 |
Research on automatic program repair has been actively conducted in order to reduce debugging costs in software developm... [more] | SS2019-48 pp.43-48 |
| KBSE, SS, IPSJ-SE [detail] | 2018-07-19 16:05 |
Hokkaido | SS2018-12 KBSE2018-22 |
(To be available after the conference date) [more] | SS2018-12 KBSE2018-22 pp.149-154 |
|
| R | 2017-10-20 14:50 |
Kumamoto | A note on changes of source codes in bug-fixing commits Mamoru Ohara (TIRI) R2017-46 |
Nowadays in many software development projects, testing and fixing the defects usually cost a major part of the whole ... [more] |
R2017-46 pp.13-16 |
|
| ET | 2016-03-05 16:15 |
Kagawa | Kawaga Univ. (Saiwai-cho Campus) | A Proposal for a Misconfiguration Detection Method based on Program Analysis Techniques for Network Construction Exercises for Beginners Yuichiro Tateiwa, Naohisa (NIT) ET2015-106 |
In this study, we propose a method that specifies regions (we call them fault regions) where misconfigurations concernin... [more] | ET2015-106 pp.71-76 |
| SS | 2015-03-09 11:25 |
Okinawa | OKINAWAKEN SEINENKAIKAN | Implementation and Evaluation of Fault Localization Technique based on Occurrence of Dynamic Data Dependencies Mizuki Nakano, Shunsuke Ohnuma, Takashi Kobayashi (Tokyo Tech.), Takashi Ishio (Osaka Univ.) SS2014-58 |
In the debugging process, we must find fault locations by investigating infection chains backwards; from failure points ... [more] | SS2014-58 pp.19-24 |
| DC | 2013-06-21 15:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Approach of Generating a Test Set to Locate a Pair-Wise Interaction Fault Takahiro Nagamoto, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) DC2013-13 |
This paper discusses the location of interaction faults in software interaction testing. Speci cally, we propose a meth... [more] |
DC2013-13 pp.19-23 |
| MSS, SS | 2013-03-06 16:20 |
Fukuoka | Shikanoshima | Multiple Programming Languages Support Customizable Bug Localization Framework Kiyofumi Shimojo, Kazunori Sakamoto, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.) MSS2012-67 SS2012-67 |
Bug localization technique is effectual approach for locating software bugs using the number of failing and passing test... [more] | MSS2012-67 SS2012-67 pp.45-50 |
| MSS, SS | 2013-03-06 17:40 |
Fukuoka | Shikanoshima | Propagation Probability of Data Dependency for Fault Localization Sanae Muramatsu (Nagoya Univ.), Takashi Kobayashi (Tokyo Inst. of Tech./Nagoya Univ.), Noritoshi Atsumi (Nagoya Univ.), Kiyoshi Agusa (Kyoto Univ.) MSS2012-71 SS2012-71 |
One of the most tedious and time-consuming tasks of debugging is fault localization (FL), which is locating root cause o... [more] | MSS2012-71 SS2012-71 pp.69-74 |
| SS | 2012-03-13 17:10 |
Okinawa | Tenbusu-Naha | Fault-Localization that focuses on the program structure and debugging support Kiyofumi Shimojo, Kazunori Sakamoto, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.) SS2011-73 |
Fault localization is the techniques that estimates location of bugs causing the test failure using test results. Fault ... [more] | SS2011-73 pp.97-102 |
| IN | 2011-10-21 13:25 |
Osaka | Osaka University | Proposal of a fault localization method by time-variant dependency graph for mobile devices Suguru Doki, Daisuke Arai, Kenji Hori, Kiyohito Yoshihara (KDDI Labs.) IN2011-90 |
A mobile device which has some network interfaces such as CDMA interface, Wi-Fi interface and WiMAX interface is in wide... [more] | IN2011-90 pp.63-68 |
| DC | 2010-02-15 15:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | High Speed X-Fault Diagnosis with Partial X-Resolution Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.) DC2009-76 |
Defects behavior of ultra small size and high speed LSI is getting complicated. It makes localization of fault site and ... [more] | DC2009-76 pp.69-74 |
| R, ED, SDM | 2005-11-25 14:00 |
Osaka | Central Electric Club | Localization Method of Failure Point with Scan Chain Takeshi Kataoka, Hisakazu Watanabe, Yasushi Kannan, Masaji Tanaka (Matsushita Electric Industrial) |
Fault diagnosis system which extracts a suspicion failure node of the logic circuit by using LSI tester and analytical ... [more] | R2005-42 ED2005-177 SDM2005-196 pp.25-30 |
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