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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, EID |
2014-12-12 11:15 |
Kyoto |
Kyoto University |
Photoelectric conversion function analysis of the silicon solar module using electroluminescence(EL) emission intensity Tsuyoshi Tomimoto, Shota Tsuzuki, Ayumi Tani (NAIST) EID2014-18 SDM2014-113 |
Electroluminescence imaging method (EL method) is extensively investigated since crystal defects and process induced fau... [more] |
EID2014-18 SDM2014-113 pp.25-29 |
SDM |
2013-12-13 10:00 |
Nara |
NAIST |
Silicon nanowire growth by vapor liquid solid mode using indium dots Keigo Fukunaga, Tomoaki Hatayama, Hiroshi Yano, Naofumi Okamoto, Ayumi Tani, Yasuaki Ishikawa, Takashi Fuyuki (NAIST) SDM2013-119 |
A silicon nanowire (Si-NW) structure is one of the key structures to improve conversion efficiency in silicon solar cell... [more] |
SDM2013-119 pp.19-23 |
SDM |
2012-12-07 15:45 |
Kyoto |
Kyoto Univ. (Katsura) |
Electric Characteristic of Crystalline Silicon Solar Cells using Electroluminescence Imaging under Reverse-based Emi Sugimura, Shigekazu Shimazaki, Ayumi Tani, Takashi Fuyuki (NAIST) SDM2012-133 |
The electroluminescence (EL) imaging has received spatially resolved information about the electronic material propertie... [more] |
SDM2012-133 pp.107-111 |
EMT, PN, LQE, OPE, MWP, EST, IEE-EMT [detail] |
2012-01-26 09:55 |
Osaka |
Osaka Univ. Convention Center |
Measurement of IC Package Inductance with Transmission Line Embedded in Package Kengo Iokibe, Ayumi Tanimichi, Yoshitaka Toyota (Okayama Univ.) PN2011-35 OPE2011-151 LQE2011-137 EST2011-85 MWP2011-53 |
It is of importance for designers to possess accurate inductances of IC packages in power integrity (PI) and electromagn... [more] |
PN2011-35 OPE2011-151 LQE2011-137 EST2011-85 MWP2011-53 pp.11-16 |
EMCJ |
2011-07-14 11:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Measurement of Self-Inductance of IC Package with THRU Pattern Embedded Instead of Chip Ayumi Tanimichi, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2011-49 |
In IC package modeling of electrical properties, to compare model parameters extracted from results
of electromagnetic ... [more] |
EMCJ2011-49 pp.31-36 |
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