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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD, SDM, ITE-IST [detail] | 2022-08-08 15:20 |
Online | Evaluation of IC Chip Response by Backside Voltage Disturbance in Flip Chip Packaging Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.)  SDM2022-40 ICD2022-8 |
Flip chip packaging has become a general technique for mounting semiconductor ICs due to the need for smaller area. Howe... [more] | SDM2022-40 ICD2022-8 pp.27-30 |
|
| EA | 2015-07-03 15:50 |
Tokyo | The Univ. of Electro-Communications, 80th Anniversary Memorial Hall | An adaptive algorithm for acoustic echo canceler adjusting insertion loss to echo path change and double talk. Kensaku Fujii (Kodaway Lab.), Takuya Sawada, Takuto Yoshioka (Univ. of Hyogo), Mitsuji Muneyasu (Kansai Univ.) EA2015-9 |
(To be available after the conference date) [more] | EA2015-9 pp.45-50 |
| ICD | 2014-01-28 15:00 |
Kyoto | Kyoto Univ. Tokeidai Kinenkan | [Poster Presentation]
An Autonomous Control Cache Memory for Dynamic Variation Tolerance with Bit-Enhancing Memory Yuta Kimi, Yohei Nakata, Shunsuke Okumura, Jinwook Jung, Takuya Sawada, Taku Toshikawa (Kobe Univ.), Makoto Nagata (Kobe Univ./JST CREST), Hirofumi Nakano, Makoto Yabuuchi, Hidehiro Fujiwara, Koji Nii, Hiroyuki Kawai (Renesas Electronics Corporation), Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST CREST) ICD2013-125 |
Processor reliability is getting more critical issue since technology scaling degrades processor tolerance against power... [more] | ICD2013-125 p.59 |
| EA, US (Joint) |
2014-01-28 13:25 |
Osaka | Kansai University, Centenary Memorial Hall | A study on method of controlling the magnitude of attenuation applied to acoustic echo canceller systems Takuya Sawada, Takuto Yoshioka, Kensaku Fujii (Univ of Hyogo), Mitsuji Muneyasu (Kansai Univ), Masakazu Morimoto (Univ of Hyogo) EA2013-114 |
We propose a method to control magnitude of attenuation of the sound switch in acoustic echo canceller systems using ADF... [more] | EA2013-114 pp.63-68 |
| US, EA (Joint) |
2013-01-25 14:40 |
Kyoto | Kambaikan, Doshisha Univ. | Study on acoustic echo canceller for in-vehicle Takuya Sawada, Kensaku Fujii (Univ of Hyogo), Mitsuji Muneyasu (Kansai Univ), Masakazu Morimoto (Univ of Hyogo) EA2012-140 |
This paper proposes a new method for identifying unknown systems expressed by the cascade arrangement of recursive and n... [more] | EA2012-140 pp.121-126 |
| EA, SP, SIP | 2012-05-25 10:00 |
Osaka | Osaka Univ. Nakanoshima Center | Study on application of cascade connection of recursive and non-recursive type adaptive filters to acoustic echo canceler Takuya Sawada, Yusuke Kuwahara, Kensaku Fujii (Hyogo Univ.), Mitsuji Muneyasu (Kansai Univ.), Masakazu Morimoto (Hyogo Univ.) EA2012-22 SIP2012-22 SP2012-22 |
[more] | EA2012-22 SIP2012-22 SP2012-22 pp.127-132 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:30 |
Miyazaki | NewWelCity Miyazaki | Immunity Evaluation of SRAM Core Using DPI with On-Chip Diagnosis Structures Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa (Kobe Univ.), Hidehiro Takata, Koji Nii (Renesas Electronics Corp.), Makoto Nagata (Kobe Univ.) CPM2011-165 ICD2011-97 |
[more] | CPM2011-165 ICD2011-97 pp.85-90 |
| ICD | 2010-12-16 15:10 |
Tokyo | RCAST, Univ. of Tokyo | [Poster Presentation]
Evaluation of power noise in SRAM core Taku Toshikawa, Tsubasa Masui, Takuya Sawada, Makoto Nagata (Kobe Univ.) ICD2010-112 |
Power noise of SRAM operation is evaluated with a test chip fabricated in a 90-nm CMOS technology. The chip includes on-... [more] | ICD2010-112 pp.85-88 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 11:00 |
Fukuoka | Kyushu University | Evaluation of on-chip power noise generation and injection in SRAM core Takuya Sawada, Taku Toshikawa, Tsubasa Masui (Kobe Univ.), Makoto Nagata (Kobe Univ./CREST-JST) CPM2010-125 ICD2010-84 |
The noise tolerance of SRAM was evaluated by evaluating the power supply noise generation, and injecting the RF noise i... [more] | CPM2010-125 ICD2010-84 pp.7-12 |
| ICD | 2008-12-11 13:30 |
Tokyo | Tokyo Inst. Tech., Ohokayama Campus, Kokusa-Kouryu-Kaikan | [Poster Presentation]
Simulation Techniques for Power Supply Noise and Operation Failures in Digital LSI Takuya Sawada, Makoto Nagata (Kobe Univ.) ICD2008-110 |
Dynamic power-supply noise is analyzed in large-scale CMOS digital LSI. For the analysis, power-supply current modeling... [more] |
ICD2008-110 pp.47-50 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-19 10:50 |
Fukuoka | Kitakyushu Science and Research Park | A Fast Simulation Technique of Processor Power Supply Noise using Capacitance Charging Model Fukuichi Iwasa, Takuya Sawada, Mitsuya Fukazawa, Makoto Nagata (Kobe Univ.) CPM2008-94 ICD2008-93 |
A fast simulation technique is proposed for the power supply noise analysis of the large-scale digital processor. The an... [more] | CPM2008-94 ICD2008-93 pp.31-36 |
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