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All Technical Committee Conferences (Searched in: Recent 10 Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS, ICD | 2024-11-01 15:40 |
Aomori | Hirosaki University (Primary: On-site, Secondary: Online) |
Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.)  HWS2024-69 ICD2024-40 |
There are a variety of fault injection attacks on IC chips. One of them is to apply high voltage pulses from the backsid... [more] | HWS2024-69 ICD2024-40 pp.38-43 |
| HWS, ICD | 2024-11-01 16:05 |
Aomori | Hirosaki University (Primary: On-site, Secondary: Online) |
Evaluation of Chip Internal Voltage Fluctuation and Digital Circuit Faults Induced by Electromagnetic Fault Injection Attacks Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2024-70 ICD2024-41 |
The information handled by IC chips encompasses a wide range of data, and it is imperative to ensure the protection of s... [more] | HWS2024-70 ICD2024-41 pp.44-47 |
| VLD, HWS, ICD | 2024-03-01 11:15 |
Okinawa | (Primary: On-site, Secondary: Online) |
Investigation of electromagnetic irradiation noise reduction by on-chip LDOs Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-124 HWS2023-84 ICD2023-113 |
IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions (faults) by injecting il... [more] | VLD2023-124 HWS2023-84 ICD2023-113 pp.131-134 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-17 10:00 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Derivation of secret keys by differential fault analysis using backside voltage fault injection Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67 |
Lasers have been the leading method of fault injection in fault injection attacks on cryptographic integrated circuit (I... [more] | VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67 pp.178-181 |
| HWS | 2023-04-14 14:45 |
Oita | (Primary: On-site, Secondary: Online) |
Exploration of analysis methods of electromagnetic fault injection attacks on cryptographic IC chips Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-4 |
There are various methods of fault injection attacks on cryptographic IC chips, such as lasers and electromagnetic waves... [more] | HWS2023-4 pp.11-15 |
| HWS | 2023-04-14 15:10 |
Oita | (Primary: On-site, Secondary: Online) |
Electromagnetic fault injection attacks on cryptographic IC chips and analysis of internal voltage fluctuation Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ) HWS2023-5 |
Cryptographic IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions through in... [more] | HWS2023-5 pp.16-19 |
| HWS, ICD | 2022-10-25 10:50 |
Shiga | (Primary: On-site, Secondary: Online) |
Power current simulation and side channel leakage evaluation of cryptographic IC chips Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2022-32 ICD2022-24 |
Cryptographic modules are threatened by side-channel attacks that use side-channel information to decrypt internal confi... [more] | HWS2022-32 ICD2022-24 pp.12-16 |
| ICD, SDM, ITE-IST [detail] | 2022-08-08 15:20 |
Online | Evaluation of IC Chip Response by Backside Voltage Disturbance in Flip Chip Packaging Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2022-40 ICD2022-8 |
Flip chip packaging has become a general technique for mounting semiconductor ICs due to the need for smaller area. Howe... [more] | SDM2022-40 ICD2022-8 pp.27-30 |
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| EMCJ | 2022-06-10 11:00 |
Hokkaido | Hokkaido University (Primary: On-site, Secondary: Online) |
Evaluation of External Disturbance Immunity by Bulk Current Injection into Ethernet Communication System(2) Kohei Kawai, Takuya Wadatsumi (Kobe Univ.), Ken Okamoto, Yuichiro Okugawa (NTT), Takuji Miki, Makoto Nagata (Kobe Univ.) EMCJ2022-18 |
[more] | EMCJ2022-18 pp.21-25 |
| EMCJ | 2022-01-21 11:20 |
Online | Online | Evaluation of External Disturbance Immunity by Bulk Current Injection into Ethernet Communication System Kohai Kawai, Takuya Wadatsumi, Akira Tsukada (Kobe Univ.), Ken Okamoto, Yuichiro Okugawa (NTT), Takuji Miki, Makoto Nagata (Kobe Univ.) EMCJ2021-64 |
We developed a model of communication failures caused by external disturbances in Ethernet and collected experimental da... [more] | EMCJ2021-64 pp.18-22 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2021-12-01 14:20 |
Online | Online | A Dual-mode SAR ADC to Detect Power Analysis Attack Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38 |
Distributed IoT devices are exposed to unexpected interferences by physical accesses by malicious attackers. An on-chip ... [more] | VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38 pp.78-82 |
| ICD (2nd) |
2021-03-01 13:40 |
Online | Online | Response evaluation and in-situ detection of electromagnetic disturbance using on-chip monitor Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] | |
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