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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICTSSL, CAS | 2024-01-25 13:15 |
Kanagawa | (Primary: On-site, Secondary: Online) |
[Invited Talk]
Integrated circuits and digital calibration for high-speed high-resolution low-power A/D converters Takashi Oshima (Hitachi)  CAS2023-89 ICTSSL2023-42 |
Given rapid advance of AI, acquisition of high-quality digital data from analog sensor signals is crucial than ever. A h... [more] | CAS2023-89 ICTSSL2023-42 pp.34-39 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-16 16:20 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
A multi bit PWM-DAC with calibration for quantum computing Shunsuke Akahosh, Nobukazu Takai (KIT) VLD2023-56 ICD2023-64 DC2023-63 RECONF2023-59 |
We propose a structure and control method of a multi-bit PWMDAC for controlling qubits operating in a dilution refrigera... [more] | VLD2023-56 ICD2023-64 DC2023-63 RECONF2023-59 pp.136-139 |
| ICD, SDM, ITE-IST [detail] | 2022-08-08 16:10 |
Online | A cryogenic digital-to-analog converter for high-fidelity control of large-scale qubit arrays Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2022-42 ICD2022-10 |
This work presents a cryogenic digital-to-analog converter (DAC) for controlling a qubits in a large-scale quantum compu... [more] | SDM2022-42 ICD2022-10 pp.37-40 |
|
| CAS, SIP, VLD, MSS | 2022-06-16 13:00 |
Aomori | Hachinohe Institute of Technology (Primary: On-site, Secondary: Online) |
[Special Invited Talk]
Progress of RF Circuits and Mixed RF Analog-Digital Circuits for Mobile Communication Terminals Satoshi Tanaka (Murata Manufacturing) CAS2022-5 VLD2022-5 SIP2022-36 MSS2022-5 |
RF circuit technology and mixed RF analog-digital circuit technology for mobile communication terminals have made great ... [more] | CAS2022-5 VLD2022-5 SIP2022-36 MSS2022-5 pp.22-27 |
| RCS, SAT (Joint) |
2019-08-22 11:15 |
Aichi | Nagoya University | Study on frequency characteristic for the measurement of the systematic errors using gating process for on-board phased array antennas Takuya Okura, Amane Miura, Teruaki Orikasa (NICT), Shinji Senba (Axis) SAT2019-22 |
National Institute of Information and Communications Technology (NICT) has been currently researching and developing the... [more] | SAT2019-22 pp.31-35 |
| AP, SANE, SAT (Joint) |
2018-07-18 13:30 |
Hokkaido | Hokkaido Univ. | Study on the measurement of the systematic errors using DBF/Channelizer for on-board phased array antennas for satellite Takuya Okura, Amane Miura, Teruaki Orikasa (NICT), Shinji Senba (Axis) AP2018-48 SAT2018-12 |
National Institute of Information and Communications Technology (NICT) has been currently researching and developing the... [more] | AP2018-48 SAT2018-12 pp.37-41(AP), pp.7-11(SAT) |
| RCS, SAT (Joint) |
2017-08-18 13:50 |
Niigata | Niigata Univ. | Study on Measurement Technique of the Systematic Errors for Phased Array Satellite Antennas Takuya Okura, Amane Miura, Teruaki Orikasa (NICT), Shinji Senba (Axis) SAT2017-38 |
NICT has been currently researching and developing the next-generation communication satellite that has flexibly change ... [more] | SAT2017-38 pp.93-98 |
| CPSY, DC, IPSJ-ARC (Joint) [detail] |
2017-07-26 16:15 |
Akita | Akita Atorion-Building (Akita) | A Two-Temperature-Point Calibration Method for A Digital Temperature And Voltage Sensor Yousuke Miyake, Yasuo Sato, Seiji kajihara (KIT) DC2017-19 |
A measurement method of a digital sensor using ring oscillators to measure a temperature and a voltage of a VLSI was pro... [more] | DC2017-19 pp.19-24 |
| CAS, NLP | 2016-10-27 15:25 |
Tokyo | Self-Calibration and Trigger Circuit for 2-Step SAR TDC Takashi Ida, Yuki Ozawa, Richen Jiang, Haruo Kobayashi (Gunma Univ.), Ryoji Shiota (socionext) CAS2016-48 NLP2016-74 |
This paper presents a 2-step successive-approximation-register time-to-digital converter (SAR TDC) architecture with its... [more] | CAS2016-48 NLP2016-74 pp.55-60 |
|
| ICD, ITE-IST | 2013-07-05 14:25 |
Hokkaido | San Refre Hakodate | A 1.0-V 12-bit Digitally Calibrated SAR ADC Using Hybrid DAC Technique Masanori Furuta, Hirotomo Ishii, Tomohiko Sugimoto, Toru Okawa, Masazumi Shiochi, Tetsuro Itakura (Toshiba) ICD2013-39 |
A 1.0-V, 12-bit, 80-MS/s two time-interleaved successive approximation register (SAR) ADC with 1.2-V differential full... [more] |
ICD2013-39 pp.93-96 |
| CAS | 2013-01-29 10:15 |
Oita | Beppu International Convention Center | All-Digital Calibration of Time-Interleaved Analog-to-Digital Converter with Fast Convergence Takeshi Nozaki (Fujitsu Microelectronics Solutions LTD.), Masato Yoshioka (Fujitsu Lab), Souyou Setsu (Fujitsu Microelectronics Solutions LTD.), Sadayoshi Umeda (Fujitsu Semiconductor LTD.), Sanroku Tsukamoto (Fujitsu Lab) CAS2012-81 |
Time-interleaved (TI) analog-to-digital converters (ADCs) use several ADCs in parallel, and are effective way to substan... [more] | CAS2012-81 pp.89-94 |
| CAS | 2012-01-20 12:25 |
Fukuoka | Kyushu Univ. | [Invited Talk]
Technical Trend of Digitally Assisted A/D Converters Tatsuji Matsuura (Renesas) CAS2011-104 |
Abstract In spite of the numerous merits of advanced fine CMOS process/devices, when designing high performance ADCs, t... [more] | CAS2011-104 pp.103-108 |
| ICD, SDM | 2010-08-26 11:25 |
Hokkaido | Sapporo Center for Gender Equality | 10bit-300MHz Double-Sampling Pipelined ADC with Digital Calibration for Memory Effects Takuji Miki, Takashi Morie, Toshiaki Ozeki, Shiro Dosho (Panasonic) SDM2010-129 ICD2010-44 |
This paper describes an on-chip digital calibration technique to eliminate a memory effect error in Double-sampling Pipe... [more] | SDM2010-129 ICD2010-44 pp.29-34 |
| ICD, ITE-IST | 2010-07-22 14:00 |
Osaka | Josho Gakuen Osaka Center | [Invited Talk]
Digitally-Assisted Analog Test Technology
-- Analog Circuit Test Technology in Nano-CMOS Era -- Haruo Kobayashi, Takahiro J. Yamaguchi (Gunma Univ.) ICD2010-27 |
This paper reviews current production testing issues for analog and mixed-signal SoC, and discusses the following: (i)... [more] |
ICD2010-27 pp.37-42 |
| ICD, ITE-IST | 2010-07-23 11:05 |
Osaka | Josho Gakuen Osaka Center | On-chip background calibration of time-interleaved ADC Takashi Oshima, Tomomi Takahashi (Hitachi) ICD2010-34 |
An extremely-high-speed high-resolution time-interleaved ADC is a key enabler of the next-generation applications. The g... [more] | ICD2010-34 pp.79-84 |
| CAS | 2010-01-28 16:35 |
Kyoto | Kyoudai-Kaikan Bldg. | [Fellow Memorial Lecture]
Study on video-frequency AD converter Masao Hotta (Tokyo City Univ.) CAS2009-71 |
Analog-to-Digital converters (ADCs) for video applications have made exciting progress in miniaturization and power redu... [more] | CAS2009-71 pp.43-48 |
| ICD | 2009-12-15 15:10 |
Shizuoka | Shizuoka University (Hamamatsu) | Non-binary SAR ADC with Digital Compensation of Comparator Offset Effect Tomohiko Ogawa (Gunma Univ), Tatsuji Mtsuura (Renesas), Haruo Kobayashi, Nobukazu Takai (Gunma Univ), Masao Hotta, Hao San (Tokyo City Univ) ICD2009-101 |
This paper describes techniques for creating a low-power SAR ADC with an error-correcting non-binary successive approxim... [more] | ICD2009-101 pp.139-144 |
| ICD, ITE-IST | 2009-10-02 11:00 |
Tokyo | CIC Tokyo (Tamachi) | [Invited Talk]
AD Conversion Principles and CMOS Circuit Techniques Atsushi Iwata (A-R-Tec) ICD2009-50 |
Many kinds of AD conversion schemes of Successive approximation, Flash, Pipelined, Delta Sigma, were proposed and integr... [more] | ICD2009-50 pp.93-98 |
| ICD, ITE-IST | 2009-10-02 11:50 |
Tokyo | CIC Tokyo (Tamachi) | An 8-bit 600-MSps Flash ADC Using Interpolating and Background Self-Calibrating Techniques Daehwa Paik, Yusuke Asada, Masaya Miyahara, Akira Matsuzawa (Tokyo Inst. of Tech.) ICD2009-51 |
This paper describes a flash ADC using interpolation (IP) and cyclic background self-calibrating techniques. The propose... [more] | ICD2009-51 pp.99-104 |
| SIS | 2009-06-11 13:30 |
Okinawa | Color Calibration Method by Histogram Matching with Color Space Transformation Yasuaki Mogi, Akira Taguchi (Tokyo City Univ) SIS2009-5 |
A major problem of multi-camera systems is the color calibration. Even identical cameras, which have same optical proper... [more] | SIS2009-5 pp.25-29 |
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