IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 110, Number 423

Electron Device

Workshop Date : 2011-02-23 - 2011-02-24 / Issue Date : 2011-02-16

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Table of contents

ED2010-192
[Invited Talk] Toward Silicide-based solar cells and spintronics
Takashi Suemasu, Takanobu Saito, Atsushi Okada, Katsuaki Tou, M. Ajmal Khan, Du Weijie, Kenji Makabe, Keita Ito, Kazunori Harada (Univ. Tsukuba), Noritaka Usami (Tohoku Univ.)
pp. 1 - 5

ED2010-193
A novel refrigerator using a single-electron-pump operation fabricated from semiconductor materials
Hiroya Ikeda, Faiz Salleh (Shizuoka Univ.)
pp. 7 - 12

ED2010-194
Theoretical Estimation of Seebeck Coefficient in P-Doped Si Ultrathin Si Films
Faiz Salleh, Hiroya Ikeda (Shizuoka Univ.)
pp. 13 - 17

ED2010-195
Room-Temperature Operation of Planar-Type Ferromagnetic Tunnel Junctions Fabricated by Stepwise Feedback-Controlled Electromigration
Ryutarou Yasutake, Takato Watanabe, Shunsuke Ueno, Jun Kitagawa, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.)
pp. 19 - 23

ED2010-196
Development of Miniaturized Electron Optical Column in micro scale and its Application to Mask-less Lithography
Yoichiro Neo, Yasuo Takagi, Takahiro Fujino, Akifumi Koike (Shizuoka Univ. RIE), Masayoshi Nagao, Tomoya Yoshida, Takashi Nishi (ASIT), Hidekazu Murata, Kentaro Sakai (Meijo Univ.), Toru Aoki, Hidenori Mimura (Shizuoka Univ. RIE)
pp. 25 - 29

ED2010-197
Characterization of carbon nanotube thin-film transistors by scanning probe microscopy
Yuki Okigawa, Yutaka Ohno (Nagoya Univ.), Shigeru Kishimoto (Nagoya Univ./VBL, Nagoya Univ.), Takashi Mizutani (Nagoya Univ.)
pp. 31 - 36

ED2010-198
A Study on Precise FinFET High Frequency Characteristic Evaluation Method
Hideo Sakai (Keio Univ.), Shinichi Ouchi, Takashi Matsukawa, Kazuhiko Endo, Yongxun Liu, Junichi Tsukada, Yuki Ishikawa, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Kunihiro Sakamoto, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.)
pp. 37 - 42

ED2010-199
Capacitance measurements of sub-micron Al junctions using SQUID resonance
Kento Kikuchi, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki (Univ. of Electro-Comm.)
pp. 43 - 48

ED2010-200
Fabrication of GaAs-based Nanowire CCD Controlled by Schottky Wrap Gates and Characterization of Its Charge Transfer Operation
Yuki Nakano, Kensuke Miura, Yuta Shiratori (Hokkaido Univ.), Seiya Kasai (Hokkaido Univ./JST)
pp. 49 - 52

ED2010-201
A Traveling Wave Amplifier Based on Resonant Tunneling Diode Pairs Employing Composite Right/Left Handed Transmission Line Configuration
Koichi Maezawa, Koji Kasahara, Jie Pan, Masayuki Mori (Univ. Toyama)
pp. 53 - 56

ED2010-202
Single-Electron Transfer between Two Donors in Thin Nanoscale Silicon Transistors
Daniel Moraru, Earfan Hamid, Juli Cha Tarido, Sakito Miki, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.)
pp. 57 - 62

ED2010-203
Electrical Characteristics of Si Single-Electron Transistor with Single-Carrier Trap Formed by Photo-Irradiation
Michito Shinohara, Yuki Kato, Kei Mikami, Masashi Arita (Hokkaido Univ), Akira Fujiwara (NTT), Yasuo Takahashi (Hokkaido Univ)
pp. 63 - 66

ED2010-204
Current Intermittency in SOI-FETs under Light Illumination
Arief Udhiarto, Daniel Moraru, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.)
pp. 67 - 72

ED2010-205
Stochastic resonance using single electrons
Katsuhiko Nishiguchi, Akira Fujiwara (NTT)
pp. 73 - 77

ED2010-206
Characterization of Single-Electron Stochastic Resonance in A Quantum Dot and Its Parallel Network
Seiya Kasai (Hokkaido Univ./JST), Yuta Shiratori, Kensuke Miura, Yuki Nakano (Hokkaido Univ.)
pp. 79 - 82

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan