IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Silicon Device and Materials

Workshop Date : 2018-02-28 / Issue Date : 2018-02-21

SDM2017-104
Electrical Characteristics of Single-Electron Transistor Made of Fe-MgF2 Single-Layer Granular Thin Films
Yuki Asai, Shusaku Honjo, Takayuki Gyakushi, Atsushi Tsurumaki-Fukuchi, Masashi Arita, Yasuo Takahashi (Hokkaido Univ.)
pp. 1 - 6

SDM2017-105
Numerical Simulation on Single-Electron Effects in Random Arrays of Small Tunnel Junctions
Yoshinao Mizugaki, Masataka Moriya, Hiroshi Shimada, Kazuhiko Matsumoto, Makoto Moribayashi, Tomoki Yagai (UEC Tokyo), Yasuo Kimura (Tokyo Univ. Tech.), Ayumi Hirano-Iwata (Tohoku Univ.), Fumihiko Hirose (Yamagata Univ.)
pp. 7 - 10

SDM2017-106
Single-electron effects observed in arrays of gold nanoparticles selectively-placed in resist grooves.
Kazuhiko Matsumoto, Makoto Moribayashi, Tomoki Yagai, Masataka Moriya, Hiroshi Shimada (UEC Tokyo), Yasuo Kimura (Tokyo Univ. Technology), Ayumi Hirano-Iwata (Tohoku Univ.), Fumihiko Hirose (Yamagata Univ.), Yoshinao Mizugaki (UEC Tokyo)
pp. 11 - 14

SDM2017-107
Design and fabrication of carbon-nanotube analog circuits on flexible substrate
Tomoki Matsuura, Taiga Kashima, Jun Hirotani, Shigeru Kishimoto, Yutaka Ohno (Nagoya Univ.)
pp. 15 - 18

SDM2017-108
Effect of electrolyte on electrical characteristics of carbon nanotube biosensor
Kana Hasegawa, Takuya Ushiyama, Shigeru Kishimoto, Yutaka Ohno (Nagoya Univ.)
pp. 19 - 22

SDM2017-109
[Invited Talk] Thermoelectric Properties of Semiconductor Thin Films
Hiromichi Ohta (Hokkaido Univ.)
pp. 23 - 26

SDM2017-110
Construction of Seebeck coefficient evaluation technique by Kelvin-probe force microscopy
Yuhei Suzuki, Akito Oka, Taketo Kawai, Hirokazu Tatsuoka, Hiroshi Inokawa, Masaru Shimomura, Kenji Murakami (Shizuoka Univ.), Faiz Salleh (Univ. of Malaya), Hiroya Ikeda (Shizuoka Univ.)
pp. 27 - 30

SDM2017-111
Fluidic generator with carbon nanotube thin film: Understanding the mechanism and enhancement of output power
Ryohei Nishi, Shigeru Kishimoto (Nagoya Univ.), Hiromichi Kataura (AIST), Yutaka Ohno (Nagoya Univ.)
pp. 31 - 34

SDM2017-112
Construction of simulation for analyzing thermal conduction in nanostructures
Naomi Yamashita, Yuya Ota, Ryo Nanao, Hiroshi Inokawa, Masaru Shimomura, Kenji Murakami, Hiroya Ikeda (Shizuoka Univ.)
pp. 35 - 38

SDM2017-113
Optimization of Experimental Parameters for Fabrication of Atomic Junctions Using Ground-State Searches of Ising Spin Computing
Shotaro Sakai, Yuma Iwata, Masayuki Shiomura, Yusuke Kihara, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.)
pp. 39 - 43

SDM2017-114
Artificial Intelligence Approach for Control of Quantized Conductance of Au Atomic Junctions Using Feedback-Controlled Electromigration
Yuma Iwata, Shotaro Sakai, Noriaki Numakura, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.)
pp. 45 - 50

SDM2017-115
Low-temperature charge pumping on silicon-on-insulator devices
Tokinobu Watanabe (Univ. Toyama), Masahiro Hori, Yukinori Ono (Shizuoka Univ.)
pp. 51 - 56

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan