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Chair |
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Takahiro Shinada (Tohoku Univ.) |
Vice Chair |
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Hiroshige Hirano (TowerJazz Panasonic) |
Secretary |
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Hiroya Ikeda (Shizuoka Univ.), Tetsu Morooka (TOSHIBA MEMORY) |
Assistant |
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Takahiro Mori (AIST), Nobuaki Kobayashi (Nihon Univ.) |
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Chair |
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Hideto Hidaka (Renesas) |
Vice Chair |
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Makoto Nagata (Kobe Univ.) |
Secretary |
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Takashi Hashimoto (Panasonic), Masanori Natsui (Tohoku Univ.) |
Assistant |
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Hiroyuki Ito (Tokyo Inst. of Tech.), Masatoshi Tsuge (Socionext), Tetsuya Hirose (Kobe Univ.) |
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Chair |
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Takayuki Hamamoto (Tokyo University of Science) |
Vice Chair |
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Hiroshi Ohtake (NHK), Junichi Akita (Kanazawa Univ.) |
Secretary |
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Masayuki Ikebe (Hokkaido Univ.) |
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Conference Date |
Tue, Aug 7, 2018 09:00 - 17:10
Wed, Aug 8, 2018 09:00 - 17:40
Thu, Aug 9, 2018 09:30 - 15:20 |
Topics |
Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low Voltage/Low Power Techniques, Novel Devices/Circuits, and the Applications |
Conference Place |
Graduate School of Information and Technology, Kokkaido Univ. M Bldg. M151 |
Transportation Guide |
http://www.ist.hokudai.ac.jp/eng/access/ |
Sponsors |
This conference is co-sponsored by The Japan Society of Applied Physics, IEEE SSCS Japan Chapter and IEEE SSCS Kansai Chapter.
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Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Registration Fee |
This workshop will be held as the IEICE workshop in fully electronic publishing. Registration fee will be necessary except the speakers and participants other than the participants to workshop(s) in non-electronic publishing. See the registration fee page. We request the registration fee or presentation fee to participants who will attend the workshop(s) on SDM, ICD. |
Tue, Aug 7 AM Chair: Toshiaki Sato (On Semicoductor) 09:00 - 10:35 |
(1) ITE-IST |
09:00-09:25 |
A model and circuit for an early auditory system based on vestibulo-ocular reflex |
Tkahiro Ikegami, Masayuki Ikebe, Shinya Takamaeda, Masato Motomura, Tetsuya Asai (Hokkaido Univ.) |
(2) ITE-IST |
09:25-09:50 |
Wide-band CMOS terahertz imaging pixel |
Yuri Kanazawa, Shota HIramatsu, Eiichi Sano, Sayuri Yokoyama, Masayuki Ikebe (Hokkaido Univ) |
(3) ITE-IST |
09:50-10:35 |
[Invited Talk]
Nano probe technology for sensing and its applications |
Kazuhisa Sueoka (Hokkaido Univ) |
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10:35-10:45 |
Break ( 10 min. ) |
Tue, Aug 7 AM Chair: Kazuki Fukuoka (Renesas Electronics) 10:45 - 11:55 |
(4) ICD |
10:45-11:30 |
[Invited Talk]
Energy Harvesting Beat Sensors and Potential Applications
-- Realization of Low Power, Low Cost, and High Accuracy IoT Sensors -- SDM2018-27 ICD2018-14 |
Koichiro Ishibashi (UEC) |
(5) ICD |
11:30-11:55 |
Comparison of Sensitivity to Soft Errors of NMOS and PMOS Transistors by Using Three Types of Stacking Latches in an FDSOI process SDM2018-28 ICD2018-15 |
Kodai Yamada, Jun Furuta, Kazutoshi Kobayashi (KIT) |
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11:55-12:55 |
Lunch Break ( 60 min. ) |
Tue, Aug 7 PM Chair: Toshiro Hiramoto (The Univ. of Tokyo) 12:55 - 14:50 |
(6) SDM |
12:55-13:40 |
[Invited Talk]
Development of SiGe-MEMS-on-CMOS technology for ultra-low-power inertial sensors SDM2018-29 ICD2018-16 |
Hideyuki Tomizawa, Yoshihiko Kurui (Toshiba), Ippei Akita (AIST), Akira Fujimoto, Tomohiro Saito, Akihiro Kojima, Hideki Shibata (Toshiba) |
(7) SDM |
13:40-14:25 |
[Invited Talk]
Fabrication and Characterization of SOI-CMOS Using Minimal-Fab and Mega-Fab Hybrid Process SDM2018-30 ICD2018-17 |
Yongxun Liu, Hiroyuki Tanaka (AIST), Kazuhiro Koga, Kazushige Sato (MINIMAL), Sommawan Khumpuang, Masayoshi Nagao, Takashi Matsukawa, Shiro Hara (AIST) |
(8) SDM |
14:25-14:50 |
Experiment of Ultralow Voltage Rectification by Super Steep SS "PN-Body Tied SOI-FET" SDM2018-31 ICD2018-18 |
Shun Momose, Jiro Ida, Takuya Yamada, Takayuki Mori, Kenji Itoh (KIT), Koichiro Ishibashi (UEC), Yasuo Arai (KEK) |
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14:50-15:00 |
Break ( 10 min. ) |
Tue, Aug 7 PM Chair: Koichi Takanashi (ROHM Semiconductor) 15:00 - 15:50 |
(9) ICD |
15:00-15:25 |
A 0.6V 9bit PWM Differential Arithmetic Circuit SDM2018-32 ICD2018-19 |
Fumiya Kojima, Tomochika Harada (Yamagata Univ) |
(10) ICD |
15:25-15:50 |
A 65nm SOTB Based-On Code-Modulated Synchronized-OOK Transmitter for Normally-Off Wireless Sensor Networks SDM2018-33 ICD2018-20 |
Van-Trung Nguyen, Ryo Ishikawa, Koichiro Ishibashi (The UEC) |
|
15:50-16:00 |
Break ( 10 min. ) |
Tue, Aug 7 PM Chair: Yasuhiro Ogasahara (AIST) 16:00 - 17:10 |
(11) ICD |
16:00-16:45 |
[Invited Talk]
A Battery Management System for Wireless Sensor Devices SDM2018-34 ICD2018-21 |
Ken-ichi Kawasaki, Jun-ichi Nagata, Hiroyuki Nakamoto (Fujitsu Labs.) |
(12) ICD |
16:45-17:10 |
Power Consumption Estimation by Die Temperature for Processors Implemented on FPGA SDM2018-35 ICD2018-22 |
Hiroaki Kaneko, Akinori Kanasugi (Tokyo Denki Univ.) |
Wed, Aug 8 AM Chair: Takahiro Mori (AIST) 09:00 - 10:10 |
(13) SDM |
09:00-09:45 |
[Invited Talk]
Research Progress on Resistance Change Device Based on Oxide Materials
-- Application for Non-volatile Memory and Neuromorphic Device -- SDM2018-36 ICD2018-23 |
Hisashi Shima, Makoto Takahashi, Yasuhisa Naitoh, Hiroyuki Akinaga (AIST) |
(14) SDM |
09:45-10:10 |
Understanding Temperature Effect on Subthreshold Slope Variability in Bulk and SOTB MOSFETs SDM2018-37 ICD2018-24 |
Shuang Gao, Tomoko Mizutani, Kiyoshi Takeuchi, Masaharu Kobayashi, Toshiro Hiramoto (Univ. Tokyo) |
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10:10-10:20 |
Break ( 10 min. ) |
Wed, Aug 8 AM Chair: Takahiro Mori (AIST) 10:20 - 11:50 |
(15) SDM |
10:20-11:05 |
[Invited Talk]
Neuromorphic Operation using an Atom/Ion Movement-Type Device SDM2018-38 ICD2018-25 |
Takeo Ohno (Oita Univ.) |
(16) ITE-IST |
11:05-11:50 |
[Invited Talk]
Extremely low power device using crystalline oxide semiconductor |
Kiyoshi Kato (SEL) |
|
11:50-12:50 |
Lunch Break ( 60 min. ) |
Wed, Aug 8 PM Chair: Masaaki Iijima (Renesas Electronics) 12:50 - 14:25 |
(17) ICD |
12:50-13:15 |
Measurements and Analysis of Power Supply Noise in Digital IC Chip SDM2018-39 ICD2018-26 |
Kosuke Jike, Akihiro Tsukioka, Ryohei Sawada, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ) |
(18) ICD |
13:15-13:40 |
[Invited Lecture]
A Highly Symmetrical 10T 2-Read/Write Dual-port SRAM Bitcell Design In 28nm High-k/Metal-gate Planar Bulk CMOS Technology SDM2018-40 ICD2018-27 |
Yuichiro Ishii, Miki Tanaka, Makoto Yabuuchi, Yohei Sawada, Shinji Tanaka, Koji Nii (Renesas), Tien Yu Lu, Chun Hsien Huang, Shou Sian Chen, Yu Tse Kuo, Ching Cheng Lung, Osbert Cheng (UMC) |
(19) ICD |
13:40-14:25 |
[Invited Talk]
CMOS Annealing Machine for Combinatorial Optimization Problems SDM2018-41 ICD2018-28 |
Masanao Yamaoka (Hitachi) |
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14:25-14:35 |
Break ( 10 min. ) |
Wed, Aug 8 PM Chair: Tetsu Morooka (Toshiba Memory) 14:35 - 17:40 |
(20) SDM |
14:35-15:00 |
Proposal of reconfigurable system LSI with 3D flashtechnology and its application to combinationlogic, FF circuit and FPGA SDM2018-42 ICD2018-29 |
Shigeyoshi Watanabe (Shonan Insti. of Tech.) |
(21) SDM |
15:00-15:25 |
Study of new stacked type logic circuit with fabrication technology of 3D NAND flash memory
-- Comparison with conventional LUT scheme, and planar typescheme -- SDM2018-43 ICD2018-30 |
Fumiya Suzuki, Sigeyoshi Watanabe (Shonan Inst. of Tech.) |
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15:25-15:40 |
Break ( 15 min. ) |
(22) |
15:40-17:40 |
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Thu, Aug 9 AM Chair: Shinya Kajiyama (Hitachi, Ltd.) 09:30 - 11:45 |
(23) ICD |
09:30-10:15 |
[Invited Talk]
Flexible sensing system and venture startup SDM2018-44 ICD2018-31 |
Shusuke Yoshimoto (PGV) |
(24) ICD |
10:15-11:00 |
[Invited Talk]
Non-Contact Unobtrusive Sensing of Multiple Vital Signals Using Capacitive Coupling
-- Introduction of Cutting-Edge Researches -- SDM2018-45 ICD2018-32 |
Akinori Ueno (Tokyo Denki Univ.) |
(25) ICD |
11:00-11:45 |
[Invited Talk]
Wearable Monitoring Systems for Heart Rate Variability Analysis SDM2018-46 ICD2018-33 |
Shintaro Izumi (Osaka Univ.) |
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11:45-12:45 |
Lunch Break ( 60 min. ) |
Thu, Aug 9 PM Chair: Takashi Hashimoto (Panasonic Corp.) 12:45 - 13:35 |
(26) ICD |
12:45-13:10 |
Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET SDM2018-47 ICD2018-34 |
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) |
(27) ICD |
13:10-13:35 |
12-nm Fin-FET 3.0G-search/s 80-bit x 128-entry Dual-port Ternary CAM SDM2018-48 ICD2018-35 |
Makoto Yabuuchi, Masao Morimoto, Koji Nii, Shinji Tanaka (Renesas) |
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13:35-13:45 |
Break ( 10 min. ) |
Thu, Aug 9 PM Chair: Tetsu Morooka (Toshiba Memory) 13:45 - 15:20 |
(28) SDM |
13:45-14:10 |
Effect of multiple stress application in post-fabrication cell stability self-improvement in SRAM cell array SDM2018-49 ICD2018-36 |
Tomoko Mizutani, Kiyoshi Takeuchi, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo) |
(29) SDM |
14:10-14:35 |
Device and Process Design for HfO2-Based Ferroelectric Tunnel Junction Memory with Large Tunneling Electroresistance Effect and Multi-level Cell SDM2018-50 ICD2018-37 |
Masaharu Kobayashi, Yusaku Tagawa, Mo Fei, Toshiro Hiramoto (Univ. Tokyo) |
(30) SDM |
14:35-15:20 |
[Invited Talk]
Cu Atom Switch Technology toward 28nm Nonvolatile Programmable Logic SDM2018-51 ICD2018-38 |
Ryusuke Nebashi, Naoki Banno, Makoto Miyamura, Ayuka Morioka, Bai Xu, Koichiro Okamoto, Noriyuki Iguchi, Hideaki Numata, Hiromitsu Hada, Tadahiko Sugibayashi, Toshitsugu Sakamoto, Munehiro Tada (NEC) |
Announcement for Speakers |
General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Invited Talk | Each speech will have 40 minutes for presentation and 5 minutes for discussion. |
Invited Lecture | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
SDM |
Technical Committee on Silicon Device and Materials (SDM) [Latest Schedule]
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Contact Address |
Takahiro Mori (National Institute of Advanced Industrial Science and Technology)
E-: -aist
Tetsu Morooka (Toshiba Memory Corp.)
E-: ba |
ICD |
Technical Committee on Integrated Circuits and Devices (ICD) [Latest Schedule]
|
Contact Address |
Masatoshi Tsuge (Socionext Inc.)
E-: gecioxt
Takashi Hashimoto (Panasonic Corp.)
E-: 1967pac |
ITE-IST |
Technical Group on Information Sensing Technologies (ITE-IST) [Latest Schedule]
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Contact Address |
Masayuki Ikebe (Hokkaido Univ.)
E-: ibeisti |
Last modified: 2018-07-20 13:03:11
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