|
|
| Chair |
|
Takashi Aikyo (STARC) |
| Vice Chair |
|
Tomohiro Yoneda (NII) |
| Secretary |
|
Masato Kitagami (Chiba Univ.), Michinobu Nakao (Renesas) |
|
| Conference Date |
Mon, Feb 15, 2010 09:00 - 16:30 |
| Topics |
|
| Conference Place |
|
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Mon, Feb 15 AM
Chair: Masayoshi Yoshimura (Kyushu Univ.)
09:00 - 09:50 |
| (1) |
09:00-09:25 |
A Statistical Method of Small Iddq Variance Outlier Detection  DC2009-65 |
Yoshiyuki Nakamura, Masashi Tanaka (NEC Electronics) |
| (2) |
09:25-09:50 |
Test Pattern Re-Ordering for Thermal-Uniformity during Test DC2009-66 |
Makoto Nakao, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (Nara Inst. of Sci and Tech.) |
| |
09:50-10:00 |
Break ( 10 min. ) |
Mon, Feb 15 AM
Chair: Kohei Miyase (Kyushu Institute of Technology)
10:00 - 10:50 |
| (3) |
10:00-10:25 |
Study on a Test Generation Method for Transition Faults Using Multi Cycle Capture Test DC2009-67 |
Hiroshi Ogawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) |
| (4) |
10:25-10:50 |
Modeling resistive open faults and generating their tests DC2009-68 |
Hiroshi Takahashi, Yoshinobu Higami, Yuta Shudo, Yuji Takamune, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) |
| |
10:50-11:00 |
Break ( 10 min. ) |
Mon, Feb 15 AM
Chair: Michiko Inoue (Nara Institute of Science and Technology)
11:00 - 11:50 |
| (5) |
11:00-11:25 |
A Method of Reproducing Iuput/Ouput Error Trace on High-level Design for Hardware Debug Support DC2009-69 |
Yeonbok Lee, Tasuku Nishihara, Takeshi Matsumoto (Univ. of Tokyo.), Masahiro Fujita (Univ. of Tokyo./JST) |
| (6) |
11:25-11:50 |
A binding method for testability based on resources sequential depth reduction DC2009-70 |
Takaaki Cho, Toshinori Hosokawa (Nihon Univ.) |
| |
11:50-13:20 |
Lunch Break ( 90 min. ) |
Mon, Feb 15 PM
Chair: Tomo Inoue (Horoshima City Univ.)
13:20 - 15:00 |
| (7) |
13:20-13:45 |
Reduction of execution times and areas for delay measurement by subtraction DC2009-71 |
Toru Tanabe, Hirohisa Minato, Kentaroh Katoh, Kazuteru Namba, Hideo Ito (Chiba Univ.) |
| (8) |
13:45-14:10 |
A Test Compaction Oriented Control Point Insertion Method for Transition Faults DC2009-72 |
Yoshitaka Yumoto, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.) |
| (9) |
14:10-14:35 |
On Calculation of Delay Test Quality for Test Cubes and X-filling DC2009-73 |
Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech./JTS) |
| (10) |
14:35-15:00 |
Seed Selection for High Quality Delay Fault Test in BIST DC2009-74 |
Akira Taketani, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (Nara Inst. of Sci and Tech.) |
| |
15:00-15:15 |
Break ( 15 min. ) |
Mon, Feb 15 PM
Chair: Toshinori Hosokawa (Nihon Univ.)
15:15 - 16:30 |
| (11) |
15:15-15:40 |
A Study on Acceptable Faults in Digital Filters DC2009-75 |
Takumi Miyaguchi, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) |
| (12) |
15:40-16:05 |
High Speed X-Fault Diagnosis with Partial X-Resolution DC2009-76 |
Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.) |
| (13) |
16:05-16:30 |
Consideration of Open Faults Model Based on Digital Measurement of TEG Chip DC2009-77 |
Toshiyuki Tsutsumi (Meiji Univ.), Yasuyuki Kariya, Koji Yamazaki (Meiji Univ), Masaki Hashizume, Hiroyuki Yotsuyanagi (Tokushima Univ), Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu (Ehime Univ) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
| Contact Address |
Masato Kitakami
Graduate School of Advanced Integration Science,
Chiba University
1-33 Yayoi-cho Inage-ku, Chiba 263-8522 JAPAN
TEL/FAX +43.290.3039
E- :    f ulty  ba-u |
Last modified: 2010-01-26 16:21:27
|