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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 46 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD, CPM, OME 2012-06-22
17:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism(22) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-15 CPM2012-32 OME2012-39
pp.41-46
NLP 2012-05-29
10:30		 Akita Akita City Exchange Plaza Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (2) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) NLP2012-35		 Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more] NLP2012-35
pp.49-54
EMD 2012-05-25
14:20		 Miyagi Tohoku Bunka Gakuen Univ. Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its Model (21) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-3		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2012-3
pp.13-18
EMD 2012-01-20
13:35		 Kanagawa   Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-112
pp.1-6
EMD 2011-12-16
13:55		 Tokyo NIT Kanda Camps Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-108		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-108
pp.11-16
EMD 2011-10-21
12:35		 Tokyo Tachikawa-Shiminn-kaikan Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-57
pp.1-6
EMD, EMCJ 2011-07-15
12:20		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance (16) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2011-61 EMD2011-20		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMCJ2011-61 EMD2011-20
pp.1-6
EMD, EMCJ 2011-07-15
12:45		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation Phenomenon of Electrical Contacts by a Tapping Device -- A tapping device for trial (3) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Koki Takeda, Daiki Ishizuka, Kunio Yanagi, Hiroaki Kubota (TMC), Nobuhiro Kuga (YNU), Koichiro Sawa (NIT) EMCJ2011-62 EMD2011-21		 Authors have developed and made a handy “tapping device (TPD)” experimentally without a special stage for the inspection... [more] EMCJ2011-62 EMD2011-21
pp.7-12
EMD 2011-05-20
15:50		 Miyagi Tohoku Univ. Cyber-Science Center Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact resistance --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-7		 Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2011-7
pp.33-38
EMD 2011-01-28
15:40		 Tokyo Japan Aviation Electronics Industry,Limited Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (1) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-141		 Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering osci... [more] EMD2010-141
pp.35-40
EMD 2011-01-28
16:05		 Tokyo Japan Aviation Electronics Industry,Limited Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) --
Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-142		 Authors have developed and made a handy "tapping device (TPD)" experimentally without a special stage for the inspection... [more] EMD2010-142
pp.41-46
EMD 2010-12-17
14:30		 Tokyo Tamagawa University Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (14) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) EMD2010-132		 Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2010-132
pp.17-22
EMD 2010-11-12
13:15		 Overseas Xi'an Jiaotong University A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Modeling (10) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111		 A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the ver... [more] EMD2010-111
pp.185-188
EMD 2010-10-15
14:35		 Tokyo NTT Musashino Research and Development Center Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-65		 Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-65
pp.13-18
EMD, OPE, LQE, CPM 2010-08-26
09:20		 Hokkaido Chitose Arcadia Plaza Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (9) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24		 The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24
pp.1-6
EMCJ, EMD 2010-07-16
12:35		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMCJ2010-32 EMD2010-17		 Authors studied the influence on contact resistance by micro-vibration to electrical contacts using hammering oscillatio... [more] EMCJ2010-32 EMD2010-17
pp.1-6
EMD, CPM, OME 2010-06-25
16:20		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance 12 --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (former Keio Univ/NIT) EMD2010-14 CPM2010-28 OME2010-33		 Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-14 CPM2010-28 OME2010-33
pp.31-36
EMD, CPM, OME 2010-06-25
16:45		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Modeling of the sliding mechanism (1) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (former Keio Univ/NIT) EMD2010-15 CPM2010-29 OME2010-34		 Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-15 CPM2010-29 OME2010-34
pp.37-42
EMD 2010-05-21
14:50		 Akita Akita Univ. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (8) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-4		 The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] EMD2010-4
pp.19-24
EMD 2009-12-18
13:05		 Chiba   Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (IX) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (Keio Univ.) EMD2009-106		 Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2009-106
pp.1-6
 Results 21 - 40 of 46 [Previous]  /  [Next]  
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