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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM | 2022-10-19 10:20 |
Online | Online | [Invited Talk]
Needs for X-ray Optical Elements
-- Expectations for New Process Technology -- Wataru Yashiro (Tohoku Univ.)  SDM2022-54 |
Hard X-rays and cold thermal neutrons with wavelengths of around 1Å have been widely used for imaging inside objects bec... [more] | SDM2022-54 pp.1-4 |
| IBISML | 2017-11-10 13:00 |
Tokyo | Univ. of Tokyo | [Poster Presentation]
Bin width optimization of multidimensional histogram on count data Kensuke Muto, Hirotaka Sakamoto, Keisuke Matsuura, Takahisa Arima, Masato Okada (Tokyo Univ.) IBISML2017-69 |
A large amount of 4-dimensional count data are obtained by inelastic neutron scattering experiments conducted by chopper... [more] | IBISML2017-69 pp.255-260 |
| SCE | 2016-08-09 13:40 |
Saitama | Saitama Univ. (Omiya sonic city) | Single-flux-quantum readout and digital signal processing of serially-connected superconducting stripline detection array Ryosuke Naito, Kyohei Kamiya, Misaki Kozaka, Masamitsu Tanaka, Akira Fujimaki (Nagoya Univ.) SCE2016-21 |
We have been developing one-million-pixel imaging sensors, integrating superconducting strip line detectors (SSLDs) and ... [more] | SCE2016-21 pp.45-50 |
| ICD, SDM, ITE-IST [detail] | 2016-08-02 09:00 |
Osaka | Central Electric Club | [Invited Talk]
Soft Error Immunity of Ultra-Low Voltage SRAM Masanori Hashimoto (Osaka Univ.) SDM2016-54 ICD2016-22 |
This paper discusses soft error immunity of near-threshold/subthreshold SRAM. In terrestrial environment, high-energy ne... [more] | SDM2016-54 ICD2016-22 pp.53-58 |
| R | 2015-11-19 14:25 |
Osaka | A Measurement Method for the Extent of Simultaneous Soft Errors Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba) R2015-57 |
Regarding the LSI soft error caused by the neutron beam, a single particle of neutron may cause multiple chained soft er... [more] | R2015-57 pp.5-10 |
|
| RCC, MICT | 2015-05-28 15:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Rapid Recovery Technique from Soft Error of FPGAs in Information and Communication Apparatus Kenichi Shimbo, Tadanobu Toba, Takumi Uezono, Hidefumi Ibe (Hitachi) RCC2015-9 MICT2015-9 |
As the amount of data traffic through the communication infrastructure is increasing, a development of high-speed inform... [more] | RCC2015-9 MICT2015-9 pp.37-42 |
| SCE | 2014-10-15 15:10 |
Miyagi | Tohoku University, RIEC | Optical Response of Serially-Connected 500 Superconducting Strip-Line Detectors Misaki Kozaka, Yuma Kita, Kyohei Kamiya (Nagoya Univ.), Ali Bozbey (TOBB ETU), Akira Fujimaki (Nagoya Univ.) SCE2014-38 |
Superconducting strip-line detectors (SSLDs) have a special feature of high spatial resolution. We have proposed a curre... [more] | SCE2014-38 pp.23-26 |
| ICM | 2014-07-11 09:55 |
Iwate | Aiina Iwate | A High Availability Method for Network Control Nodes using The Network Namespace Minoru Kato, Rio Kuhara, Sumito Mori, Mitsutomo Imazaki (NTT-COMWARE) ICM2014-12 |
Recently cloud service provides that tenant user can build their own network topology and communication control on the v... [more] | ICM2014-12 pp.17-22 |
| ICD | 2013-04-12 16:20 |
Ibaraki | Advanced Industrial Science and Technology (AIST) | NMOS-Inside 6T SRAM Layout Reducing Neutron-Induced Multiple Cell Upsets Shusuke Yoshimoto, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) ICD2013-23 |
This paper presents a proposed NMOS-centered 6T SRAM cell layout that reduces a neutron-induced multiple-cell-upset (MCU... [more] | ICD2013-23 pp.121-126 |
| ITS, IE, ITE-AIT, ITE-HI, ITE-ME [detail] | 2013-02-19 10:20 |
Hokkaido | Hokkaido Univ. | Developing a Non-destructive Measurement Technique of Carbon Soot Deposition using a 3D Neutron Tomography Kousuke Matsushima (Kurume National College of Tech.), Takuro Kawakami (Kumamoto Univ.), Shoji Esaki (Kurume National College of Tech.), Keiichi Uchimura (Kumamoto Univ.), Jim Cotton (McMaster Univ.), Glenn Harvel (Univ. of Ontario Institute of Tech.), Jen-Shih Chang (McMaster Univ.) ITS2012-47 IE2012-127 |
Serious environmental problems are caused by NO_x and PM including soot in diesel exhaust gas. In this research, it prop... [more] | ITS2012-47 IE2012-127 pp.275-280 |
| ICD | 2012-12-18 10:55 |
Tokyo | Tokyo Tech Front | [Invited Talk]
Soft-error evaluation and mitigation technologies Taiki Uemura (Fujitsu Semiconductor Ltd.) ICD2012-116 |
Soft-Error is transient error in electron devices. Soft-error is triggered by cosmic-ray induced neutrons and alpha rays... [more] | ICD2012-116 pp.103-108 |
| ICD | 2012-12-18 11:45 |
Tokyo | Tokyo Tech Front | A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117 |
We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] | ICD2012-117 pp.109-113 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 14:55 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | Neutron Induced Single Event Multiple Transients With Voltage Scaling and Body Biasing Ryo Harada (Osaka Univ.), Yukio Mitsuyama (Kochi Univ. of Tech.), Masanori Hashimoto, Takao Onoye (Osaka Univ.) VLD2012-100 DC2012-66 |
This paper presents measurement results of neutron induced single event multiple transients (SEMT). We devise an SEMT me... [more] | VLD2012-100 DC2012-66 pp.237-241 |
| ITS, IE, ITE-AIT, ITE-HI, ITE-ME [detail] | 2012-02-21 10:20 |
Hokkaido | Hokkaido Univ. | Developing a Non-destructive Measurement Technique of Carbon Soot Deposition using a 3D Neutron Tomography Kousuke Matsushima, Shoji Esaki (Kurume N.C.T), Keiichi Uchimura (Kumamoto Univ.), Jim Cotton (McMaster Univ.), Glenn Harvel (UOIT) ITS2011-52 IE2011-128 |
The soot deposition in diesel exhaust systems occurs by different echanisms including convection, diffusion, turbulent d... [more] | ITS2011-52 IE2011-128 pp.269-274 |
| ICD | 2011-12-16 14:50 |
Osaka | Multiple-Bit-Upset and Single-Bit-Upset Resilient 8T SRAM Bitcell Layout with Divided Wordline Structure Yohei Umeki, Shusuke Yoshimoto, Takurou Amashita, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST) ICD2011-134 |
This paper presents a new 8T (8-transistor) SRAM cell layout mitigating multiple-bit upset (MBU) in a divided wordline s... [more] | ICD2011-134 pp.161-166 |
|
| SDM | 2010-11-12 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Modeling of Single-Event-Transient Pulse Generation in Inverter Cells Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180 |
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic ... [more] | SDM2010-180 pp.47-52 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-02 13:50 |
Kochi | Kochi City Culture-Plaza | [Invited Talk]
Failures due to Terrestriall Neutrons in Most Advanced Semicondutor Devices
-- Impacts and Hardening Techniques down to 22nm Design Rule -- Eishi Ibe, Kenichi Shimbo, Hitoshi Taniguchi, Tadanobu Toba (Hitachi, Ltd.) CPM2009-139 ICD2009-68 |
The status-of-the-art in failures and their mechanisms of CMOS memories and logic gates induced by terrestrial neutrons ... [more] | CPM2009-139 ICD2009-68 pp.29-34 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-03 10:00 |
Kochi | Kochi City Culture-Plaza | Correlation of Mitigation of Soft-error Rate of Routers between Neutron Irradiation Test and Field Soft-error Data Kenichi Shimbo, Tadanobu Toba, Hidehumi Ibe, Koji Nishii (Hitachi) CPM2009-143 ICD2009-72 |
We evaluated the soft error tolerance of the information system by the neutron irradiation test. We estimated the correl... [more] | CPM2009-143 ICD2009-72 pp.51-55 |
| SCE | 2009-10-20 15:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Development of SFQ circuit for compact neutron detector Isao Nakanishi, Shigeyuki Miyajima, Yosuke Higashi, Akira Fujimaki (Nagoya Univ.) SCE2009-23 |
We have demonstrated an SFQ signal processor prototype composed of quasi-one-junction SQUID (QOS) comparators, time-to-d... [more] | SCE2009-23 pp.37-39 |
| ITE-MMS, ITE-CE, MRIS | 2009-01-15 13:30 |
Osaka | Development of Fe16N2 Ultra Fine Particles for High Density Recording Media Yuji Sasaki, Tetsutaro Inoue, Toshiyuki Watanabe, Tsugihiro Doi, Mikio Kishimoto (Hitachi Maxell, Ltd.), Takayuki Oku, Kazuhisa Kakurai (Japan Atomic Enerht Agency) MR2008-51 |
For high density recording media, Fe16N2 fine particles were developed using co-precipitation and nitridation treatment ... [more] | MR2008-51 pp.5-9 |
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