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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ | 2024-11-15 10:05 |
Overseas | Kumwell Academy (Thailand) | Study on evaluation and analysis method of electromagnetic noise reduction effect of IC chip by magnetic materials Sosuke Ashida (Kobe Univ.), Koh Watanabe (NICT), Hiraku Uehara, Satoshi Tanaka, Makoto Nagata (Kobe Univ.), Masahiro Yamaguchi (Tohoku Univ.) |
[more] | |
| EMCJ | 2024-11-15 15:55 |
Overseas | Kumwell Academy (Thailand) | The Correlation between Electromagnetic Noise Characteristics and the Increase of GPS Misoperation 2 Hiraku Uehara (Kobe Univ.), Koh Watanabe (NICT), Sosuke Ashida, Yushi Mitsuya, Satoshi Tanaka, Makoto Nagata (Kobe Univ.) |
[more] | |
| EMCJ | 2024-11-15 16:15 |
Overseas | Kumwell Academy (Thailand) | Analysis of Impact on High-speed Mobile Communication by Electromagnetic Noise from Industrial Unmanned Aerial Vehicles Koh Watanabe (NICT), Hiraku Uehara, Satoshi Tanaka, Makoto Nagata (Kobe Univ.), Ifong Wu, Yasushi Matsumoto, Kaoru Gotoh (NICT) |
[more] | |
| HWS, ICD | 2024-11-01 12:05 |
Aomori | Hirosaki University (Primary: On-site, Secondary: Online) |
Examination of current status and issues for establishing minimum security requirements of semiconductor chips in embedded devices. Shinji Sato, Hirotaka Yoshida, Junichi Sakamoto, Kota Ideguchi (AIST), Makoto Nagata (Kobe Univ.), Shinichi Kawamura (AIST) |
[more] | |
| HWS, ICD | 2024-11-01 15:40 |
Aomori | Hirosaki University (Primary: On-site, Secondary: Online) |
Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] | |
| HWS, ICD | 2024-11-01 16:05 |
Aomori | Hirosaki University (Primary: On-site, Secondary: Online) |
Evaluation of Chip Internal Voltage Fluctuation and Digital Circuit Faults Induced by Electromagnetic Fault Injection Attacks Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) |
[more] | |
| HWS, ICD | 2024-11-01 16:40 |
Aomori | Hirosaki University (Primary: On-site, Secondary: Online) |
Integrated Multimodal Physical Attack Sensors for Lightweight Partial Re-Keying in Shared Group Key System Ryuki Ikemoto, Soichiro Fujii, Kotaro Naruse, Jun Shiomi, Yoshihiro Midoh (Osaka Univ.), Yuki Yamashita, Misato Taguchi, Takuji Miki, Makoto Nagata (Kobe Univ.), Yuichi Komano (CIT), Mitsugu Iwamoto, Kazuo Sakiyama (UEC), Noriyuki Miura (Osaka Univ.) |
[more] | |
| SDM, ICD, ITE-IST [detail] | 2024-08-06 14:35 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
Evaluation of Electromagnetic Noise Emitted from Electronic Circuits in Industrial Drones and its Interference on GPS Hiraku Uehara (Kobe Univ.), Koh Watanabe (NICT), Sosuke Ashida, Yushi Mitsuya, Satoshi Tanaka, Makoto Nagata (Kobe Univ.)  SDM2024-40 ICD2024-30 |
In recent years, autonomous vehicles have been developed, and drones are rapidly becoming more popular. However, there ... [more] |
SDM2024-40 ICD2024-30 pp.59-63 |
| SDM, ICD, ITE-IST [detail] | 2024-08-06 15:00 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
Evaluation and Analysis of Thermal Characteristics in Proximity within 3D Stacked Chips Shuhei Yokota, Rikuu Hasegawa, Kazuki Monta, Takaaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2024-41 ICD2024-31 |
In recent years, as semiconductor miniaturization technology advances, various challenges such as increased leakage curr... [more] | SDM2024-41 ICD2024-31 pp.64-68 |
| EMCJ, IEE-EMC, IEE-SPC | 2024-06-28 09:25 |
Hokkaido | Hotel Suncity | Study of Time Domain Evaluation Method of Electromagnetic Noise From Industrial Drones Yushi Mitsuya (Kobe Univ.), Koh Watanabe (NICT), Hiraku Uehara, Sosuke Ashida, Satoshi Tanaka, Makoto Nagata (Kobe Univ.) EMCJ2024-8 |
(To be available after the conference date) [more] | EMCJ2024-8 pp.6-10 |
| HWS | 2024-04-19 16:25 |
Tokyo | (Primary: On-site, Secondary: Online) |
Non-Destructive Hardware Trojan Inspection by Backside Near Infrared Imaging Junichi Sakamoto, Yohei Hori, Shinichi Kawamura (AIST), Yuichi Hayashi (NAIST), Makoto Nagata (KU) HWS2024-5 |
Hardware Trojan detection is a critical topic for maintaining the security of IC supply chain. Previous studies have rep... [more] | HWS2024-5 pp.18-23 |
| HWS | 2024-04-19 16:50 |
Tokyo | (Primary: On-site, Secondary: Online) |
Supply chain risk and hardware trojan protection Shinichi Kawamura, Tsutomu Matsumoto, Hirotaka Yoshida (AIST), Yasuyoshi Uemura (SCU), Makoto Nagata (Kobe Univ.), Makoto Ikeda (Tokyo Univ.), Ken Takano (LINTEC) HWS2024-6 |
[more] | HWS2024-6 pp.24-29 |
| HWS | 2024-04-19 17:15 |
Tokyo | (Primary: On-site, Secondary: Online) |
Supply chain security of semiconductor chips and countermeasure design technologies Makoto Nagata (Kobe Univ.), Kazuki Monta (Secafy Co., Ltd.), Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.) HWS2024-7 |
This report is dedicated to the threats and countermeasures of semiconductor supply chain security, regarding the authen... [more] | HWS2024-7 pp.30-33 |
| VLD, HWS, ICD | 2024-02-29 12:05 |
Okinawa | (Primary: On-site, Secondary: Online) |
Shuhei Yokota, Rikuu Hasegawa, Kazuki Monta, Takaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univercity) VLD2023-112 HWS2023-72 ICD2023-101 |
With the rapid development of electronic technology, the level of integration of electronic devices is clearly on the ri... [more] | VLD2023-112 HWS2023-72 ICD2023-101 pp.77-82 |
| VLD, HWS, ICD | 2024-03-01 11:15 |
Okinawa | (Primary: On-site, Secondary: Online) |
Investigation of electromagnetic irradiation noise reduction by on-chip LDOs Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-124 HWS2023-84 ICD2023-113 |
IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions (faults) by injecting il... [more] | VLD2023-124 HWS2023-84 ICD2023-113 pp.131-134 |
| SDM | 2024-02-21 11:25 |
Tokyo | Tokyo University-Hongo-Engineering Bldg.4 (Primary: On-site, Secondary: Online) |
[Invited Talk]
Development of Backside Buried Metal Layer Technology to Enhance Power Integrity of Three-Dimensional Integrated Circuits Naoya Watanabe, Yuuki Araga, Haruo Shimamoto (AIST), Makoto Nagata (Kobe Univ.), Katsuya Kikuchi (AIST) SDM2023-83 |
[more] | SDM2023-83 pp.9-15 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-17 09:35 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Backside Side-Channel Attack by Silicon Substrate Voltage and Simulation Rikuu Hasegawa, Kazuki Monta, Takuya Watatsumi, Takuji Miki, Makoto Nagata (Kobe Univ) VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66 |
Integrated circuit (IC) chips equipped with cryptographic circuits are vulnerable to side-channel attacks, which use exp... [more] | VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66 pp.173-177 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-17 10:00 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Derivation of secret keys by differential fault analysis using backside voltage fault injection Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67 |
Lasers have been the leading method of fault injection in fault injection attacks on cryptographic integrated circuit (I... [more] | VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67 pp.178-181 |
| ICD, HWS | 2023-10-31 15:00 |
Mie | (Primary: On-site, Secondary: Online) |
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking Kazuki Monta, Rikuu Hasegawa, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-57 ICD2023-36 |
2.5D and 3D packaging are methodologies that include multiple integrated circuit (IC) chips. They deliver enhanced perfo... [more] | HWS2023-57 ICD2023-36 pp.16-19 |
| MW, EMCJ, EST, IEE-EMC [detail] | 2023-10-20 10:50 |
Yamagata | Yamagata University (Primary: On-site, Secondary: Online) |
Response Analysis of 5G Receiver Sensitivity to Electromagnetic Noise Components in Industrial Drones Koh Watanabe (NICT), Ryota Sakai, Hiraku Uehara, Satoshi Tanaka, Makoto Nagata (Kobe Univ.), Yasushi Matsumoto, Kaoru Gotoh (NICT) EMCJ2023-53 MW2023-107 EST2023-80 |
(To be available after the conference date) [more] | EMCJ2023-53 MW2023-107 EST2023-80 pp.94-97 |
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