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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SCE | 2014-10-15 14:30 |
Miyagi | Tohoku University, RIEC | Fabrication and characterization of waveguide-coupled superconducting nanowire single-photon detectors Kentaro Waki (Osaka Univ./NICT), Taro Yamashita (NICT), Shin-ichiro Inoue (NICT/JST-PRESTO), Shigehito Miki, Hirotaka Terai (NICT), Rikizo Ikuta, Takashi Yamamoto, Nobuyuki Imoto (Osaka Univ.)  SCE2014-37 |
In recent years, the waveguide-coupled type of superconducting nanowire single-photon detectors (SSPDs), which consists ... [more] | SCE2014-37 pp.17-21 |
| ICD, SDM | 2014-08-05 14:55 |
Hokkaido | Hokkaido Univ., Multimedia Education Bldg. | Initial Frequency Degradation on Ring Oscillators in 65-nm SOTB Process Caused by Plasma-Induced Damage Azusa Oshima, Ryo Kishida, Michitarou Yabuuchi, Kazutoshi Kobayashi (KIT) SDM2014-79 ICD2014-48 |
Reliability issues, such as plasma-induced damage (PID) and Bias Temperature Instability (BTI), become dominant on inte... [more] |
SDM2014-79 ICD2014-48 pp.93-98 |
| DC | 2014-06-20 13:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A method of LSI degradation estimation using ring oscillators Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2014-11 |
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] | DC2014-11 pp.7-14 |
| SDM | 2014-01-29 10:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Heated Ion Implantation Technology for Highly Reliable Metal-gate/High-k CMOS SOI FinFETs Wataru Mizubayashi (AIST), Hiroshi Onoda, Yoshiki Nakashima (Nissin Ion Equipment), Yuki Ishikawa, Takashi Matsukawa, Kazuhiko Endo, Yongxun Liu, Shinichi Ouchi, Junichi Tsukada, Hiromi Yamauchi, Shinji Migita, Yukinori Morita, Hiroyuki Ota, Meishoku Masahara (AIST) SDM2013-138 |
The impact of heated ion implantation (I/I) technology on metal-gate (MG)/high-k (HK) CMOS SOI FinFET performance and re... [more] | SDM2013-138 pp.13-16 |
| IPSJ-SLDM, CPSY, RECONF, VLD [detail] | 2014-01-29 14:50 |
Kanagawa | Hiyoshi Campus, Keio University | Prediction Model for Process Variation and BTI-Induced Degradation by Measurement Data on FPGA Michitarou Yabuuchi, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2013-129 CPSY2013-100 RECONF2013-83 |
We propose a prediction model for BTI-induced degradation by measurement data on 65nm-process FPGAs. BTI-induced degrad... [more] |
VLD2013-129 CPSY2013-100 RECONF2013-83 pp.161-166 |
| IPSJ-SLDM, CPSY, RECONF, VLD [detail] | 2014-01-29 15:40 |
Kanagawa | Hiyoshi Campus, Keio University | Methodology for NBTI measurement using an on-chip leakage monitor circuit Takaaki Sato, Kimiyoshi Usami (Shibaura Inst. of Tech.) VLD2013-131 CPSY2013-102 RECONF2013-85 |
Miniaturization in recent years ,LSI's aging has become prominent as a factor that prevents the normal operation.By meas... [more] | VLD2013-131 CPSY2013-102 RECONF2013-85 pp.173-178 |
| DC | 2013-06-21 14:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A theretical discussion for testabilty of a degraded LSI in field Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.) DC2013-12 |
Various electronic systems that consist of variety of LSIs require very high reliability in field. However, physical deg... [more] | DC2013-12 pp.13-18 |
| DC | 2013-06-21 16:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Method of Transistor Degradation Estimation Using Ring Oscillators Tatsunori Ikeda, Yukiya Miura (Tokyo Metropolitan Univ.) DC2013-15 |
Aging called Negative Bias Temperature Instability (NBTI), Negative Bias Temperature Instability (NBTI) and Chanel Hot C... [more] | DC2013-15 pp.31-36 |
| KBSE | 2013-03-15 15:20 |
Tokyo | Shibaura Institute of Technology | A System to Help with Making Subtitles Condensed the Content of a Lecture
-- A Proposal of a Method to Help with Making them by a Decision-Making technique -- Seiichi Komiya, Hisaki Kudo (Shibaura Inst. of Tech.), Kazuhiro Uenosono (Aoyama Gakuin Univ.), Rihito Yaegashi (Kagawa Univ.) KBSE2012-86 |
It is one of effective means to understand the content of a lecture conducted in Japanese for a beginner of Japanese lan... [more] | KBSE2012-86 pp.103-108 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-26 16:50 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | Variations and BTI-induced Aging Degradation on Commercial FPGAs Shouhei Ishii, Kazutoshi Kobayashi (KIT) VLD2012-72 DC2012-38 |
In this paper, we focus on problems concerning variations and degradation on FPGAs which has become dominant due to scal... [more] | VLD2012-72 DC2012-38 pp.75-80 |
| SDM, ED (Workshop) |
2012-06-29 12:00 |
Okinawa | Okinawa Seinen-kaikan | Reliability Measurement of PFETs under Post Fabrication Self-Improvement Scheme for SRAM Nurul Ezaila Alias, Anil Kumar, Takuya Saraya (Univ. of Tokyo), Shinji Miyano (STARC), Toshiro Hiramoto (Univ. of Tokyo) |
The negative bias temperature instability (NBTI) reliability of PFETs is measured under the post fabrication SRAM self-i... [more] | |
| IPSJ-SLDM, VLD | 2012-05-30 16:20 |
Fukuoka | Kitakyushu International Conference Center | [Invited Talk]
How to Mitigate Reliability-related Issues on Nano-scaled LSIs Kazutoshi Kobayashi (KIT) VLD2012-5 |
According to aggressive process scaling, reliability issues on semiconductor devices are becoming dominant such as vari... [more] |
VLD2012-5 pp.25-30 |
| OME | 2012-05-24 16:30 |
Tokyo | NTT Musashino Research and Development Center | Quantification of Atomic Oxygen Genarated in an Oxygen Plasma Apparatus using a Carbon/Silver-coated Quarts Crystal Microbalance (QCM) Method Kiyoshi Yoshino, Hiroyuki Matsumoto, Tatsuyuki Iwasaki, Shinobu Kinoshita (EYE), Kazutoshi Noda (AIST), Satoru Iwamori (TOKAI) OME2012-30 |
(To be available after the conference date) [more] | OME2012-30 pp.53-57 |
| VLD | 2012-03-07 09:15 |
Oita | B-con Plaza | A Power Grid Optimization Algorithm Considering by NBTI Yoriaki Nagata, Masahiro Fukui (Ritsumeikan Univ.), Shuji Tsukiyama (Chuo Univ.) VLD2011-132 |
With the advent of super deep submicron age and high integration, the circuit was concerned about the impact of timing ... [more] | VLD2011-132 pp.73-78 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-28 10:30 |
Miyazaki | NewWelCity Miyazaki | Degradation of Oscillation Frequency of Ring Oscillators Placed on a 90 nm FPGA Shouhei Ishii, Kazutoshi Kobayashi (KIT) VLD2011-55 DC2011-31 |
We focuse on issues related to degradation of FPGAs which has become dominant due to scaling and quantitatively estimate... [more] | VLD2011-55 DC2011-31 pp.19-24 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-29 15:05 |
Miyazaki | NewWelCity Miyazaki | Multi-core LSI Lifetime Extension by NBTI-Recovery-based Self-healing Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.) CPM2011-160 ICD2011-92 |
Designing reliable systrems has become more difficult in recent years. Negative-Bias-Temperature-In-stability (NBTI) is ... [more] | CPM2011-160 ICD2011-92 pp.59-63 |
| IMQ (2nd) |
2011-03-18 14:30 |
Shizuoka | The temporal change of the vergence characteristic while watching 3D movies Yusuke Horie, Daisuke Fushimi, Yuta Kawamura, Mitsuho Yamada (Tokai Univ.) |
The number which is made public as 3D movie increases and 3D compatible TVs are commercialized from a lot of manufacture... [more] | ||
| ET | 2011-03-04 16:50 |
Tokushima | Sentence contraction of Subtitles by Analyzes Dependency Structure and Case Structure for VOD learning system Tatsuya Norimoto, Lou yi gou, Noboru Koyama, Hiromitsu Shiina, Fumio Kitagawa (OUS) ET2010-145 |
Recently, a use of e-Learning system increases on Internet and Intranet. In particular, VOD learning systems with slid... [more] |
ET2010-145 pp.305-310 |
|
| VLD | 2011-03-02 17:00 |
Okinawa | Okinawaken-Danjo-Kyodo-Sankaku Center | [Fellow Memorial Lecture]
Understanding CMOS Variability for More Moore Hidetoshi Onodera (Kyoto Univ./JST) VLD2010-124 |
With the device dimensions in the nanometer regime, variability becomes a serious concern in LSI design. Aggressive sc... [more] |
VLD2010-124 p.49 |
| ET | 2011-01-28 14:55 |
Tokyo | Waseda University | A Web-Based System of Partial Movie Viewing and Comprehension Testing Using Leaner's Markers Keisuke Sasaki, Jouji Miwa (Iwate Univ.) ET2010-87 |
Now a day, a partial movie viewing system is very important for searching and watching the specific part of a long durat... [more] | ET2010-87 pp.39-44 |
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