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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| QIT (2nd) |
2023-12-18 16:05 |
Okinawa | OIST (Primary: On-site, Secondary: Online) |
Multiplexed Inter-node Communication in Distributed Quantum Computing Soshun Naito (Univ. of Tokyo), Yasunari Suzuki, Yuuki Tokunaga (NTT) |
In fault-tolerant quantum computing, a large number of physical qubits are required to construct a single logical qubit,... [more] | |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 11:00 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
A Block Partitioning Method to Accelerate Test Generation for Gate-Exhaustive Faults Momona Mizota, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.)  CPSY2022-3 DC2022-3 |
In gate-exhaustive fault model which covers defects in cells, since the number of faults is proportion to that of gates,... [more] | CPSY2022-3 DC2022-3 pp.13-18 |
| DC | 2019-02-27 09:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73 |
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] | DC2018-73 pp.13-18 |
| CPSY, DC, IPSJ-ARC (Joint) [detail] |
2018-07-30 10:45 |
Kumamoto | Kumamoto City International Center | Region Selection Method for Geographical State Machine Replication on Public Clouds Shota Numakura, Junya Nakamura, Ren Ohmura (TUT) DC2018-14 |
State Machine Replication (SMR) is a replication method that improves fault tolerance of a general service. Geographical... [more] | DC2018-14 pp.7-12 |
| ET | 2016-03-05 16:15 |
Kagawa | Kawaga Univ. (Saiwai-cho Campus) | A Proposal for a Misconfiguration Detection Method based on Program Analysis Techniques for Network Construction Exercises for Beginners Yuichiro Tateiwa, Naohisa (NIT) ET2015-106 |
In this study, we propose a method that specifies regions (we call them fault regions) where misconfigurations concernin... [more] | ET2015-106 pp.71-76 |
| EMD | 2014-11-30 13:20 |
Hokkaido | Chitose Cultural Center | A comparison of three radiation models in the modeling of fault arc Mei Li, Mingzhe Rong, Yi Wu, Yifei Wu, Junpeng Zhang, Yang Hu, Yang Li (Xi'an Jiaotong Univ.) EMD2014-87 |
Three radiation models, the NEC, semi-empirical based on NEC as well as P1 model, are used to compute the radiation tran... [more] | EMD2014-87 pp.127-131 |
| VLD | 2014-03-03 16:00 |
Okinawa | Okinawa Seinen Kaikan | Latch-based AES Encryption Circuit Against Fault Analysis Youhua Shi, Hiroaki Taniguchi, Nozomu Togawa, Masao Yanagisawa (Waseda Univ.) VLD2013-140 |
In general, cryptography is considered to be secure because it is based on complicated mathematical theories. In recent ... [more] | VLD2013-140 pp.37-42 |
| OFT, OCS, IEE-CMN, ITE-BCT (Joint) [detail] |
2009-11-27 14:35 |
Fukushima | [Invited Talk]
Proposal of fiber macrobending identification method Shiro Ryu, Mikio Yagi (SoftBank Telecom) OCS2009-98 OFT2009-61 |
Macrobending loss that occurs at a junction point of optical cables might become harmful to system operation since the l... [more] | OCS2009-98 OFT2009-61 pp.87-92(OCS), pp.41-46(OFT) |
|
| NS, IN (Joint) |
2008-03-07 13:10 |
Okinawa | Bankoku Shinryokan | Fault Tolerance network using Push-Type P2P for Community Network Yoshiki Okura, Satoshi Okano, Shingo Yasui, Hiroyuki Ebara, Hiromi Okada (Kansai Univ.) IN2007-222 |
Community Networks (CNs) that aim to exchange/share of information in regional community has been paid a lot of attentio... [more] | IN2007-222 pp.379-384 |
| DC | 2008-02-08 16:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fault Diagnosis of Analog Circuits by Using Multiple Transistors and Data Samplings Jiro Kato, Yukiya Miura (Tokyo Metropolitan Univ.) DC2007-82 |
In this paper, we propose two methods for diagnosing analog circuits by using multiple transistors and data samplings, w... [more] | DC2007-82 pp.95-100 |
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