Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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DC2009-65
A Statistical Method of Small Iddq Variance Outlier Detection
Yoshiyuki Nakamura, Masashi Tanaka (NEC Electronics)
pp. 1 - 5
DC2009-66
Test Pattern Re-Ordering for Thermal-Uniformity during Test
Makoto Nakao, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (Nara Inst. of Sci and Tech.)
pp. 7 - 12
DC2009-67
Study on a Test Generation Method for Transition Faults Using Multi Cycle Capture Test
Hiroshi Ogawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.)
pp. 13 - 18
DC2009-68
Modeling resistive open faults and generating their tests
Hiroshi Takahashi, Yoshinobu Higami, Yuta Shudo, Yuji Takamune, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima)
pp. 19 - 24
DC2009-69
A Method of Reproducing Iuput/Ouput Error Trace on High-level Design for Hardware Debug Support
Yeonbok Lee, Tasuku Nishihara, Takeshi Matsumoto (Univ. of Tokyo.), Masahiro Fujita (Univ. of Tokyo./JST)
pp. 25 - 30
DC2009-70
A binding method for testability based on resources sequential depth reduction
Takaaki Cho, Toshinori Hosokawa (Nihon Univ.)
pp. 31 - 38
DC2009-71
Reduction of execution times and areas for delay measurement by subtraction
Toru Tanabe, Hirohisa Minato, Kentaroh Katoh, Kazuteru Namba, Hideo Ito (Chiba Univ.)
pp. 39 - 44
DC2009-72
A Test Compaction Oriented Control Point Insertion Method for Transition Faults
Yoshitaka Yumoto, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.)
pp. 45 - 50
DC2009-73
On Calculation of Delay Test Quality for Test Cubes and X-filling
Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech./JTS)
pp. 51 - 56
DC2009-74
Seed Selection for High Quality Delay Fault Test in BIST
Akira Taketani, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (Nara Inst. of Sci and Tech.)
pp. 57 - 62
DC2009-75
A Study on Acceptable Faults in Digital Filters
Takumi Miyaguchi, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.)
pp. 63 - 68
DC2009-76
High Speed X-Fault Diagnosis with Partial X-Resolution
Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.)
pp. 69 - 74
DC2009-77
Consideration of Open Faults Model Based on Digital Measurement of TEG Chip
Toshiyuki Tsutsumi (Meiji Univ.), Yasuyuki Kariya, Koji Yamazaki (Meiji Univ), Masaki Hashizume, Hiroyuki Yotsuyanagi (Tokushima Univ), Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu (Ehime Univ)
pp. 75 - 80
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.