Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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DC2012-9
An evaluation of a don't care filling method to improve fault sensitization coverage
Ryosuke Wakasugi, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyusyu Univ)
pp. 1 - 6
DC2012-10
A Reduction Technique of Input Sequences for Time-Multiplexed On-Chip Path Delay Measurement Using Embedded Delay Measurement Circuit
Kentaroh Katoh (TNCT)
pp. 7 - 13
DC2012-11
A Study on Fault Tolerant Test Pattern Generators for Reliable Built-in Self Test
Yuki Fukazawa, Tsuyoshi Iwagaki, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.)
pp. 15 - 20
DC2012-12
[Invited Talk]
Empirical study for signal integrity-defects
Hiroshi Takahashi, Yoshinobu Higami (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. Tokushima)
pp. 21 - 26
DC2012-13
Note on Layout-Aware High Accuracy Estimation of Bridge/Open Fault Coverage
Masayuki Arai, Yoshihiro Shimizu, Kazuhiko Iwasaki (Tokyo Metro. Univ.)
pp. 27 - 32
DC2012-14
An Evaluation of Low Power BIST Method
Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara (Kyutech)
pp. 33 - 38
DC2012-15
On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing
Yuta Yamato, Tomokazu Yoneda, Kazumi Hatayama, Michiko Inoue (NAIST)
pp. 39 - 44
DC2012-16
Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test
Yousuke Miyake, Takuma Sasakawa, Yasuo Sato, Seiji Kajihara (Kyutech), Yukiya Miura (TMU)
pp. 45 - 50
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.