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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2020-12-11 13:00 |
Hyogo | (Primary: On-site, Secondary: Online) |
A Degradation Prediction of Circuit Delay Using A Gradient Descent Method Seiichirou Mori, Masayuki Gondou, Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech)  DC2020-59 |
As the risk of aging-induced faults of VLSIs is increasing, highly reliable systems require to predict when the aging-in... [more] | DC2020-59 pp.1-6 |
| DC | 2019-12-20 16:30 |
Wakayama | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] | DC2019-85 pp.37-42 |
|
| R | 2019-11-28 16:25 |
Osaka | Central Electric Club | Reliability Methodologies for Degradation Predictions Based on Hierarchical Bayesian Modeling and Machine Learning Toru Kaise, Toyohiko Egami (Univ. of Hyogo) R2019-49 |
Degradation processes are significant for making values of reliability. Particularly, it is known that stochastic model... [more] |
R2019-49 pp.35-38 |
| CPM, ED, EID, SDM, ICD, MRIS, QIT, SCE, OME, EMD (Joint) [detail] |
2018-03-08 15:15 |
Shizuoka | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 4 -- Keiji Koshida, Shin-ichi Wada (TMC), Koichiro Sawa (NIT) EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 |
Authors have studied degradation phenomena on electrical contacts under oscillations. In addition, they have developed a... [more] | EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 pp.15-20 |
|
| EE | 2018-01-30 13:35 |
Oita | Satellite Campus Oita | Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation Hiroshi Nakao, Yu Yonezawa, Yoshiyasu Nakashima (Fujitsu LAB), Fujio Kurokawa (NiAS) EE2017-71 |
Electrolytic capacitors are known as one of the highest failure rate components in switching mode power supply SMPS). We... [more] | EE2017-71 pp.165-170 |
| OME, SDM | 2017-04-21 14:05 |
Kagoshima | Tatsugochou Shougaigakushuu Center | Charge storage behavior of zirconia ceramics under DC electric field
-- Preparation of Y-TZP bioceramics with enhanced LTD durability -- Yumi Tanaka (Tokyo Univ. of Sci.), Hiroyuki Hara (Kyushu Univ.) SDM2017-8 OME2017-8 |
Yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) is an important load-bearing bioceramic. However, a phenomenon... [more] | SDM2017-8 OME2017-8 pp.35-39 |
| EMD | 2015-10-02 16:50 |
Saitama | Fuji Electric FA Components & SystemCo.,Ltd. | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-66 |
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] | EMD2015-66 pp.37-42 |
| EMD, R | 2015-02-20 15:20 |
Shizuoka | A method for evaluating degradation phenomenon of electrical contacts using a micro-sliding mechanisms
-- Minimal sliding amplitudes against input waveforms under some conditions -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) R2014-73 EMD2014-110 |
Authors have designed and developed a micro-sliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] | R2014-73 EMD2014-110 pp.13-20 |
|
| EMD | 2013-11-16 09:30 |
Overseas | Huazhong University of Science and Technology, Wuhan, P.R.China | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board
-- Properties of the Responses using Rectangular Wave and Sinusoidal one as an Input -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-78 |
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] | EMD2013-78 pp.15-18 |
| EMD | 2013-11-16 09:45 |
Overseas | Huazhong University of Science and Technology, Wuhan, P.R.China | An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board
-- Natural Frequency and Damping Ratio (2) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-79 |
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] | EMD2013-79 pp.19-22 |
| EMD | 2012-12-01 14:30 |
Chiba | Chiba Institute of Technology | Degradation phenomenon of electrical contacts using a hammering oscillating mechanism
-- A fundamental study on the performance of the oscillating mechanism (25) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86 |
Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more] | EMD2012-86 pp.125-131 |
| VLD | 2012-03-07 09:15 |
Oita | B-con Plaza | A Power Grid Optimization Algorithm Considering by NBTI Yoriaki Nagata, Masahiro Fukui (Ritsumeikan Univ.), Shuji Tsukiyama (Chuo Univ.) VLD2011-132 |
With the advent of super deep submicron age and high integration, the circuit was concerned about the impact of timing ... [more] | VLD2011-132 pp.73-78 |
| EMD | 2011-11-18 16:15 |
Akita | Akita Univ. Tegata Campus | Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism
-- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102 |
Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more] | EMD2011-102 pp.189-194 |
| NLP | 2011-03-11 16:35 |
Tokyo | Tokyo University of Science | A Study of Degradatuion Phenomenon of electrical Contacts by some Oscillating Mechanisms
-- Modeling about Fluctuation of Contact Resistance -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Tohru Ikeguchi (Saitama Univ.), Yoshihiko Horio (Tokyo Denki Univ.), Koichiro Sawa (Nippon Insti. of Tech.) NLP2010-196 |
The authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences o... [more] | NLP2010-196 pp.187-192 |
| EMD | 2010-11-12 13:15 |
Overseas | Xi'an Jiaotong University | A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism
-- Modeling (10) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111 |
A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the ver... [more] | EMD2010-111 pp.185-188 |
| EMD, OPE, LQE, CPM | 2010-08-26 09:20 |
Hokkaido | Chitose Arcadia Plaza | Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- modeling of the oscillating mechanism (9) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24 |
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] | EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24 pp.1-6 |
| EMD | 2010-05-21 14:50 |
Akita | Akita Univ. | Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- modeling of the oscillating mechanism (8) -- Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-4 |
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] | EMD2010-4 pp.19-24 |
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