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All Technical Committee Conferences  (Searched in: Recent 10 Years)

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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 10 of 10  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
MSS, SS 2023-01-10
13:30
Osaka (Osaka, Online)
(Primary: On-site, Secondary: Online)
[Invited Talk] Thermal Comfort Aware Online Energy Management Framework for Smart Building: An Experimental Study
Daichi Watari, Ittetsu Taniguchi (Osaka Univ.), Francky Catthoor (IMEC/KUL), Charalampos Marantos (NTUA), Kostas Siozios (AUTH), Elham Shirazi (UT), Dimitrios Soudris (NTUA), Takao Onoye (Osaka Univ.) MSS2022-45 SS2022-30
This report presents a real-time energy management system for buildings that uses solar power generation and thermal com... [more] MSS2022-45 SS2022-30
pp.5-6
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2021-12-01
14:45
Online Online (Online) Diagnosis of Switching-Induced IR Drop by On-Chip Voltage Monitors
Kazuki (Kobe Univ.), Leonidas Kataselas (Aristotle Univ.), Ferenc Fodor (IMEC), Alkis Hatzopoulos (Aristotle Univ.), Makoto Nagata (Kobe Univ.), Erik Jan Marinissen (IMEC) VLD2021-31 ICD2021-41 DC2021-37 RECONF2021-39
On-chip monitor (OCM) circuits enable us to observe dynamic power-supply (PS) waveforms within power domains individuall... [more] VLD2021-31 ICD2021-41 DC2021-37 RECONF2021-39
pp.83-86
SIP, CAS, VLD, MSS 2021-07-05
16:25
Online Online (Online) Thermal Comfort Aware Real-time Co-scheduling of HVAC, Battery System, and Smart Appliances for Smart Building
Daichi Watari, Ittetsu Taniguchi (Osaka Univ.), Francky Catthoor (IMEC/KUL), Charalampos Marantos (NTUA), Kostas Siozios (AUTH), Elham Shirazi (IMEC/KUL), Dimitrios Soudris (NTUA), Takao Onoye (Osaka Univ.) CAS2021-8 VLD2021-8 SIP2021-18 MSS2021-8
Building energy management is vital for reducing electricity costs and maximizing occupant comfort. This paper proposes ... [more] CAS2021-8 VLD2021-8 SIP2021-18 MSS2021-8
pp.36-41
SDM 2020-02-07
10:10
Tokyo Tokyo University-Hongo (Tokyo) [Invited Talk] Stability of Cu Interconnect Surface after post CMP Cleaning
Yasuhiro Kawase, Toshiaki Shibata, Tomohiro Kusano (MCC), Ken Harada (imec), Kan Takeshita (MCC) SDM2019-90
At present, more than 12 Cu interconnect layers have been formed in advanced semiconductor devices and each layer is pla... [more] SDM2019-90
pp.9-14
HWS, ISEC, SITE, ICSS, EMM, IPSJ-CSEC, IPSJ-SPT [detail] 2018-07-25
14:25
Hokkaido Sapporo Convention Center (Hokkaido) Immunity Evaluation of Cryptographic Devices using Gaussian Noise against IEMI Fault Injection
Takumi Okamoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST), Naofumi Homma (Tohoku Univ.), Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede (KU Leuven) ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19
Fault injection attacks using intentional electromagnetic interference against cryptographic devices have been reported.... [more] ISEC2018-20 SITE2018-12 HWS2018-17 ICSS2018-23 EMM2018-19
pp.77-81
VLD, DC, CPSY, RECONF, CPM, ICD, IE
(Joint) [detail]
2016-11-28
15:30
Osaka Ritsumeikan University, Osaka Ibaraki Campus (Osaka) Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.) VLD2016-52 DC2016-46
We propose a circuit analysis method using the bimodal RTN (random telegraph
noise) model of the defect-centric distri... [more]
VLD2016-52 DC2016-46
pp.49-54
SDM 2016-01-22
16:00
Tokyo Sanjo Conference Hall, The University of Tokyo (Tokyo) [Invited Talk] Packaging Material for 2.5D/3D TSV Integration
Kazuyuki Mitsukura, Tatsuya Makino, Keiichi Hatakeyama (Hitachi Chemical), Kenneth June Rebibis, Andy Miller, Eric Beyne (IMEC) SDM2015-118
 [more] SDM2015-118
pp.45-47
ICD, CPSY 2015-12-17
09:40
Kyoto Kyoto Institute of Technology (Kyoto) RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayash (KIT), Hidetoshi Onodera (KU) ICD2015-63 CPSY2015-76
 [more] ICD2015-63 CPSY2015-76
pp.1-6
ICD, CPSY 2015-12-17
16:00
Kyoto Kyoto Institute of Technology (Kyoto) [Poster Presentation] RTN Modeling of Ring Oscillators by a Bimodal Defect-Centric Behavior in a 40 nm process
Azusa Oshima (KIT), Pieter Weckx, Ben Kaczer (IMEC), Takashi Matsumoto (UT), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (KU)
 [more]
EE, WPT, IEE-SPC
(Joint) [detail]
2015-07-06
15:30
Kyoto   (Kyoto) Application of Wireless Electromagnetic Resonance Power Transmission Technology to Rotary Transformer Used in Ultrasonic Spindle
Yafei Gao, Myoungsik Nam, Masahito Shoyama (Kyushu Univ.), Hideaki Fujita (Oriimec) WPT2015-39
Rotary transformer is used to supply power to non-contact ultrasonic spindle. For solving the problem that low voltage c... [more] WPT2015-39
pp.19-23
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