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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2023-12-22 13:50 |
Tochigi | Teikyo University | Application of electron/ion emission equivalent circuit as a compass in investigation for accidents caused by arc discharge Noboru Wakatsuki (Ishinomaki Senshu Univ.), Katsuhiro Hosoe (Administrative scrivener), Shuhei Suzuki (consultant), Yu Yonezawa (Nagoya Univ.)  EMD2023-34 |
Electrical accidents related to arc discharge are complex phenomena. In most cases, there is no map that shows a clear p... [more] | EMD2023-34 pp.13-18 |
| LQE, OPE, CPM, EMD, R | 2023-08-25 13:50 |
Miyagi | Tohoku university (Primary: On-site, Secondary: Online) |
Hypothetic model of electron and ion emission due to an electric double layer at the interface between solid and liquid phases at electrical contacts Noboru Wakatsuki (Ishinomaki Senshu Univ.), Katuhiro Hosoe (Administrative scrivener), Shuhei Suzuki, Yu Yonezawa (Nagoya Univ.) R2023-34 EMD2023-29 CPM2023-39 OPE2023-78 LQE2023-25 |
We want to analyze the current interruption phenomenon of electric contacts, that accompanies melting and arc discharge,... [more] | R2023-34 EMD2023-29 CPM2023-39 OPE2023-78 LQE2023-25 pp.89-94 |
| EMCJ, MICT (Joint) |
2023-03-17 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Statistical Modeling of Automotive Component Noise-Source Including Load Change Noboru Maeda (SOKEN), Keishi Miwa (TMC) EMCJ2022-93 |
Electromagnetic noise is often a phenomenon with large fluctuation, so, it is effective to understand the noise source c... [more] | EMCJ2022-93 pp.7-12 |
| ED | 2017-10-27 09:30 |
Miyagi | Ab initio calculations of field emission from carbon emitters on the basis of time-dependent density functional theory (Ⅲ) Toshiharu Higuchi, Masahiro Sasaki, Yoichi Yamada (Univ. of Tsukuba) ED2017-44 |
To clarify the origin of the superior field emission characteristics of carbon emitters, we have estimated the emission ... [more] | ED2017-44 pp.35-38 |
|
| EE | 2017-01-26 14:45 |
Nagasaki | Nagasaki University | [Poster Presentation]
Research and development of X-ray generator using field electron emission phenomenon Ryota Michigami, Masanori Ogino, Satoru Nishino, Koji Kiyoyama, Ken Oyama, Hideki Hamagaki (NiAS) EE2016-66 |
X - ray sources are used in a wide range of fields from medical radiography to the non-destructive examination of substa... [more] | EE2016-66 pp.93-96 |
| EMCJ | 2017-01-19 16:00 |
Fukuoka | Kyushu Institute of Technology | [Special Talk]
Study of emitting and inducting phenomenon relating to telecommunication cable Nobuo Kuwabara (KIT) EMCJ2016-115 |
I studied the disturbance emitting from telecommunication cable and the over-voltage inducting at telecommunication line... [more] | EMCJ2016-115 pp.35-38 |
| SDM, EID | 2016-12-12 15:15 |
Nara | NAIST | Study of the inverter circuit of DNA/Si-MOSFET due to the parasitic capacitance control Hibiki Nakano, Matsuo Naoto, Akira Heya, Tadao Takada, Kazusige Yamana (Univ. of Hyogo), Tadashi Sato, Shin Yokoyama (Univ. Hiroshima) EID2016-23 SDM2016-104 |
An input/output characteristics of the inverter composed of the DNA/Si-MOSFET and the parasitic capacity was studied. Th... [more] | EID2016-23 SDM2016-104 pp.63-66 |
| ED | 2016-10-26 09:55 |
Mie | Electron Emission from W(100) Surface modified by Group 3 Elements
-- Work Function Reduction by Sc Oxide, Pr Oxide and Nd Oxide -- Takashi Kawakubo (NIT Kagawa), Hideaki Nakane (Muroran Inst. of Tech.) ED2016-52 |
Tungsten which is one of high melting metal is employed as the material of the electron source. The work function of tun... [more] | ED2016-52 pp.41-46 |
|
| US, EA (Joint) |
2016-01-28 16:15 |
Osaka | Kansai University, Centenary Memorial Hall | [Invited Talk]
Na atom emission in sonoluminescence Pak-Kon Choi (Meiji Univ.) US2015-90 EA2015-55 |
Irradiation of intense ultrasound into liquid causes the emission of pale light called “sonoluminescence”. This phenomen... [more] | US2015-90 EA2015-55 pp.37-42(US), pp.1-6(EA) |
| SDM | 2013-06-18 16:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Lecture]
An attempt for clarification of SiC oxidation mechanism
-- Common/different point to Si oxidation -- Yasuto Hijikata, Shuhei Yagi, Hiroyuki Yaguchi (Saitama Univ.) SDM2013-62 |
Further understanding of the SiC oxidization mechanism is indispensable for MOSFET using a SiC semiconductor to exceed t... [more] | SDM2013-62 pp.91-96 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-28 16:30 |
Miyazaki | NewWelCity Miyazaki | A study on parameter estimation for modeling of random-telegraph noise Hiromitsu Awano, Hirofumi Shimizu, Hiroshi Tsutsui, Hiroyuki Ochi, Takashi Sato (Kyoto Univ.) VLD2011-66 DC2011-42 |
Random Telegraph Noise (RTN) is a physical phenomenon that is considered to determine reliability and performance of cir... [more] | VLD2011-66 DC2011-42 pp.85-90 |
| ED | 2009-11-30 10:30 |
Osaka | Osaka Science & Technology Center | Observation of Coherent THz Emission in Optically Pumped Epitaxial Graphene Heterostructures Hiromi Karasawa, Takayuki Watanabe, Tsuneyoshi Komori (Tohoku Univ.), Maki Suemitsu (Tohoku Univ. /JST-CREST), Victor Ryzhii (Aizu Univ. /JST-CREST), Taiichi Otsuji (Tohoku Univ. /JST-CREST) ED2009-169 |
Graphene is a single-layer carbon-atomic honeycomb lattice crystal. Electrons and holes in graphene hold a linear disper... [more] | ED2009-169 pp.53-58 |
| ED | 2009-10-15 13:30 |
Fukui | FEA fabrication technique based on a ion-induced bending (IIB) phenomenon Tomoya Yoshida, Masayoshi Nagao, Takashi Shimizu, Seigo Kanemaru (AIST) ED2009-116 |
A simple field-emitter-array (FEA) fabrication process based on ion-induced bending (IIB) phenomenon was developed. The ... [more] | ED2009-116 pp.1-6 |
|
| AP | 2009-09-03 13:25 |
Aomori | Hachinohe Inst. of Tech. | On a resonant mode and equivalent circuit of wireless power transmission Hiroshi Hirayama (Nagoya Inst. of Tech.), Toshiyuki Ozawa (Naogoya Univ.), Yosuke Hiraiwa, Nobuyoshi Kikuma, Kunio Sakakibara (Nagoya Inst. of Tech.) AP2009-85 |
The resonant mode of the wireless power transmission is discussed to unveil a mechanism of wireless power transmission. ... [more] |
AP2009-85 pp.35-40 |
| CPM | 2008-08-04 14:25 |
Hokkaido | Muroran Institute of Technology | Field Emission Characteristics of Sputter Deposited Carbon Films Kei Miyazaki, Yoshiyuki Taguchi, Hirofumi Saito, Takuya Miyanaga, Tomohiko Yamakami, Rinpei Hayashibe, Kiichi Kamimura (Shinshu Univ.) CPM2008-42 |
The field emission characteristics of sputter deposited carbon films were measured and discussed. The low threshold fie... [more] | CPM2008-42 pp.5-8 |
| ED | 2008-03-06 13:30 |
Yamagata | [Invited Talk]
Influence of interfaces on the operation mechanism of an organic FET Yasuo Kimura, Takashi Katsumata, Tomohisa Oba (Tohoku Univ.), Hisao Ishii (Chiba Univ.), Michio Niwano (Tohoku Univ.) ED2007-252 |
An organic FET (OFET) has some interfaces. The interfaces influence its characteristics. For example, it well-known that... [more] | ED2007-252 pp.1-6 |
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| ED | 2008-03-06 15:55 |
Yamagata | Influence of an interface of electrode/organics on organic FET characteristics Tomohisa Oba, Yasuo Kimura, Michio Niwano (Tohoku Univ.) ED2007-256 |
The detailed operation mechanism of organic field effect transistors (OFETs) has not been clarified yet though they have... [more] | ED2007-256 pp.21-26 |
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