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All Technical Committee Conferences (Searched in: Recent 10 Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| COMP | 2025-03-07 10:30 |
Tokyo | Ochanomizu University | Solvability and Knowledge Requirements for Reliable Broadcast with Locally Bounded Byzantine Faults in Dynamic Networks Tota Tada, Junya Nakamura (Toyohashi Tech.)  COMP2024-26 |
Byzantine Reliable Broadcast (BRB) is a fundamental problem in ensuring the reliability of distributed systems such as b... [more] | COMP2024-26 pp.9-16 |
| HWS, ICD | 2024-11-01 15:15 |
Aomori | Hirosaki University (Primary: On-site, Secondary: Online) |
A Study on the Effectiveness of 1bit-fault Model in Statistical Fault Analysis Shungo Hayashi (AIST/YNU), Junichi Sakamoto, Hikaru Nishiyama, Tsutomu Matsumoto (AIST) HWS2024-68 ICD2024-39 |
Statistical Ineffective Fault Analysis (SIFA), proposed in CHES2018, is a fault attack that uses only error-free ciphert... [more] | HWS2024-68 ICD2024-39 pp.32-37 |
| EMCJ, IEE-EMC, IEE-SPC | 2023-05-12 17:20 |
Okinawa | (Primary: On-site, Secondary: Online) |
Fault Location using Deep Learning for TDR Waveforms in Overhead Distribution Systems with Few Branches Tohlu Matsushima, Daiki Nagata, Yuki Fukumoto (Kyutech), Takashi Hisakado (Kyoto Univ), Uki Kanenari, Tsuyoshi Iinuma, Yusuke Nishihiro (Kansai Transmission and Distribution, Inc.), Shin Toguchi (DAIHEN Corporation) EMCJ2023-11 |
Equipment using the TDR method is being developed to accelerate detection of faults in overhead distribution systems. H... [more] |
EMCJ2023-11 pp.25-30 |
| HWS | 2023-04-14 15:35 |
Oita | (Primary: On-site, Secondary: Online) |
Object Generation - Backdoor Attack against Object-Detection DNN Triggered by Fault Injection into MIPI Takumi Takubo, Tatsuya Oyama, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) HWS2023-6 |
Backdoor attacks that induce misclassification by poisoning training data and adding specific patterns (trigger marks) t... [more] | HWS2023-6 pp.20-25 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:50 |
Online | Online | A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage Yuya Chida, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) CPSY2021-57 DC2021-91 |
As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been propose... [more] | CPSY2021-57 DC2021-91 pp.73-78 |
| R | 2021-11-30 14:50 |
Online | Online | Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab.), Shigeru Yamada (Tottori Univ.) R2021-38 |
IEC 61508 is widely known as the international standard for the functional safety of electrical/electronic/programmable ... [more] | R2021-38 pp.24-29 |
| R | 2021-05-28 15:25 |
Online | Online | Software Reliability Analysis Based on Generalized Nonlinear Yule Processes Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2021-7 |
In this note, we consider two specific software reliability models (SRMs) with nonlinear modification, which are categor... [more] | R2021-7 pp.35-40 |
| CPSY, DC, IPSJ-ARC [detail] | 2020-07-31 15:45 |
Online | Online | A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12 |
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] | CPSY2020-12 DC2020-12 pp.75-80 |
| HWS, VLD [detail] | 2020-03-06 14:30 |
Okinawa | Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
A Test Generation Method for Resistive Open Faults Using Partial MAX-SAT solver Hiroshi Yamazaki, Yuta Ishiyama, Tatsuma Matsuta, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2019-131 HWS2019-104 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] | VLD2019-131 HWS2019-104 pp.215-220 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2019-03-18 09:00 |
Kagoshima | Nishinoomote City Hall (Tanega-shima) | A Test Generation Method for Resistive Open Faults Using MAX-SAT Problem Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) CPSY2018-117 DC2018-99 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] | CPSY2018-117 DC2018-99 pp.315-320 |
| EE | 2019-01-16 11:00 |
Kumamoto | KCIC | Fault detection of photovoltaic strings using parameter estimation of string circuit model Shigeomi Hara, Makoto Kasu (Saga Univ.) EE2018-39 |
We aim at detecting faults and recognizing those sorts for photovoltaic strings in mega solar power plants. We use measu... [more] | EE2018-39 pp.7-11 |
| EMCJ | 2016-09-16 11:55 |
Hyogo | University of Hyogo | TDR with Utility-Pole-Distance Resolution Considering Mode Conversion for Detection of Fault Type in Power Distribution Lines Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.), Shinpei Oe, Tsuyoshi Sasaoka, Yasuharu Sakai (Kansai Electric Power Co. Inc.) EMCJ2016-52 |
It is necessary to detect a fault point in a distribution system for accident restoration in power grid. Applying a puls... [more] | EMCJ2016-52 pp.13-18 |
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