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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, IEE-EMC, IEE-SPC | 2023-05-12 17:20 |
Okinawa | (Primary: On-site, Secondary: Online) |
Fault Location using Deep Learning for TDR Waveforms in Overhead Distribution Systems with Few Branches Tohlu Matsushima, Daiki Nagata, Yuki Fukumoto (Kyutech), Takashi Hisakado (Kyoto Univ), Uki Kanenari, Tsuyoshi Iinuma, Yusuke Nishihiro (Kansai Transmission and Distribution, Inc.), Shin Toguchi (DAIHEN Corporation)  EMCJ2023-11 |
Equipment using the TDR method is being developed to accelerate detection of faults in overhead distribution systems. H... [more] |
EMCJ2023-11 pp.25-30 |
| HWS | 2023-04-14 15:35 |
Oita | (Primary: On-site, Secondary: Online) |
Object Generation - Backdoor Attack against Object-Detection DNN Triggered by Fault Injection into MIPI Takumi Takubo, Tatsuya Oyama, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) HWS2023-6 |
Backdoor attacks that induce misclassification by poisoning training data and adding specific patterns (trigger marks) t... [more] | HWS2023-6 pp.20-25 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:50 |
Online | Online | A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage Yuya Chida, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) CPSY2021-57 DC2021-91 |
As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been propose... [more] | CPSY2021-57 DC2021-91 pp.73-78 |
| R | 2021-11-30 14:50 |
Online | Online | Safety Analysis for Safety-Related Software Based on a Fault Detection Count Model Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab.), Shigeru Yamada (Tottori Univ.) R2021-38 |
IEC 61508 is widely known as the international standard for the functional safety of electrical/electronic/programmable ... [more] | R2021-38 pp.24-29 |
| R | 2021-05-28 15:25 |
Online | Online | Software Reliability Analysis Based on Generalized Nonlinear Yule Processes Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.) R2021-7 |
In this note, we consider two specific software reliability models (SRMs) with nonlinear modification, which are categor... [more] | R2021-7 pp.35-40 |
| CPSY, DC, IPSJ-ARC [detail] | 2020-07-31 15:45 |
Online | Online | A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12 |
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] | CPSY2020-12 DC2020-12 pp.75-80 |
| HWS, VLD [detail] | 2020-03-06 14:30 |
Okinawa | Okinawa Ken Seinen Kaikan (Cancelled but technical report was issued) |
A Test Generation Method for Resistive Open Faults Using Partial MAX-SAT solver Hiroshi Yamazaki, Yuta Ishiyama, Tatsuma Matsuta, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2019-131 HWS2019-104 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] | VLD2019-131 HWS2019-104 pp.215-220 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2019-03-18 09:00 |
Kagoshima | Nishinoomote City Hall (Tanega-shima) | A Test Generation Method for Resistive Open Faults Using MAX-SAT Problem Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) CPSY2018-117 DC2018-99 |
In VLSI testing, stuck-at fault model and transition fault model have been widely used. However, with advance of semicon... [more] | CPSY2018-117 DC2018-99 pp.315-320 |
| EE | 2019-01-16 11:00 |
Kumamoto | KCIC | Fault detection of photovoltaic strings using parameter estimation of string circuit model Shigeomi Hara, Makoto Kasu (Saga Univ.) EE2018-39 |
We aim at detecting faults and recognizing those sorts for photovoltaic strings in mega solar power plants. We use measu... [more] | EE2018-39 pp.7-11 |
| EMCJ | 2016-09-16 11:55 |
Hyogo | University of Hyogo | TDR with Utility-Pole-Distance Resolution Considering Mode Conversion for Detection of Fault Type in Power Distribution Lines Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.), Shinpei Oe, Tsuyoshi Sasaoka, Yasuharu Sakai (Kansai Electric Power Co. Inc.) EMCJ2016-52 |
It is necessary to detect a fault point in a distribution system for accident restoration in power grid. Applying a puls... [more] | EMCJ2016-52 pp.13-18 |
| DC | 2014-02-10 09:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | On Feasibility of Delay Detection by Time-to-Digital Converter Embedded in Boundary-Scan Hiroki Sakurai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) DC2013-80 |
In recent deep sub-micron (DSM) ICs, it is difficult to detect open and short defects since they do not behave like co... [more] |
DC2013-80 pp.7-12 |
| KBSE | 2013-05-31 14:45 |
Kanagawa | Keio University | Robustness Anlysis on Human-made Fault in Procedural Manuals Naoyuki Nagatou (PRESYSTEMS), Takuo Watanabe (Tokyo Inst. of Tech.) KBSE2013-11 |
We adapt a formal approach for an investigation into robustness analysis on human-made faults in procedural manuals.Dete... [more] | KBSE2013-11 pp.61-66 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 16:25 |
Fukuoka | Centennial Hall Kyushu University School of Medicine | A Study on Test Generation for Effective Test Compaction Yukino Kusuyama, Tatuya Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) VLD2012-105 DC2012-71 |
In recent year, the numbers of target fault models and faults for testing increase because the number of gates on VLSIs ... [more] | VLD2012-105 DC2012-71 pp.267-272 |
| DC | 2012-06-22 13:00 |
Tokyo | Room B3-1 Kikai-Shinko-Kaikan Bldg | An evaluation of a don't care filling method to improve fault sensitization coverage Ryosuke Wakasugi, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyusyu Univ) DC2012-9 |
A single stuck-at fault model and a transition fault model have been widely used to generate test patterns for VLSIs. Ho... [more] | DC2012-9 pp.1-6 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:30 |
Miyazaki | NewWelCity Miyazaki | On the design for testability method using Time to Digital Converter for detecting delay faults Hiroyuki Makimoto, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) VLD2011-84 DC2011-60 |
We propose the design for testability method for detecting delay fault that can form a TDC(Time-to-Digital Converter) to... [more] | VLD2011-84 DC2011-60 pp.185-190 |
| R | 2011-10-21 13:30 |
Fukuoka | Advance Estimate of Accuracy of Predicting Normal State by using DB model for Fault Detection Kohei Tanaka, Akemi Fujihara, Naoki Kimura, Yoshifumi Tsuge (Kyushu Univ.) R2011-27 |
In a plant with load-fluctuations, it is difficult to detect the abnormality because the normal values are not constan... [more] |
R2011-27 pp.1-6 |
|
| DC, CPSY (Joint) |
2011-07-28 17:00 |
Kagoshima | Deviation Detection for Supporting Open System Dependability Midori Sugaya (Yokohama National Univ.), Hiroki Takamura (JST), Kimio Kuramitsu (Yokohama National Univ.) DC2011-18 |
Recently, in order to meet the various needs of users, systems have become much more sophisticated and complex. In the... [more] |
DC2011-18 pp.19-24 |
|
| DC | 2011-06-24 13:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Approach and Evaluation of Fault Tolerant Sequential Circuits for Simultaneous Occurrence of Multiple Transient Faults Satoshi Fukumoto, Masayuki Arai, Shinya Hara, Kazuhiko Iwasaki (TMU) DC2011-8 |
In this paper, we analyze the distribution of fault coverage in random-pattern testing. We introduce a stochastic variab... [more] | DC2011-8 pp.1-4 |
| DC | 2011-02-14 14:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Test Pattern Selection for Defect-Aware Test Hiroshi Furutani, Takao Sakai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2010-66 |
With shrinking of LSIs, the diversification of defective mode due to defects becomes a critical issue. Therefore, test p... [more] | DC2010-66 pp.45-50 |
| R | 2010-12-17 14:45 |
Tokyo | Estimation the number of residual faults in software testing
-- Parametric bootstrapping -- Toshio Kaneishi, Tadashi Dohi (Hiroshima Univ.) R2010-41 |
The bootstraping duplicates the data itself by resampling the underlying population data and enables to investigate the ... [more] | R2010-41 pp.23-28 |
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