Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2006] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [Japanese] / [English]
ICD2007-139
Non-Contact 10% Efficient 36mW Power Delivery Using On-Chip Inductor in 0.18-um CMOS
Yuan Yuxiang, Yoichi Yoshida, Tadahiro Kuroda (keio Univ.)
pp. 1 - 4
ICD2007-140
Integrated evaluation of on-chip power supply noise and off-chip electromagnetic noise on digital LSI
Yuki Takahashi (Kobe Univ.), Kouji Ichikawa (Denso), Makoto Nagata (Kobe Univ.)
pp. 5 - 10
ICD2007-141
ptimization of Active Substrate Noise Cancellng Technique Using Multi di/dt Detectors
Toru Nakura, Taisuke Kazama, Makoto Ikeda, Kunihiro Asada (The Univ. of Tokyo)
pp. 11 - 16
ICD2007-142
All Digital Gated Oscillator for Dynamic Supply Noise Measurement
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.)
pp. 17 - 22
ICD2007-143
Design of an On-Chip Noise Canceller with High Voltage Supply Lines for Nanosecond-Range Power Supply Noise
Yasumi Nakamura, Makoto Takamiya, Takayasu Sakurai (Univ. of Tokyo)
pp. 23 - 27
ICD2007-144
LSI and PCB Unified Noise Analysis CAD System
Toshiro Sato, Hiroyuki Orihara, Shogo Fujimori, Masaki Tosaka (FATEC)
pp. 29 - 34
ICD2007-145
[Special Invited Talk]
On-chip monitors and power-supply integrity
Makoto Nagata (Kobe Univ.)
pp. 35 - 40
ICD2007-146
[Special Invited Talk]
Techniques for power supply noise management in the SX supercomputers
Jun Inasaka, Mikihiro Kajita (NEC Corp.)
pp. 41 - 46
ICD2007-147
[Special Invited Talk]
In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution
Yusuke Kanno, Yuki Kondoh (HCRL), Takahiro Irita, Kenji Hirose, Ryo Mori, Yoshihiko Yasu (Renesas Technology, Corp.), Shigenobu Komatsu, Hiroyuki Mizuno (HCRL)
pp. 47 - 52
ICD2007-148
Arithmetic operation circuit based on abacus architecture
Syunsuke Nagasawa, Shugang Wei (Gunma Univ)
pp. 53 - 58
ICD2007-149
A compact RF signal quality measurement macro for RF test and diagnosis
Koichi Nose, Masayuki Mizuno (NEC)
pp. 59 - 64
ICD2007-150
A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module
Yutaka Uematsu, Hideki Osaka (Hitachi), Yoji Nishio, Susumu Hatano (Elpida)
pp. 65 - 69
ICD2007-151
[Tutorial Lecture]
Survey of Analysis Techniques for On-chip Power Distribution Networks
Takashi Sato (Tokyo Tech.)
pp. 71 - 76
ICD2007-152
Study on Low Stress Condition of Pseudo-SOC Integration Using Stress Analysis
Yutaka Onozuka, Hiroshi Yamada, Atsuko Iida, Kazuhiko Itaya, Hideyuki Funaki (Toshiba R & D Center)
pp. 77 - 82
ICD2007-153
An Extraction Method of Material Constants by Transmission Line Measurements
Hiroshi Toyao, Yoshiaki Wakabayashi (NEC)
pp. 83 - 86
ICD2007-154
A Package-on-Package using Coreless Substrate with Excellent Power Integrity
Kentaro Mori, Jun Sakai, Katsumi Kikuchi, Shinji Watanabe, Tomoo Murakami, Shintaro Yamamichi (NEC)
pp. 87 - 92
ICD2007-155
Assessment Test for Solder Joint Reliability in Mobile Products
Masazumi Amagai, Hiroyuki Sano (TI Japan)
pp. 93 - 98
ICD2007-156
Chip Thinning Technologies Realizing High Chip Strength
Shinya Takyu, Tetsuya Kurosawa, Noriko Shimizu, Susumu Harada (Toshiba Co.)
pp. 99 - 103
ICD2007-157
A multi-layer wafer-level 5-um-thick Cu wiring technology with photosensitive resin
Katsumi Kikuchi (NEC), Kouji Soejima (NECEL), Yasuhiro Ishii (NEC), Masaya Kawano (NECEL), Masayuki Mizuno, Shintaro Yamamichi (NEC)
pp. 105 - 110
ICD2007-158
A method of Ultra-fine Pad Interconnection using Electroless Deposition
Tokihiko Yokoshima, Yasuhiro Yamaji, Yuichiro Tamura, Katsuya Kikuchi, Hiroshi Nakagawa, Masahiro Aoyagi (AIST)
pp. 111 - 116
ICD2007-159
Reliability evaluation of lead free solder joint against vibration load under thermal circumstance
Michiya Matsushima (Osaka Univ.), Toshiyuki Hamano (ESPEC), Kiyokazu Yasuda, Kozo Fujimoto (Osaka Univ.)
pp. 117 - 122
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.