Online edition: ISSN 2432-6380
[TOP] | [2020] | [2021] | [2022] | [2023] | [2024] | [2025] | [2026] | [Japanese] / [English]
HWS2025-72
A Preprocessing for Side-Channel Analysis Using Denoising Autoencoders
Masaki Morita (UTokyo), Takuya Kojima (UT), Hideki Takase, Hiroshi Nakamura (UTokyo)
pp. 1 - 6
HWS2025-73
Security Evaluation of Adversarial Inputs for Vision-Language Models on Edge Devices
Ryo Kumagai, Shu Takemoto, Yusuke Nozaki, Masaya Yoshikawa (Meijo Univ.)
pp. 7 - 12
HWS2025-74
Correlation of FF power consumption during power analysis attacks on the final round of AES
Saishi Taira, Tomoaki Ukezono (Kindai Univ.)
pp. 13 - 17
HWS2025-75
Implementation of a Sort Processing Accelerator Using Chipyard
Daiki Masuda, Yoshinori Takeuchi (Kinkidai)
pp. 18 - 23
HWS2025-76
Design and Evaluation of a Run-Length Encoding Accelerator for Artificial Vision Systems
Ryota Matsushita, Yoshinori Takeuchi (Kindai Univ.)
pp. 24 - 29
HWS2025-77
Proposal of a 2-Layer L-Shaped Bottleneck Channel Routing Algorithm
Haruki Numajiri, Masayuki Shimoda, Atsushi Takahashi (Science Tokyo)
pp. 30 - 35
HWS2025-78
Minimizing the Maximum Congestion of Vertical Channels in Gap Channels
Youhei Tomonaga, Masayuki Shimoda, Atsushi Takahashi (Science Tokyo)
pp. 36 - 41
HWS2025-79
Extending the Channel Routing Method to the Multi-Layer Routing Problem
Kotaro Ito, Kunihiro Fujiyoshi (TUAT)
pp. 42 - 47
HWS2025-80
Constraint Graph based Detour Routing Method for 2-Layer Comb-shaped Bottleneck Routing Problem
Ryo Takata, Kunihiro Fujiyoshi (TUAT)
pp. 48 - 53
HWS2025-81
A Model for Reproducing the Increase in Ring-Oscillator Frequency Dispersion Under Long-term BTI Aging
Tomoharu Kishita (KIT), Ryo Kishida (TPU), Kazutoshi Kobayashi (KIT)
pp. 54 - 59
HWS2025-82
Design of compact nonvolatile registers for edge applications based on superposition of memory information
Tomoo Yoshida, Masanori Natsui, Takahiro Hanyu (Tohoku Univ.)
pp. 60 - 65
HWS2025-83
A Bidirectional CIM Macro for On-Chip Learning Based on Equilibrium Propagation
Kaito Nakashima, Takashi Sato, Hiromitsu Awano (Kyoto Univ.)
pp. 66 - 71
HWS2025-84
Legalization Using Network Flow
Mitsuki Nagano, Kunihiro Fujiyoshi (TUAT)
pp. 72 - 77
HWS2025-85
Study on Global Placement Method Using Dynamic Steiner Tree Wire Models
Keisuke Yamamoto, Kunihiro Fujiyosi (TUAT)
pp. 78 - 83
HWS2025-86
Semantic Algebra-based Representational Manipulation of Layout Structures and Verification of Non-Commutativity
Shigetoshi Nakatake (Univ. of Kitakyushu)
pp. 84 - 89
HWS2025-87
[Memorial Lecture]
FIawase: A SET Fault Injection Framework Towards Exhaustive System-Level Impact Evaluation
Zhang Mingtao, Cheng Quan, Hashimoto Masanori (Kyoto Uni.)
pp. 90 - 96
HWS2025-88
[Memorial Lecture]
PrometheusFree: Concurrent Detection of Laser Fault Injection Attacks in Optical Neural Networks
Kota Nishida, Yoshihiro Midoh, Noriyuki Miura (UOsaka), Satoshi Kawakami (Kyushu Univ.), Alex Orailoglu (UCSD), Jun Shiomi (UOsaka)
p. 97
HWS2025-89
[Memorial Lecture]
BitROM: Weight Reload-Free CiROM Architecture Towards Billion-Parameter 1.58-bit LLM Inference
Wenlun Zhang (Keio Univ.), Xinyu Li (Nanjing Univ.), Shimpei Ando, Kentaro Yoshioka (Keio Univ.)
p. 98
HWS2025-90
[Memorial Lecture]
LMESN: A Leakage-Driven MOSFET Reservoir for Scalable and Ultra-Low-Power Temporal Inference
Haoyuan Li (XJTU/Kyoto Univ.), Masami Utsunomiya, Ryuto Seki, Quan Cheng, Weirong Dong (Kyoto Univ.), Feng Liang (XJTU), Takashi Sato (Kyoto Univ.)
pp. 99 - 105
HWS2025-91
Experimental Verification of Symmetric-Key Cryptographic Circuits Using Silicon Photonics
Junko Takahashi, Shota Kita, Akihiko Shinya (NTT), Kazumaro Aoki (Bunkyo Univ.), Koji Chida (Gunma Univ.), Fumitaka Hoshino (Univ. of Nagasaki)
pp. 106 - 111
HWS2025-92
Resistance Evaluation of Photonic Cryptographic Circuits against Laser Fault Injection Attacks
Yuta Hasegawa, Kota Nishida, Yoshihiro Midoh, Noriyuki Miura (UOsaka), Junko Takahashi, Shota Kita, Akihiko Shinya (NTT), Jun Shiomi (UOsaka)
pp. 112 - 117
HWS2025-93
A study on improving the accuracy of device identification using the electromagnetic characteristics of electronic devices
Mio Akahori, Yoshiki Kato, Takahiro Horiguchi (Mitsubishi El)
pp. 118 - 122
HWS2025-94
Denial-of-Service Attacks via Pairing Slots Exhaustion against Bluetooth Low Energy IoT Gateways
Kohei Senga, Shoei Nashimoto (Mitsubishi Electric Corp.)
pp. 123 - 128
HWS2025-95
Vulnerability Caused by False Activation of Logic Locking
Kazuki Kidoh, Tomosuke Ichioka, Mingyu Yang, Yuko Hara (Science Tokyo)
pp. 129 - 134
HWS2025-96
(See Japanese page.)
pp. 135 - 140
HWS2025-97
A Study on Multilevel Detection of Aging in Microcontrollers based on Side-Channel Information
Kakeru Hayakawa (Tohoku Univ.), Yuichi Hayashi (NAIST), Makoto Nagata (Kobe Univ.), Naofumi Homma (Tohoku Univ.)
pp. 141 - 146
HWS2025-98
ARARE: A Study on an Evaluation Board for Aging Detection Using Backscatter from I/O Circuits
Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST)
pp. 147 - 151
HWS2025-99
Fundamental Study on Estimation of Irradiation Frequencies for Echo TEMPEST Using Harmonic Response
Ryo Nagoshi, Shugo Kaji, Yuichi Hayashi (NAIST)
pp. 152 - 156
HWS2025-100
Evaluation of the Impact of Structural Differences in HDMI Cables on Electromagnetic Information Leakage
Hayato Ide, Shohei Matsumoto, Taiki Kitazawa, Daisuke Fujimoto (NAIST), Takashi Kasuga (NIT, Nagano College), Yuichi Hayashi (NAIST)
pp. 157 - 162
HWS2025-101
Non-Line-of-Sight Imaging Using Electromagnetic Leakage Emitted During Non-Orthogonal Image Projection
Masaya Oishi (Chiba Univ.), Taiki Kitazawa, Yuichi Hayashi (NAIST), Hiroyuki Kubo (Chiba Univ.)
pp. 163 - 168
HWS2025-102
(See Japanese page.)
pp. 169 - 174
HWS2025-103
(See Japanese page.)
pp. 175 - 180
HWS2025-104
Automation of the Digital Design Flow for the Agile-Chip Platform
Hideharu Amano, Atsutake Kosuge, Naonobu Shimamoto, Tohru Mogami, Hirofumi Sumi, Yurie Inoue, Makoto Ikeda, Yosiro Mita (Tokyo Univ.)
pp. 181 - 186
HWS2025-105
Tampering Attacks against Superconducting Quantum Computers Using Software-Hardware Hybrid Trojans
Sota Yamawaki, Yoshihiro Midoh, Noriyuki Miura (UOsaka), Michihiro Shintani (KIT), Ryosuke Matsuo (UTokyo), Kosuke Mitarai, Jun Shiomi (UOsaka)
pp. 187 - 192
HWS2025-106
Performance Evaluation of FPGA and ASIC in Cryogenic Environments
Tomoki Takashima, Shuya Kon, Masashi Imai (Hirosaki Univ.)
pp. 193 - 198
HWS2025-107
N/A
Jiaming Chen, Hibiki Nakanishi (Waseda Univ.), Kento Hasegawa, Seira Hidano, Kazuhide Fukushima (KDDI Research), Kazuo Hashimoto, Nozomu Togawa (Waseda Univ.)
pp. 199 - 204
HWS2025-108
(See Japanese page.)
pp. 205 - 208
HWS2025-109
(See Japanese page.)
pp. 209 - 212
HWS2025-110
Koki Mita (Waseda Univ.), Kazuhiro Miyahara, Satoshi Yagi (NTT), Nozomu Togawa (Waseda Univ.)
pp. 213 - 218
HWS2025-111
Shunsuke Takahashi, Takeru Ota, Nozomu Togawa (Waseda Univ.)
pp. 219 - 224
HWS2025-112
N/A
Ryota Hasegawa, Shu Tomita, Takeru Ota, Nozomu Togawa (Waseda Univ.)
pp. 225 - 230
HWS2025-113
N/A
Shu Tomita, Raio Aoki, Shinnosuke Inaba, Masashi Tawada, Nozomu Togawa (Waseda Univ.)
pp. 231 - 236
HWS2025-114
A Study on Low-Latency Hardware for Post-Quantum Signature QR-UOV
Renma Sugai, Hiroshi Amagasa (Tohoku Univ.), Rei Ueno (Kyoto Univ.), Naofumi Homma (Tohoku Univ.)
pp. 237 - 242
HWS2025-115
(See Japanese page.)
pp. 243 - 247
HWS2025-116
Implementation and Evaluation of a Lightweight Countermeasure against Fault Attacks based on Redundant Instruction Fetch
Shoei Nashimoto, Naoya Okada, Yuichiro Murachi (Mitsubishi Electric)
pp. 248 - 253
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.