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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 40  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2021-01-28
14:05
Online Online [Invited Talk] Secure 3D CMOS Chip Stacks with Backside Buried Metal Power Delivery Networks for Distributed Decoupling Capacitance
Kazuki Monta (Kobe Univ.) SDM2020-51
In semiconductor integrated circuits, power signal integrity(PSI) and electromagnetic compatibility caused by power supp... [more] SDM2020-51
pp.8-12
EMCJ, MW, EST, IEE-EMC [detail] 2019-10-25
16:55
Miyagi Tohoku Gakuin University(Conf. Room 2, Eng. Bldg. 1) A Study of Decoupling Capacitor Implementation by PSD Method Using RBF Interpolation for Meta-modeling
Masashi Kawakami (Akita Prefectural Univ.), Yoshiki Kayano, Fengchao Xiao (UEC), Teruo Tobana (Akita Prefectural Univ.), Yoshio Kami (UEC), Kohei Akimoto, Yoji Isota (Akita Prefectural Univ.) EMCJ2019-70 MW2019-99 EST2019-78
This report newly attempt to propose a multi-objective satisfactory design method, Preference Set-based Design (PSD) to... [more] EMCJ2019-70 MW2019-99 EST2019-78
pp.187-191
EMCJ, IEE-EMC, IEE-MAG 2018-11-22
16:20
Overseas KAIST [Invited Talk] Statistical Eye-diagram Estimation Method Considering Power/Ground Noise Generated by Simultaneous Switching Output Buffers
Youngwoo Kim, Junyong Park, Kyungjun Cho, Joungho Kim (KAIST) EMCJ2018-84
In the high-speed channel, non-linear power/ground noise generated by simultaneous switching buffer outputs (SSOs) noise... [more] EMCJ2018-84
pp.79-80
EMCJ 2018-07-27
13:25
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of Suppression Mechanism of Power-bus Resonance Using Lossy Resonator Filter with Pi Equivalent Circuits
Sho Kanao, Iokibe Kengo, Yoshitaka Toyota (Okayama Univ.) EMCJ2018-27
Power-bus resonance of printed circuit board causes propagation of electromagnetic noise and detraction of power integri... [more] EMCJ2018-27
pp.31-36
EMCJ, IEE-EMC, IEE-MAG 2017-05-19
11:15
Overseas Nanyang Technological University Power Distribution Network Virtual Prototyping -- A Demonstration of Pre-layout Design, Simulation & Measurement --
Jun Wu Zhang, Eng Kee Chua, Kye Yak See (NTU) EMCJ2017-18
This work presents a demonstration and validation on Power Distribution Network (PDN) ^virtual prototyping ̄ design proce... [more] EMCJ2017-18
pp.63-66
EMCJ, IEE-EMC, IEE-MAG 2017-05-19
13:20
Overseas Nanyang Technological University [Invited Talk] 2.5D Method of Modeling and Simulation for Signal/Power Integrity of High Speed Electronics
En-Xiao Liu, Siping Gao, Hui Min Lee (A*STAR IHPC) EMCJ2017-19
Electromagnetic characteristics related to signal integrity (SI), power integrity (PI) and EMC has become an essential d... [more] EMCJ2017-19
p.67
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2015-12-03
10:50
Nagasaki Nagasaki Kinro Fukushi Kaikan [Invited Talk] Development of Via Structures in IC Package Substrates for Impedance Reduction
Tomoyuki Akaboshi, Taiga Fukumori, Daisuke Mizutani, Motoaki Tani (Fujitsu Lab.) CPM2015-136 ICD2015-61
This paper describes the impedance reduction technologies in build-up package substrates for high performance CPU, such ... [more] CPM2015-136 ICD2015-61
pp.51-54
EMCJ, WPT
(Joint)
2015-01-22
12:15
Okinawa Okinawaken Jichikaikan Co-Analysis for SI/PI Problems of Differential Line in Multi-Layer PCB
Yuki Kawamitsu, Yoshio Kami (UEC), Kimitoshi Murano (Tokai Univ.), Fengchao Xiao (UEC) EMCJ2014-87
Recently, the PCB with multi-layer substrate (Multi-layer PCB) is extensively used with the trend of small size and high... [more] EMCJ2014-87
pp.13-18
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2013-11-27
09:15
Kagoshima   Co-design for reducing power supply noises with On-die PDN Impedance
Ryota Kobayashi, Hiroki Otsuka, Genki Kubo, Sho Kiyoshige, Wataru Ichimura, Masahiro Terasaki, Toshio Sudo (Shibaura Inst. of Tech.) CPM2013-109 ICD2013-86
Power integrity is a serious issue in CMOS LSI systems, because power supply noise induces logic instability and electro... [more] CPM2013-109 ICD2013-86
pp.7-12
ICD, ITE-IST 2013-07-05
17:15
Hokkaido San Refre Hakodate Equivalent circuit representation of silicon substrate coupling of active RF components
Naoya Azuma, Makoto Nagata (Kobe univ.) ICD2013-44
Substrate coupling of radio frequency (RF) active components is represented by equivalent circuits unifying a resistive ... [more] ICD2013-44
pp.125-128
EMCJ 2013-04-12
14:10
Okayama Okayama Univ. Noise Investigation of Cryptographic ICs for Side-Channel Analysis by Means of Equivalent Current Source Model -- A Study with SASEBO-G --
Kengo Iokibe, Tetsuo Amano, Yoshitaka Toyota (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture) EMCJ2013-5
It is an important issue to estimate noise for the side-channel analysis that occur in cryptographic integrated circuits... [more] EMCJ2013-5
pp.25-30
EMCJ
(2nd)
2012-11-29
15:15
Tokyo NICT Lossy Resonators for Suppressing Power-bus Resonance of Printed Circuit Board
Farhan Zaheed Mahmood, Yoshitaka Toyota, Kengo Iokibe (Okayama Univ.)
Power-bus resonance of printed circuit boards (PCB) causes propagation of electromagnetic interference (EMI) and detract... [more]
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-28
10:30
Fukuoka Centennial Hall Kyushu University School of Medicine A LSI-Package-Board co-evaluation of Power noise in the Digital LSI
Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ.) VLD2012-91 DC2012-57
Problems related with power noise in LSI system are getting prominent
because of the higher integration and lower $V_{d... [more]
VLD2012-91 DC2012-57
pp.183-188
EMCJ 2012-04-20
15:35
Ishikawa Kanazawa Univ. RL Damper Circuit for Electoromagnetic Compatibility and Power Integrity of Integrated Circuits
Ryosuke Yamagata, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2012-8
Resonances of the parasitic impedance in power distribution network (PDN) increase power current in radio frequency that... [more] EMCJ2012-8
pp.43-48
EMT, PN, LQE, OPE, MWP, EST, IEE-EMT [detail] 2012-01-26
09:55
Osaka Osaka Univ. Convention Center Measurement of IC Package Inductance with Transmission Line Embedded in Package
Kengo Iokibe, Ayumi Tanimichi, Yoshitaka Toyota (Okayama Univ.) PN2011-35 OPE2011-151 LQE2011-137 EST2011-85 MWP2011-53
It is of importance for designers to possess accurate inductances of IC packages in power integrity (PI) and electromagn... [more] PN2011-35 OPE2011-151 LQE2011-137 EST2011-85 MWP2011-53
pp.11-16
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-30
09:25
Miyazaki NewWelCity Miyazaki Measurements and Co-Simulation of On-Chip and On-Boad AC Power Noise in Digital Integrated Circuits
Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ./CREST,JST) CPM2011-163 ICD2011-95
Power noise of an integrated circuit (IC) chip is dominantly characterized by the frequency-domain impedance of a chip-p... [more] CPM2011-163 ICD2011-95
pp.73-78
EMCJ, IEE-EMC 2011-10-28
13:50
Aomori Hachinohe Grand Hotel Insertion of Dumping Resistor to Reduce RF IC-Power-Current Peak Caused by Resonance due to Parasitic Impedance
Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2011-84
High-frequency current caused by simultaneous switching of digital gates which leaks toward the DC power supply into the... [more] EMCJ2011-84
pp.29-34
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2010-11-29
10:40
Fukuoka Kyushu University Evaluation of frequency components of power noise in CMOS digital LSI
Kumpei Yoshikawa, Hiroshi Matsumoto, Yuta Sasaki (Kobe Univ.), Makoto Nagata (Kobe Univ./CREST-JST) CPM2010-124 ICD2010-83
Recent trends of electric devices are higher performance and/or lower power consumption.
To achieve these designs, LSI ... [more]
CPM2010-124 ICD2010-83
pp.1-6
CAS
(2nd)
2010-10-06
11:45
Chiba Makuhari Messe [Invited Talk] PI/SI/EMI simulation technology for high-speed electronic design
Hideki Asai (Shizuoka Univ.)
A variety of noise problems, such as signal integrity, power integrity and electromagnetic interference have become very... [more]
ICD, ITE-IST 2010-07-22
09:30
Osaka Josho Gakuen Osaka Center On-Chip Waveform Capture and Diagnosis of Power Delivery in SoC Integration
Takushi Hashida, Hiroshi Matsumoto, Makoto Nagata (Kobe Univ.) ICD2010-21
On-chip waveform capture exhibits the resolution of 10 ps and 200 uV with 1024 steps, and SFDR of 63.2dB in 700-MHz sign... [more] ICD2010-21
pp.1-4
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