| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD | 2024-04-11 13:50 |
Kanagawa | (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
[Invited Lecture]
A 22 nm 10.8 Mb Embedded STT MRAM Macro Achieving over 200 MHz Random Read Access and a 10.4 MB/s Write Throughput for High End MCUs Masayuki Izuna, Tomoya Ogawa, Ken Matsubara, Yasuhiko Taito, Tomoya Saito, Koichi Takeda, Yoshinobu Kaneda, Takahiro Shimoi, Hidenori Mitani, Takashi Ito, Takashi Kono (Renesas Electronics)  ICD2024-6 |
(To be available after the conference date) [more] | ICD2024-6 pp.18-19 |
| SDM, ICD, ITE-IST [detail] | 2023-08-02 09:00 |
Hokkaido | Hokkaido Univ. Multimedia Education Bldg. 3F (Hokkaido, Online) (Primary: On-site, Secondary: Online) |
[Invited Talk]
A 33kDMIPS 6.4W Vehicle Communication Gateway Processor Achieving 10Gbps/W Network Routing, 40ms CAN Bus Start-Up and 1.4mW Standby Kenichi Shimada, Keiichiro Sano, Kazuki Fukuoka, Hiroshi Morita, Masayuki Daito, Tatsuya Kamei, Hiroyuki Hamasaki, Yasuhisa Shimazaki (Renesas) SDM2023-43 ICD2023-22 |
[more] | SDM2023-43 ICD2023-22 pp.36-40 |
| ICD | 2023-04-10 11:00 |
Kanagawa | (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
[Invited Lecture]
A 22nm 32Mb Embedded STT-MRAM Macro Achieving 5.9ns Random Read Access and 5.8MB/s Write Throughput at up to Tj of 150 °C Takahiro Shimoi, Ken Matsubara, Tomoya Saito, Tomoya Ogawa, Yasuhiko Taito, Yoshinobu Kaneda, Masayuki Izuna, Koichi Takeda, Hidenori Mitani, Takashi Ito, Takashi Kono (Renesas Electronics) ICD2023-2 |
This paper presents a high-precision sense amplifier and a fast write throughput technique of a 32Mb embedded STT-MRAM m... [more] | ICD2023-2 p.7 |
| ICD | 2023-04-11 09:30 |
Kanagawa | (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
[Invited Lecture]
Development of A Variation-Tolerant Processing-In-Memory Architecture Using Discharging Current Calibration Daiki Kitagata, Shinji Tanaka, Naoya Fujita, Naoaki Irie (REL) ICD2023-8 |
Processing-in-memory (PIM) has recently been expected to be a key technology for endpoint intelligence since it can dram... [more] | ICD2023-8 p.16 |
| ICD | 2023-04-11 15:15 |
Kanagawa | (Kanagawa, Online) (Primary: On-site, Secondary: Online) |
[Invited Talk]
Development trends of embedded MRAM IP for MCU Applications Tomoya Saito (Renesas) ICD2023-12 |
(To be available after the conference date) [more] | ICD2023-12 p.29 |
| SDM | 2022-11-10 14:00 |
Online | Online (Online) | [Invited Talk]
Modeling Electrical Properties of CrSi Thin Films Kenichiro Sonoda, Nobuhito Shiraishi, Kazuyoshi Maekawa, Nozomi Ito, Eiji Hasegawa, Tamotsu Ogata (Renesas Electronics) SDM2022-67 |
Electrical resistivity of CrSi thin films is modeled considering phase transitions and grain growth during thermal annea... [more] | SDM2022-67 pp.14-18 |
| SDM | 2022-10-19 14:30 |
Online | Online (Online) | The effect of microstructures of CrSiC thin film resistors on the electrical properties Nozomi Ito, Kazuyoshi Maekawa, Yuji Takahashi, Takashi Tonegawa (Renesas) SDM2022-59 |
With the recent trend toward higher integration of electronic circuits, the combination of an analog front end (AFE) and... [more] | SDM2022-59 pp.20-23 |
| ICD, SDM, ITE-IST [detail] | 2022-08-10 15:15 |
Online | (Online) | [Invited Talk]
A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems Fukashi Morishita, Norihito Kato, Satoshi Okubo, Takao Toi, Mitsuru Hiraki, Sugako Otani, Hideaki Abe, Yuji Shinohara, Hiroyuki Kondo (Renesas Electronics) SDM2022-52 ICD2022-20 |
This paper presents a CMOS image sensor and an AI accelerator to realize surveillance camera systems based on edge compu... [more] | SDM2022-52 ICD2022-20 pp.83-86 |
| SDM | 2022-01-31 13:15 |
Online | Online (Online) | [Invited Talk]
**** Tomoya Saito, Takashi Ito, Yasuhiko Taito, Kenichiro Sonoda, Genta Watanabe, Ken Matsubara, Akihiko Kanda, Takahiro Shimoi, Koichi Takeda, Takashi Kono (Renesas) SDM2021-68 |
We present the low energy write techniques and measurement results of a 20Mb embedded STT-MRAM test chip in 16nm FinFET ... [more] | SDM2021-68 pp.1-4 |
| SDM | 2021-11-12 10:30 |
Online | Online (Online) | [Invited Talk]
Full band Monte Carlo analysis of the uniaxial stress impact on 4H-SiC high energy transport Tomoya Nishimura, Katsumi Eikyu, Kenichiro Sonoda, Tamotsu Ogata (Renesas Electronics) SDM2021-61 |
SiC is expected to be the next-generation semiconductor material especially for power devices, and some have been put in... [more] | SDM2021-61 pp.43-46 |
| SDM, ICD, ITE-IST [detail] | 2021-08-18 13:00 |
Online | Online (Online) | [Invited Talk]
A 12nm autonomous driving processor running 60.4 TOPS and 13.8 TOPS/W CNNs with task-separated ASIL D control Katsushige Matsubara, Lieske Hanno (Renesas Electronics), Motoki Kimura (Renesas Electronics Europe), Atsushi Nakamura, Manabu Koike, Kazuaki Terashima, Shun Morikawa, Yoshihiko Hotta, Takahiro Irita, Seiji Mochizuki, Hiroyuki Hamasaki, Tatsuya Kamei (Renesas Electronics) SDM2021-39 ICD2021-10 |
Next-generation driver assistance systems and automated driving systems require both high performances to realize enormo... [more] | SDM2021-39 ICD2021-10 pp.48-53 |
| DC | 2021-02-05 14:25 |
Online | Online (Online) | Fault Coverage Estimation Method in Multi-Cycle Testing Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75 |
[more] | DC2020-75 pp.36-41 |
| SDM | 2020-11-19 15:20 |
Online | Online (Online) | [Invited Talk]
A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel Tatsuya Kunikiyo, Hidenori Sato, Takeshi Kamino, Koji Iizuka, Ken'ichiro Sonoda, Tomohiro Yamashita (Renesas Electronics) SDM2020-26 |
A novel phase-detection auto focus (PDAF) technique for incident 850 nm plane wave is demonstrated using Ge-on-Si layer ... [more] | SDM2020-26 pp.21-24 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 11:20 |
Online | Online (Online) | Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 |
[more] | VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 pp.24-29 |
| DC | 2020-02-26 10:25 |
Tokyo | (Tokyo) | Defective Chip Prediction Modeling Using Convolutional Neural Networks Ryunosuke Oka, Satoshi Ohtake (Oita Univ.), Kouichi Kumaki (Renesas) DC2019-87 |
In recent years, the cost of LSI testing which guarantees reliability has relatively increased due to the development of... [more] | DC2019-87 pp.7-12 |
| DC | 2020-02-26 11:35 |
Tokyo | (Tokyo) | Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89 |
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] | DC2019-89 pp.19-24 |
| SDM | 2020-02-07 09:35 |
Tokyo | Tokyo University-Hongo (Tokyo) | [Invited Talk]
Impact of Homogeneously Dispersed Al Nanoclusters by Si-monolayer Insertion into Hf0.5Zr0.5O2 Film on FeFET Memory Array with Tight Threshold Voltage Distribution Tadashi Yamaguchi, Keiichi Maekawa, Takahiro Ohara, Atsushi Amo, Eiji Tsukuda, Kenichiro Sonoda, Hiroshi Yanagita, Masao Inoue, Masazumi Matsuura, Tomohiro Yamashita (Renesas) SDM2019-89 |
[more] | SDM2019-89 pp.5-8 |
| SDM | 2020-01-28 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo) | [Invited Talk]
Impact of Homogeneously Dispersed Al Nanoclusters by Si-monolayer Insertion into Hf0.5Zr0.5O2 Film on FeFET Memory Array with Tight Threshold Voltage Distribution Keiichi Maekawa (renesas) SDM2019-83 |
[more] | SDM2019-83 pp.5-8 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-13 10:55 |
Ehime | Ehime Prefecture Gender Equality Center (Ehime) | VLD2019-31 DC2019-55 |
In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] | VLD2019-31 DC2019-55 pp.13-18 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 16:10 |
Ehime | Ehime Prefecture Gender Equality Center (Ehime) | Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69 |
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test (POST) is require... [more] |
VLD2019-45 DC2019-69 pp.145-150 |
[Return to Top Page]