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All Technical Committee Conferences (All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD, SDM, ITE-IST [detail] | 2022-08-10 15:15 |
Online | [Invited Talk]
A CMOS Image Sensor and an AI Accelerator for Realizing Edge-Computing-Based Surveillance Camera Systems Fukashi Morishita, Norihito Kato, Satoshi Okubo, Takao Toi, Mitsuru Hiraki, Sugako Otani, Hideaki Abe, Yuji Shinohara, Hiroyuki Kondo (Renesas Electronics)  SDM2022-52 ICD2022-20 |
This paper presents a CMOS image sensor and an AI accelerator to realize surveillance camera systems based on edge compu... [more] | SDM2022-52 ICD2022-20 pp.83-86 |
|
| SDM | 2022-01-31 13:15 |
Online | Online | [Invited Talk]
**** Tomoya Saito, Takashi Ito, Yasuhiko Taito, Kenichiro Sonoda, Genta Watanabe, Ken Matsubara, Akihiko Kanda, Takahiro Shimoi, Koichi Takeda, Takashi Kono (Renesas) SDM2021-68 |
We present the low energy write techniques and measurement results of a 20Mb embedded STT-MRAM test chip in 16nm FinFET ... [more] | SDM2021-68 pp.1-4 |
| SDM | 2021-11-12 10:30 |
Online | Online | [Invited Talk]
Full band Monte Carlo analysis of the uniaxial stress impact on 4H-SiC high energy transport Tomoya Nishimura, Katsumi Eikyu, Kenichiro Sonoda, Tamotsu Ogata (Renesas Electronics) SDM2021-61 |
SiC is expected to be the next-generation semiconductor material especially for power devices, and some have been put in... [more] | SDM2021-61 pp.43-46 |
| SDM, ICD, ITE-IST [detail] | 2021-08-18 13:00 |
Online | Online | [Invited Talk]
A 12nm autonomous driving processor running 60.4 TOPS and 13.8 TOPS/W CNNs with task-separated ASIL D control Katsushige Matsubara, Lieske Hanno (Renesas Electronics), Motoki Kimura (Renesas Electronics Europe), Atsushi Nakamura, Manabu Koike, Kazuaki Terashima, Shun Morikawa, Yoshihiko Hotta, Takahiro Irita, Seiji Mochizuki, Hiroyuki Hamasaki, Tatsuya Kamei (Renesas Electronics) SDM2021-39 ICD2021-10 |
Next-generation driver assistance systems and automated driving systems require both high performances to realize enormo... [more] | SDM2021-39 ICD2021-10 pp.48-53 |
| DC | 2021-02-05 14:25 |
Online | Online | Fault Coverage Estimation Method in Multi-Cycle Testing Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75 |
[more] | DC2020-75 pp.36-41 |
| SDM | 2020-11-19 15:20 |
Online | Online | [Invited Talk]
A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel Tatsuya Kunikiyo, Hidenori Sato, Takeshi Kamino, Koji Iizuka, Ken'ichiro Sonoda, Tomohiro Yamashita (Renesas Electronics) SDM2020-26 |
A novel phase-detection auto focus (PDAF) technique for incident 850 nm plane wave is demonstrated using Ge-on-Si layer ... [more] | SDM2020-26 pp.21-24 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-17 11:20 |
Online | Online | Control Point Selection Approach for Scan Pattern Reduction under Multi-cycle Test Hikaru Tamaki, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 |
[more] | VLD2020-15 ICD2020-35 DC2020-35 RECONF2020-34 pp.24-29 |
| DC | 2020-02-26 10:25 |
Tokyo | Defective Chip Prediction Modeling Using Convolutional Neural Networks Ryunosuke Oka, Satoshi Ohtake (Oita Univ.), Kouichi Kumaki (Renesas) DC2019-87 |
In recent years, the cost of LSI testing which guarantees reliability has relatively increased due to the development of... [more] | DC2019-87 pp.7-12 |
|
| DC | 2020-02-26 11:35 |
Tokyo | Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89 |
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] | DC2019-89 pp.19-24 |
|
| SDM | 2020-02-07 09:35 |
Tokyo | Tokyo University-Hongo | [Invited Talk]
Impact of Homogeneously Dispersed Al Nanoclusters by Si-monolayer Insertion into Hf0.5Zr0.5O2 Film on FeFET Memory Array with Tight Threshold Voltage Distribution Tadashi Yamaguchi, Keiichi Maekawa, Takahiro Ohara, Atsushi Amo, Eiji Tsukuda, Kenichiro Sonoda, Hiroshi Yanagita, Masao Inoue, Masazumi Matsuura, Tomohiro Yamashita (Renesas) SDM2019-89 |
[more] | SDM2019-89 pp.5-8 |
| SDM | 2020-01-28 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Impact of Homogeneously Dispersed Al Nanoclusters by Si-monolayer Insertion into Hf0.5Zr0.5O2 Film on FeFET Memory Array with Tight Threshold Voltage Distribution Keiichi Maekawa (renesas) SDM2019-83 |
[more] | SDM2019-83 pp.5-8 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-13 10:55 |
Ehime | Ehime Prefecture Gender Equality Center | VLD2019-31 DC2019-55 |
In testing of large scale integration (LSI) circuit, test escape detection using machine learning algorithms has been at... [more] | VLD2019-31 DC2019-55 pp.13-18 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-14 16:10 |
Ehime | Ehime Prefecture Gender Equality Center | Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69 |
In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test (POST) is require... [more] |
VLD2019-45 DC2019-69 pp.145-150 |
| SDM, ICD, ITE-IST [detail] | 2019-08-07 16:30 |
Hokkaido | Hokkaido Univ., Graduate School /Faculty of Information Science and | [Invited Talk]
High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2019-39 ICD2019-4 |
Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] | SDM2019-39 ICD2019-4 pp.15-19 |
| SDM, ICD, ITE-IST [detail] | 2019-08-09 10:50 |
Hokkaido | Hokkaido Univ., Graduate School /Faculty of Information Science and | [Invited Talk]
A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture supporting ISO26262 ASIL-D Naoto Okumura, Sugako Otani, Norimasa Otsuki, Yasufumi Suzuki, Shohei Maeda, Tomonori Yanagita, Takao Koike, Masao Ito, Minoru Uemura, Yasuhisa Shimazaki, Toshihiro Hattori, Noriaki Sakamoto, Hiroyuki Kondo (Renesas Electronics Corp.) SDM2019-47 ICD2019-12 |
Along with the rapid progress of automotive Electrical/Electronic(E/E) architecture, further integration of multiple ele... [more] | SDM2019-47 ICD2019-12 pp.67-71 |
| CAS, CS | 2019-03-08 15:00 |
Kanagawa | Shonan Institute of Technology | [Special Invited Talk]
The latest trends of Automotive Ethernet Tomofumi Hokari, Nobukatsu Kitajima (Renesas) CAS2018-145 CS2018-113 |
To support Autonomous driving and Connected car applications, Automotive Ethernet has been adopted widely around the wor... [more] | CAS2018-145 CS2018-113 p.39 |
| DC | 2019-02-27 09:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Variational Autoencoder-Based Efficient Test Escape Detection Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72 |
[more] | DC2018-72 pp.7-12 |
| DC | 2019-02-27 14:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79 |
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] | DC2018-79 pp.49-54 |
| SDM | 2019-01-29 13:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Highly Reliable Ferroelectric Hf0.5Zr0.5O2 Film with Al Nanoclusters Embedded by Sub-Monolayer Doping Technique Tadashi Yamaguchi, Tiantian Zhang, Kazuyuki Omori, Yasuhiro Shimada, Yorinobu Kunimune, Takashi Ide, Masao Inoue, Masazumi Matsuura (Renesas) SDM2018-86 |
Highly reliable ferroelectric (FE) Hf0.5Zr0.5O2 (HZO) film with Al nanoclusters embedded by sub-monolayer doping techniq... [more] | SDM2018-86 pp.21-26 |
| HWS (2nd) |
2018-12-13 15:05 |
Tokyo | Tokyo Univ. Takeda Bldg. Takeda Hall | Issues in industrial equipment installed in the factory and Renesas' initiatives Tsukasa Yobo (Renesas Electronics) |
(Advance abstract in Japanese is available) [more] | |
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