Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ICD, ITE-IST [detail] |
2024-08-06 15:00 |
Hokkaido |
Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
Evaluation and Analysis of Thermal Characteristics in Proximity within 3D Stacked Chips Shuhei Yokota, Rikuu Hasegawa, Kazuki Monta, Takaaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2024-41 ICD2024-31 |
[more] |
SDM2024-41 ICD2024-31 pp.64-68 |
VLD, HWS, ICD |
2024-02-29 12:05 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Shuhei Yokota, Rikuu Hasegawa, Kazuki Monta, Takaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univercity) VLD2023-112 HWS2023-72 ICD2023-101 |
With the rapid development of electronic technology, the level of integration of electronic devices is clearly on the ri... [more] |
VLD2023-112 HWS2023-72 ICD2023-101 pp.77-82 |
VLD, HWS, ICD |
2024-03-01 11:15 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Investigation of electromagnetic irradiation noise reduction by on-chip LDOs Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-124 HWS2023-84 ICD2023-113 |
IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions (faults) by injecting il... [more] |
VLD2023-124 HWS2023-84 ICD2023-113 pp.131-134 |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2023-11-17 09:35 |
Kumamoto |
Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Backside Side-Channel Attack by Silicon Substrate Voltage and Simulation Rikuu Hasegawa, Kazuki Monta, Takuya Watatsumi, Takuji Miki, Makoto Nagata (Kobe Univ) VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66 |
Integrated circuit (IC) chips equipped with cryptographic circuits are vulnerable to side-channel attacks, which use exp... [more] |
VLD2023-63 ICD2023-71 DC2023-70 RECONF2023-66 pp.173-177 |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2023-11-17 10:00 |
Kumamoto |
Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
Derivation of secret keys by differential fault analysis using backside voltage fault injection Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67 |
Lasers have been the leading method of fault injection in fault injection attacks on cryptographic integrated circuit (I... [more] |
VLD2023-64 ICD2023-72 DC2023-71 RECONF2023-67 pp.178-181 |
ICD, HWS |
2023-10-31 15:00 |
Mie |
(Primary: On-site, Secondary: Online) |
Side-Channel Leakage Evaluation of 3D CMOS Chip Stacking Kazuki Monta, Rikuu Hasegawa, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-57 ICD2023-36 |
2.5D and 3D packaging are methodologies that include multiple integrated circuit (IC) chips. They deliver enhanced perfo... [more] |
HWS2023-57 ICD2023-36 pp.16-19 |
SDM, ICD, ITE-IST [detail] |
2023-08-01 10:45 |
Hokkaido |
Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
A research on a cryogenic ADC for acquisition of environmental noise near quantum devices. Tomoya Yamada, Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2023-36 ICD2023-15 |
Scaling up the number of qubits is essential to realize a fault-tolerant quantum computer. However, as the number of qub... [more] |
SDM2023-36 ICD2023-15 pp.6-9 |
SDM, ICD, ITE-IST [detail] |
2023-08-01 11:10 |
Hokkaido |
Hokkaido Univ. Multimedia Education Bldg. 3F (Primary: On-site, Secondary: Online) |
Evaluation on Flip-Chip Packaging for Quantum Computers at Cryogenic Temperature Misato Taguchi, Ryozo Takahashi (Kobe Univ.), Masako Kato, Nobuhiro Kusuno (Hitachi, Ltd), Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2023-37 ICD2023-16 |
Quantum Computers are the most promising technologies to archive more complex calculations. At the same time, much large... [more] |
SDM2023-37 ICD2023-16 pp.10-13 |
HWS |
2023-04-14 13:20 |
Oita |
(Primary: On-site, Secondary: Online) |
Exploration of hardware Trojan detection through power supply current simulation Takafumi Oki, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-1 |
The recent development of information and communication technology has increased the demand for integrated circuit (IC) ... [more] |
HWS2023-1 pp.1-5 |
HWS |
2023-04-14 14:45 |
Oita |
(Primary: On-site, Secondary: Online) |
Exploration of analysis methods of electromagnetic fault injection attacks on cryptographic IC chips Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2023-4 |
There are various methods of fault injection attacks on cryptographic IC chips, such as lasers and electromagnetic waves... [more] |
HWS2023-4 pp.11-15 |
HWS |
2023-04-14 15:10 |
Oita |
(Primary: On-site, Secondary: Online) |
Electromagnetic fault injection attacks on cryptographic IC chips and analysis of internal voltage fluctuation Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ) HWS2023-5 |
Cryptographic IC chips are subject to the threat of fault injection attacks, which cause circuit malfunctions through in... [more] |
HWS2023-5 pp.16-19 |
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] |
2022-11-29 14:40 |
Kumamoto |
(Primary: On-site, Secondary: Online) |
Evaluating system level security of cryptography module Takumi Matsumaru, Kazuki Monta (Kobe Univ.), Takaaki Okidono (SCU), Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2022-32 ICD2022-49 DC2022-48 RECONF2022-55 |
Packaging technology is a technique used to encapsulate semiconductor chips in a frame, and has been attracting attentio... [more] |
VLD2022-32 ICD2022-49 DC2022-48 RECONF2022-55 pp.78-81 |
HWS, ICD |
2022-10-25 10:50 |
Shiga |
(Primary: On-site, Secondary: Online) |
Power current simulation and side channel leakage evaluation of cryptographic IC chips Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2022-32 ICD2022-24 |
Cryptographic modules are threatened by side-channel attacks that use side-channel information to decrypt internal confi... [more] |
HWS2022-32 ICD2022-24 pp.12-16 |
ICD, SDM, ITE-IST [detail] |
2022-08-08 15:20 |
Online |
|
Evaluation of IC Chip Response by Backside Voltage Disturbance in Flip Chip Packaging Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa (Kobe Univ.), Kikuo Muramatsu (e-SYNC), Hiromu Hasegawa, Takuya Sawada, Takahito Fukushima, Hisashi Kondo (Megachips), Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2022-40 ICD2022-8 |
Flip chip packaging has become a general technique for mounting semiconductor ICs due to the need for smaller area. Howe... [more] |
SDM2022-40 ICD2022-8 pp.27-30 |
ICD, SDM, ITE-IST [detail] |
2022-08-08 16:10 |
Online |
|
A cryogenic digital-to-analog converter for high-fidelity control of large-scale qubit arrays Ryozo Takahashi, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2022-42 ICD2022-10 |
This work presents a cryogenic digital-to-analog converter (DAC) for controlling a qubits in a large-scale quantum compu... [more] |
SDM2022-42 ICD2022-10 pp.37-40 |
EMCJ |
2022-06-10 11:00 |
Hokkaido |
Hokkaido University (Primary: On-site, Secondary: Online) |
Evaluation of External Disturbance Immunity by Bulk Current Injection into Ethernet Communication System(2) Kohei Kawai, Takuya Wadatsumi (Kobe Univ.), Ken Okamoto, Yuichiro Okugawa (NTT), Takuji Miki, Makoto Nagata (Kobe Univ.) EMCJ2022-18 |
[more] |
EMCJ2022-18 pp.21-25 |
EMCJ |
2022-01-21 11:20 |
Online |
Online |
Evaluation of External Disturbance Immunity by Bulk Current Injection into Ethernet Communication System Kohai Kawai, Takuya Wadatsumi, Akira Tsukada (Kobe Univ.), Ken Okamoto, Yuichiro Okugawa (NTT), Takuji Miki, Makoto Nagata (Kobe Univ.) EMCJ2021-64 |
We developed a model of communication failures caused by external disturbances in Ethernet and collected experimental da... [more] |
EMCJ2021-64 pp.18-22 |
VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2021-12-01 14:20 |
Online |
Online |
A Dual-mode SAR ADC to Detect Power Analysis Attack Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.) VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38 |
Distributed IoT devices are exposed to unexpected interferences by physical accesses by malicious attackers. An on-chip ... [more] |
VLD2021-30 ICD2021-40 DC2021-36 RECONF2021-38 pp.78-82 |
HWS, ICD [detail] |
2021-10-19 11:15 |
Online |
Online |
High-Efficiency simulation method for evaluating power noise and side-channel leakage in crypto modules Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) HWS2021-44 ICD2021-18 |
In semiconductor integrated circuits of cryptographic modules, the side-channel leakage from power supply noise is criti... [more] |
HWS2021-44 ICD2021-18 pp.19-22 |
SDM, ICD, ITE-IST [detail] |
2021-08-18 15:35 |
Online |
Online |
Evaluation of Side-channel Leakage on High-speed Asynchronous Successive Approximation Register AD Converters Ryozo Takahashi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.) SDM2021-43 ICD2021-14 |
This paper presents an evaluation of security level on high-speed asynchronous successive approximation register (SAR) a... [more] |
SDM2021-43 ICD2021-14 pp.68-71 |