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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 28  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2023-11-10
14:40
Tokyo
(Primary: On-site, Secondary: Online)
[Invited Talk] Characterization of Physical Properties in GaN under High Electric Field -- Impact Ionization Coefficients and Critical Electric Field --
Takuya Maeda (UTokyo) SDM2023-72
The accurate device simulation and prediction of the safe operating region for power devices require precise values of m... [more] SDM2023-72
pp.41-46
CPM, ED, LQE 2022-11-25
14:10
Aichi Winc Aichi (Aichi Industry & Labor Center)
(Primary: On-site, Secondary: Online)
Growth and device application of InGaN-based nanocolumn crystals using various crystal planes
Jumpei Yamada, Ai Mizuno, Rie Togashi, Ichirou Nomura, Katsumi Kishino (Sophia Univ.) ED2022-46 CPM2022-71 LQE2022-79
In this study, we investigated the growth of InGaN-based nanocolumns with various crystal orientations and the fabricati... [more] ED2022-46 CPM2022-71 LQE2022-79
pp.99-102
CCS 2022-11-17
16:50
Mie
(Primary: On-site, Secondary: Online)
Heuristic Algorithm-based Design Method of Power Converters including Optimization of Resonant Inductors
Wenqi Zhu, Yutaro Komiyama (Chiba Univ.), Xiuqin Wei (ChibaTech), Kien Nguyen, Hiroo Sekiya (Chiba Univ.) CCS2022-51
In recent years, the invention of wide bandgap semiconductor devices has made it possible to push the switching frequenc... [more] CCS2022-51
pp.42-46
SDM, ED, CPM 2022-05-27
16:15
Online Online Wet etching of GaN utilizing a photo-electrochemical reaction for functional materials
Taketomo Sato, Masachika Toguchi (Hokkaido Univ.) ED2022-13 CPM2022-7 SDM2022-20
A gallium nitride (GaN) porous structure was formed by wet etching utilizing electrochemical reactions. The refractive i... [more] ED2022-13 CPM2022-7 SDM2022-20
pp.25-28
LQE, CPM, ED 2020-11-26
15:30
Online Online Enhanced Breakdown Voltage in AlGaN/GaN HEMTs by Oxygen Plasma Treatment
Shunsuke Kamiya, Takashi Nishitani, Yu Matsuda, Nozomu Takano, Joel T. Asubar, Hirokuni Tokuda (Univ. of Fukui), Masaaki Kuzuhara (Kwansei Gakuin Univ.) ED2020-12 CPM2020-33 LQE2020-63
With its high critical electric field as consequence of its wide bandgap, gallium nitride (GaN) is considered a leading ... [more] ED2020-12 CPM2020-33 LQE2020-63
pp.45-48
SAT 2019-10-10
15:20
Fukuoka JR HAKATA CITY {10F RoomA+B} Development of highly maintainable and reliable RF transceiver for satellite base stations
Munehiro Matsui, Akira Matsushita, Fumihiro Yamashita (NTT) SAT2019-52
Maintainability and reliability is required for sustainable operation of satellite communication system. This paper pres... [more] SAT2019-52
pp.21-26
EID, ITE-IDY, IEIJ-SSL, SID-JC, IEE-EDD [detail] 2018-01-25
13:40
Shizuoka Shizuoka Univ., Hamamatsu Luminescence characteristics of GaN films grown by chemical vapor deposition using Ga vapor
Yuichiro Masuda, Tsuyoshi Nagase, Wataru Kunieda, Tetsuya Kouno, Hiroko Kominami, Kazuhiko Hara (Shizuoka Univ.) EID2017-31
We have grown gallium nitride (GaN) thin films on c-plane sapphire substrate by chemical vapor deposition (CVD) using Ga... [more] EID2017-31
pp.5-8
SDM, ED, CPM 2017-05-26
10:45
Aichi VBL, Nagoya University N-polar GaN MIS-HEMTs with Flat Interface Grown by Optimized MOVPE
Kiattiwut Prasertsuk, Tomoyuki Tanikawa, Takeshi Kimura, Shigeyuki Kuboya, Tetsuya Suemitsu, Takashi Matsuoka (Tohoku Univ.) ED2017-26 CPM2017-12 SDM2017-20
An N-polar GaN high electron mobility transistor (HEMT) has an advantage over a Ga-polar HEMT from viewpoints of a poten... [more] ED2017-26 CPM2017-12 SDM2017-20
pp.59-64
EID, ITE-IDY, IEE-EDD, IEIJ-SSL, SID-JC [detail] 2017-01-27
11:34
Tokushima Tokushima Univ. Growth of GaN thin films by chemical vapor deposition using Ga vapor
Kensuke Fukasawa, Tsuyoshi Nagase, Yuichirou Masuda, Tetsuya Kouno, Hiroko Kominami, Hara kazuhiko (Shizuoka Univ.) EID2016-45
Gallium nitride (GaN) thin films were grown on c-plane sapphire substrates by chemical vapor deposition using Ga vapor a... [more] EID2016-45
pp.125-128
MW, ED 2017-01-27
14:50
Tokyo Kikai-Shinko-Kaikan Bldg. 30W Output/60% PAE GaN Power Amplifier at X-band 8% Relative Bandwidth Utilizing 0.15um GaN HEMT Technology
Yoshifumi Kawamura, Masatake Hangai, Tomohiro Mizutani, Kenichi Tomiyama, Koji Yamanaka (Mitsubishi Electric) ED2016-111 MW2016-187
In this paper, a 30W-class X-band high-efficiency Internally Matched FET (IMFET) implemented in a 0.15 um GaN HEMT proce... [more] ED2016-111 MW2016-187
pp.81-84
CPM, LQE, ED 2016-12-12
15:20
Kyoto Kyoto University Evaluating Current Collapse of GaN HEMT devices by Carrier Number
Kohei Oasa, Akira Yoshioka, Yasunobu Saito, Takuo Kikuchi, Tatsuya Ohguro, Takeshi Hamamoto, Toru Sugiyama (TOSHIBA) ED2016-62 CPM2016-95 LQE2016-78
We report a new method to evaluate current collapse. To exclude self-heating effect during dynamic test, we propose carr... [more] ED2016-62 CPM2016-95 LQE2016-78
pp.27-30
CPM, LQE, ED 2016-12-12
17:00
Kyoto Kyoto University Low-damage Recess Etching of AlGaN/GaN Hetero-structure by Electrochemical Process
Yusuke Kumazaki, Keisuke Uemura, Taketomo Sato (Hokkaido Univ.) ED2016-66 CPM2016-99 LQE2016-82
Electrochemical etching process is demonstrated in this paper to fabricate recessed-gate AlGaN/GaN high electron mobilit... [more] ED2016-66 CPM2016-99 LQE2016-82
pp.45-50
ED, LQE, CPM 2015-11-26
13:10
Osaka Osaka City University Media Center Analysis of hole concentration and mobility of lightly Mg-doped p-type GaN by Hall-effect measurements
Masahiro Horita (Kyoto Univ.), Shinya Takashima, Ryo Tanaka, Hideaki Matsuyama, Katsunori Ueno, Masaharu Edo (Fuji Electric), Jun Suda (Kyoto Univ.) ED2015-72 CPM2015-107 LQE2015-104
Lightly-Mg-doped p-type gallium nitride (GaN) with the Mg concentration of $6.5times 10^{16}~mbox{cm}^{-3}$ was characte... [more] ED2015-72 CPM2015-107 LQE2015-104
pp.21-25
ED, LQE, CPM 2015-11-26
14:25
Osaka Osaka City University Media Center A high current operation in a 1.6 kV GaN-based trench hybrid-junction diode (THD)
Ryo Kajitani, Hiroyuki Handa, Shinji Ujita, Daisuke Shibata, Masahiro Ogawa, Kenichiro Tanaka, Hidetoshi Ishida, Satoshi Tamura, Masahiro Ishida, Tetsuzo Ueda (Panasonic) ED2015-75 CPM2015-110 LQE2015-107
A GaN-based trench hybrid-junction diode (THD) on a GaN substrate with a high current and low threshold voltage is prese... [more] ED2015-75 CPM2015-110 LQE2015-107
pp.39-42
ED, LQE, CPM 2015-11-26
16:30
Osaka Osaka City University Media Center Multi-wavelength excited Raman scattering spectroscopy for InGaN single layers
Ryosuke Ishido, Ryota Ishii, Mitsuru Funato, Yoichi Kawakami (Kyoto Univ.) ED2015-79 CPM2015-114 LQE2015-111
Resonant Raman scattering spectroscopy is crucially useful in studying properties of light-emitting devices. However, it... [more] ED2015-79 CPM2015-114 LQE2015-111
pp.59-62
ED, LQE, CPM 2015-11-27
10:25
Osaka Osaka City University Media Center Temperature-controlled atomic layer deposition of GaN using plasma-excited nitrogen source
P.Pungboon Pansila, Kensaku Kanomata, Bashir Ahammad, Shigeru Kubota, Fumihiko Hirose (Yamagata Univ) ED2015-81 CPM2015-116 LQE2015-113
Temperature-controlled ALD of GaN on Si(100) is demonstrated with TMG and plasma-excited NH3. The TMG adsorption and its... [more] ED2015-81 CPM2015-116 LQE2015-113
pp.69-72
SDM 2015-11-06
13:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] GaN-based devices on Si substrates for power conversion systems
Hidetoshi Ishida, Masahiro Ishida, Tetsuzo Ueda (Panasonic) SDM2015-90
GaN-based power devices have been expected to overcome the performance limit of conventional Si-based devices and enable... [more] SDM2015-90
pp.35-38
ED 2015-08-04
12:20
Tokyo Kikai-Shinko-Kaikan Bldg. Electrochemical formation and UV photoresponse properties of GaN porous structures
Hirofumi Kida, Yusuke Kumazaki, Zenji Yatabe, Taketomo Sato (Hokkaido Univ.) ED2015-53
Photoresponse and photoabsorption properties of GaN porous structures were investigated by measuring photocurrent and sp... [more] ED2015-53
pp.51-54
EMT, MW, OPE, MWP, EST, IEE-EMT [detail] 2015-07-16
13:00
Hokkaido Kushiro City Lifelong Learning Center A Study of a 400MHz-6GHz High Linearity GaN Low Noise Amplifier
Yo Yamaguchi, Takana Kaho, Munenari Kawashima, Kazuhiro Uehara (NTT) EMT2015-12 MW2015-50 OPE2015-24 EST2015-16 MWP2015-15
It is necessary to know the status of frequency usage for white space usage. Therefore, it is necessary that the low noi... [more] EMT2015-12 MW2015-50 OPE2015-24 EST2015-16 MWP2015-15
pp.23-27
SANE 2014-06-20
14:45
Ibaraki Tsukuba Space Center, JAXA Development of 20W class X-band Amplifier using GaN -- The Feasibility Study by the System Evaluation --
Mitsuhiro Nakadai, Johta Awano, Masanobu Yajima (JAXA), Masahiro Funabashi, Tomo Sakata (NTSpace) SANE2014-36
Japan Aerospace Exploration Agency (JAXA) has developed a 20W class X-band Solid State Power Amplifier (SSPA) using gall... [more] SANE2014-36
pp.75-78
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